Abstract:
Methods and Apparatus are provided for fake fingerprint detection. In one embodiment, an apparatus for fake fingerprint detection includes a prism having a first side configured to be touched by a fingerprint, an IR LED located near the second side of the prism, a light source located near the third side of the prism, where both the IR LED and the light source are configured to illuminate the fingerprint simultaneously to produce a captured image of the fingerprint, one or more lenses configured to direct the captured image of the fingerprint for storage, one or more CMOS sensors configured to collect the captured image of the fingerprint for analysis, and a controller configured to determine validity of the fingerprint using the captured image.
Abstract:
A system, medium, and method conducing a user's breathing, in which a sound generated during a user's exhale and/or an ambient temperature change occurring during the exhale is sensed to measure a respiratory waveform of the user. Respiratory information of the user may then be produced from the respiratory waveform, and when the respiratory information of the user is different from normal respiratory information of the user, breathing information according to the normal respiratory information may be provided to the user so the user can use the same to modify their breathing.
Abstract:
A memory system includes: a controller configured to provide a hidden auto refresh command; and a memory configured to perform a refresh operation in response to the hidden auto refresh command. The controller and the memory communicate with each other so that each refresh address of the controller and the memory has the same value as each other.
Abstract:
A semiconductor memory apparatus includes a clock control unit configured to receive a first clock when an enable signal is activated and generate a second clock which has a cycle closer in length to a target clock cycle than the first clock; a DLL input clock generation unit configured to output one of the first clock and the second clock as a DLL input clock according to a DLL select signal; and an address/command input clock generation unit configured to output one of the first clock and the second clock as an AC input clock according to the enable signal.
Abstract:
A semiconductor device includes a wafer comprising a chip that passes a test and a chip that does not pass a test, one or more first stacked chips that are stacked over the chip that passes a test, and one or more second stacked chips that are stacked over the chip that does not pass a test, wherein the second stacked chips comprise at least one between an chip that does not pass a test and a dummy chip.
Abstract:
An InSb-based switching device, which operates at room temperature by using a magnetic field controlled avalanche process for applying to magneto-logic elements, is provided. A switching device of one embodiment includes a p-type semiconductor layer; an n-type semiconductor layer; and contact layers disposed on one of the p-type and n-type semiconductor layers, the p-type semiconductor layer being in contact with the n-type semiconductor layer such that a current can be applied through the contact layers to the p-type and n-type semiconductor layers to cause a current flow from one of the contact layers to the p-type and n-type semiconductor layers and from the p-type and n-type semiconductor layers to the other of the contact layers, whereby the current flow can be controlled by an intensity of a magnetic field applied to the p-type and n-type semiconductor layers substantially perpendicularly thereto.
Abstract:
A memory system includes a memory device, a control device configured to control the memory device, a first channel configured to transfer a row command from the control device to the memory device, and a second channel configured to transfer a column command from the control device to the memory device.
Abstract:
Provided is a semiconductor integrated circuit. The semiconductor integrated circuit comprises: a pair of interconnections; a fuse connecting the pair of interconnections; and one or more heat dissipation patterns connecting the pair of interconnections and are disposed around the fuse.
Abstract:
A semiconductor circuit apparatus having a commonly shared control unit that coordinates reading and writing timed activities in two ranked subcircuits is presented. The semiconductor circuit includes: first and second ranks; and a rank control block shared by the first and second ranks and configured to provide a column-related command and an address to one of the first and second ranks in response to a chip select signal for selecting the first or second rank.
Abstract:
A semiconductor integrated circuit includes a multi-chip package having a plurality of semiconductor chips. The semiconductor integrated circuit includes a signal line; and a signal loading compensation section in a semiconductor chip among the plurality of semiconductor chips, configured to apply a designed signal loading to the signal line in response to activation of a test signal. Here, the designed signal loading has a value corresponding to a signal loading component of another semiconductor chip among the plurality of semiconductor chips to the signal line.