公开(公告)号：US20080084248A1

公开(公告)日：2008-04-10

申请号：US11905815

申请日：2007-10-04

申请人： Seiji Heike ,  Tomihiro Hashizume

发明人： Seiji Heike ,  Tomihiro Hashizume

IPC分类号： H03L7/099 ,  H03B21/00

CPC分类号： H03L7/18 ,  H03L7/1806

摘要： In an oscillating apparatus or a frequency detecting apparatus in which a center frequency and a variable frequency range are freely or optionally established with a high stability and a high accuracy, a first frequency component of a signal from a first crystal oscillator and a second frequency component of another signal from a second crystal oscillator are subjected to a synthesizing operation in a synthesizer and to other operations to obtain a desired center frequency and a desired variable frequency range.

摘要翻译： 在以高稳定性和高精度自由地或可选地建立中心频率和可变频率范围的振荡装置或频率检测装置中，来自第一晶体振荡器和第二频率分量的信号的第一频率分量 来自第二晶体振荡器的另一信号经过合成器中的合成操作和其他操作以获得期望的中心频率和期望的可变频率范围。

公开(公告)号：US06366340B1

公开(公告)日：2002-04-02

申请号：US09090942

申请日：1998-06-05

申请人： Masayoshi Ishibashi ,  Seiji Heike ,  Tomihiro Hashizume ,  Yasuo Wada ,  Hiroshi Kajiyama

发明人： Masayoshi Ishibashi ,  Seiji Heike ,  Tomihiro Hashizume ,  Yasuo Wada ,  Hiroshi Kajiyama

IPC分类号： G03B2772

CPC分类号： G11B9/14 ,  G01Q80/00 ,  G11B9/1409 ,  G11B9/1418 ,  H02N1/006 ,  H02N1/008 ,  Y10S977/855 ,  Y10S977/864

摘要： To provide an electron exposure apparatus capable of providing high resolution and performing electron exposure at high speed, integrated tips are used. Only the tips provided at ends control distances between the tips and the surface of a wafer, and the tips used for electron exposure follow the wafer according to deformations of cantilevers, which occur due to the Coulomb force resultant from a voltage applied to each tip.

摘要翻译： 为了提供能够以高速度提供高分辨率和执行电子曝光的电子曝光装置，使用集成尖端。 只有端部提供的尖端才能控制晶片的尖端和表面之间的距离，并且用于电子曝光的尖端根据由于施加到每个尖端的电压产生的库仑力而产生的悬臂梁的变形而跟随晶片。

公开(公告)号：US07799701B2

公开(公告)日：2010-09-21

申请号：US12153995

申请日：2008-05-28

申请人： Seiji Heike ,  Tomihiro Hashizume ,  Masayoshi Ishibashi

发明人： Seiji Heike ,  Tomihiro Hashizume ,  Masayoshi Ishibashi

IPC分类号： H01L21/31

CPC分类号： B05C5/00 ,  B05B13/0221 ,  B05B13/04 ,  B05C5/0225 ,  B05C5/0291 ,  B05C11/1018 ,  H01L51/0005 ,  H01L51/0036 ,  H01L51/0541

摘要： A method of coating by supplying a liquid material from a nozzle tip to form a film on a substrate surface facing to the nozzle, having the steps of: preparing a translation mechanism, which is capable of moving the nozzle in an in-plane direction and in a thickness direction of the substrate; making the nozzle to come gradually closer to the substrate, after positioning of the nozzle on the in-plane of the substrate, by using the translation mechanism; detecting electric current flowing through the nozzle from the substrate surface, when a semiconductor droplet supplied from the nozzle tip contacts with an electrode installed at the substrate surface; stopping accession of the nozzle to the substrate, when the electric current exceeds threshold value set in advance; and making the nozzle tip apart from the substrate farther than in the stopping, so as to coat the substrate with the liquid material.

摘要翻译： 一种通过从喷嘴头提供液体材料以在面向喷嘴的基板表面上形成膜的涂覆方法，其具有以下步骤：准备能够在平面内方向上移动喷嘴的平移机构，以及 在基板的厚度方向上; 通过使用平移机构将喷嘴定位在基板的平面上，使喷嘴逐渐靠近基板; 当从喷嘴头供给的半导体液滴与安装在基板表面的电极接触时，检测从基板表面流过喷嘴的电流; 当电流超过预先设定的阈值时，将喷嘴停留在基板上; 并且使喷嘴头远离基板远离停止，以便用液体材料涂覆基板。

公开(公告)号：US07557662B2

公开(公告)日：2009-07-07

申请号：US11905815

申请日：2007-10-04

申请人： Seiji Heike ,  Tomihiro Hashizume

发明人： Seiji Heike ,  Tomihiro Hashizume

IPC分类号： H03L7/00

CPC分类号： H03L7/18 ,  H03L7/1806

摘要： In an oscillating apparatus or a frequency detecting apparatus in which a center frequency and a variable frequency range are freely or optionally established with a high stability and a high accuracy, a first frequency component of a signal from a first crystal oscillator and a second frequency component of another signal from a second crystal oscillator are subjected to a synthesizing operation in a synthesizer and to other operations to obtain a desired center frequency and a desired variable frequency range.

摘要翻译： 在以高稳定性和高精度自由地或可选地建立中心频率和可变频率范围的振荡装置或频率检测装置中，来自第一晶体振荡器和第二频率分量的信号的第一频率分量 来自第二晶体振荡器的另一信号经过合成器中的合成操作和其他操作以获得期望的中心频率和期望的可变频率范围。

公开(公告)号：US06670622B2

公开(公告)日：2003-12-30

申请号：US10082341

申请日：2002-02-26

申请人： Seiji Heike ,  Masayoshi Ishibashi ,  Tomihiro Hashizume

发明人： Seiji Heike ,  Masayoshi Ishibashi ,  Tomihiro Hashizume

IPC分类号： A61N500

CPC分类号： H01J37/3174 ,  H01J2237/31752

摘要： Current passed through a resist layer or insulating layer is controlled by changing the amplitude of an AC voltage to provide an electron exposure device or electric characteristics evaluation device using a scanning probe.

公开(公告)号：US5510614A

公开(公告)日：1996-04-23

申请号：US184068

申请日：1994-01-21

申请人： Munehisa Mitsuya ,  Yasuo Wada ,  Seiji Heike ,  Seiichi Kondo

发明人： Munehisa Mitsuya ,  Yasuo Wada ,  Seiji Heike ,  Seiichi Kondo

IPC分类号： C04B41/00 ,  C04B41/80 ,  C23C26/00 ,  G01Q30/02 ,  G01Q60/10 ,  G11B9/00 ,  H01J37/00

CPC分类号： G01Q30/02 ,  B82Y35/00 ,  C04B41/0027 ,  C04B41/0045 ,  C04B41/009 ,  C04B41/80 ,  C23C26/00 ,  G01Q60/10 ,  B82Y10/00 ,  C04B2111/94 ,  G11B9/14 ,  G11B9/149 ,  H01J2237/31732 ,  Y10S977/855

摘要： A surface of an insulator or semiconductor substrate is irradiated with a beam such as an electron beam, an electromagnetic wave beam, an ion beam, etc. to excite carriers so as to form an electrical conductive layer on the surface of and in the inside of the substrate to thereby make it possible to perform observation and micro working on the insulator by using a scanning tunneling microscope.

摘要翻译： 用电子束，电磁波束，离子束等光束照射绝缘体或半导体基板的表面，以激励载流子，以在其表面上和内部形成导电层 从而能够通过使用扫描隧道显微镜对绝缘体进行观察和微加工。

公开(公告)号：US20150192604A1

公开(公告)日：2015-07-09

申请号：US14417407

申请日：2012-07-27

申请人： Tsuyoshi Yamamoto ,  Seiji Heike ,  Akira Nambu ,  Tomihiro Hashizume ,  Hideaki Koizumi

发明人： Tsuyoshi Yamamoto ,  Seiji Heike ,  Akira Nambu ,  Tomihiro Hashizume ,  Hideaki Koizumi

IPC分类号： G01Q30/20 ,  G01Q60/24

CPC分类号： G01Q30/20 ,  G01Q30/02 ,  G01Q30/10 ,  G01Q30/14 ,  G01Q60/24

摘要： At the time of carrying out measurement of a biological tissue with a probe microscope, measurement is to be realized while maintain survival conditions for a cell.As a holder for the probe microscope, a measurement holder including: a container in which a measurement object is housed; a first cover section which covers at least a part of the measurement object and has an aperture for inserting a measurement probe; and a second cover section which is connected to the first cover section, covers the container, and has an aperture for inserting the measurement probe, is used.

摘要翻译： 在用探针显微镜进行生物体组织的测定时，要保持细胞的生存条件，进行测定。 作为探针显微镜的保持器，测量保持器包括：容纳测量对象的容器; 第一覆盖部分，其覆盖所述测量对象的至少一部分并且具有用于插入测量探针的孔; 并且连接到第一盖部分的第二盖部分覆盖容器，并且具有用于插入测量探针的孔。

公开(公告)号：US20080299292A1

公开(公告)日：2008-12-04

申请号：US12153995

申请日：2008-05-28

申请人： Seiji Heike ,  Tomihiro Hashizume ,  Masayoshi Ishibashi

发明人： Seiji Heike ,  Tomihiro Hashizume ,  Masayoshi Ishibashi

IPC分类号： C23C16/52

CPC分类号： B05C5/00 ,  B05B13/0221 ,  B05B13/04 ,  B05C5/0225 ,  B05C5/0291 ,  B05C11/1018 ,  H01L51/0005 ,  H01L51/0036 ,  H01L51/0541

摘要： A method of coating by supplying a liquid material from a nozzle tip to form a film on a substrate surface facing to the nozzle, having the steps of: preparing a translation mechanism, which is capable of moving the nozzle in an in-plane direction and in a thickness direction of the substrate; making the nozzle to come gradually closer to the substrate, after positioning of the nozzle on the in-plane of the substrate, by using the translation mechanism; detecting electric current flowing through the nozzle from the substrate surface, when a semiconductor droplet supplied from the nozzle tip contacts with an electrode installed at the substrate surface; stopping accession of the nozzle to the substrate, when the electric current exceeds threshold value set in advance; and making the nozzle tip apart from the substrate farther than in the stopping, so as to coat the substrate with the liquid material.

摘要翻译： 一种通过从喷嘴头提供液体材料以在面向喷嘴的基板表面上形成膜的涂覆方法，其具有以下步骤：准备能够在平面内方向上移动喷嘴的平移机构，以及 在基板的厚度方向上; 通过使用平移机构将喷嘴定位在基板的平面上，使喷嘴逐渐靠近基板; 当从喷嘴头供给的半导体液滴与安装在基板表面的电极接触时，检测从基板表面流过喷嘴的电流; 当电流超过预先设定的阈值时，将喷嘴停留在基板上; 并且使喷嘴头远离基板远离停止，以便用液体材料涂覆基板。

公开(公告)号：US5694059A

公开(公告)日：1997-12-02

申请号：US383843

申请日：1995-02-06

申请人： Yasuo Wada ,  Munehisa Mitsuya ,  Yasushi Tomioka ,  Mark I. Lutwyche ,  Seiichi Kondo ,  Seiji Heike

发明人： Yasuo Wada ,  Munehisa Mitsuya ,  Yasushi Tomioka ,  Mark I. Lutwyche ,  Seiichi Kondo ,  Seiji Heike

IPC分类号： G11C5/00 ,  G11C11/34 ,  G11C19/00 ,  H01L27/06 ,  H01L49/00 ,  H03F3/04 ,  H03K19/02 ,  H03K19/08 ,  H03K19/0175

CPC分类号： B82Y15/00 ,  B82Y10/00 ,  G11C11/34 ,  G11C19/00 ,  H01L27/06 ,  H01L49/00 ,  H01L49/006 ,  H03F3/04 ,  H03K19/02 ,  H03K19/08 ,  G11C13/025 ,  G11C2213/81 ,  G11C2216/08 ,  Y10S977/936 ,  Y10S977/937

摘要： A buffer circuit ID provided for connecting an atom level device (for example, an Atom Relay Transistor circuit), formed by arranging atoms in a predetermined pattern, to a device such as a semiconductor device and a quantum device. The buffer circuit can be formed as a voltage or current amplification circuit. The voltage amplification circuit may be a single electron transistor circuit, and the current amplification circuit may be an avalanche amplification device circuit. The Atom Relay Transistor circuit and the device such as a semiconductor device and a quantum device are formed substantially on the same flat insulating member, and connected by a fine connection structure made of a conductive body such as metal.

摘要翻译： 提供用于连接原子级装置（例如，原子继电器晶体管电路）的缓冲电路ID，其通过以预定图案排列原子而形成于诸如半导体装置和量子装置之类的装置。 缓冲电路可以形成为电压或电流放大电路。 电压放大电路可以是单电子晶体管电路，并且电流放大电路可以是雪崩放大器件电路。 原子继电器晶体管电路和诸如半导体器件和量子器件的器件基本上形成在相同的平坦绝缘构件上，并且由诸如金属的导电体形成的精细连接结构连接。

公开(公告)号：US08912789B2

公开(公告)日：2014-12-16

申请号：US13479860

申请日：2012-05-24

申请人： Seiji Heike

发明人： Seiji Heike

IPC分类号： G01B7/14 ,  G01Q60/56 ,  G01R33/038 ,  B82Y35/00

CPC分类号： G01R33/0385 ,  B82Y35/00 ,  G01Q60/56

摘要： A magnetic force microscope capable of measuring the absolute value of a magnetic field with high resolution without causing a change in magnetization state of the probe. The magnetic force microscope includes a cantilever, a probe, a displacement detector that detects a displacement of the probe, a specimen carrier, and various transfer units. The magnetic force microscope that measures an undulation distribution as well as a magnetic field distribution on the surface of a specimen placed on the specimen carrier is further provided with a magnetic-field impress-unit that impresses a magnetic field to the probe, and an output of the magnetic-field impress-unit is controlled such that a magnetic force impressed onto the probe 5 is turned zero to thereby measure a magnetic field distribution on the surface of the specimen.

摘要翻译： 能够以高分辨率测量磁场的绝对值而不引起探针的磁化状态变化的磁力显微镜。 磁力显微镜包括悬臂，探针，位移检测器，其检测探针的位移，试样载体和各种转移单元。 测量放置在试样载体上的试样表面上的波动分布以及磁场分布的磁力显微镜还设置有向探针施加磁场的磁场印迹单元，以及输出 控制磁场印迹单元的位置，使得施加到探针5上的磁力变为零，从而测量样本表面上的磁场分布。