Socket for connecting ball-grid-array integrated circuit device to test circuit
    1.
    发明授权
    Socket for connecting ball-grid-array integrated circuit device to test circuit 失效
    用于将球栅阵列集成电路器件连接到测试电路的插座

    公开(公告)号:US07868642B2

    公开(公告)日:2011-01-11

    申请号:US12756205

    申请日:2010-04-08

    IPC分类号: G01R31/26 G01R31/02

    摘要: A simple structure socket 10 for connecting a ball grid array integrated circuit device to a test circuit has a base 14, contacts 26 arranged corresponding to the ball grid array, a nest assembly 16 of two comb structures 70 and a lever assembly 18 for spacing opposed tip portions of each contact away from each other to define a gap for receiving a ball. The lever assembly has two rectangular frames 86 each made of a distal cross piece 94, a proximal cross piece and two side pieces connecting the distal and proximal cross pieces. The two rectangular frames are arranged so that the side pieces are intersected at substantially mid portions thereof. This allows that, by depressing the proximal cross pieces toward the base, the distal cross pieces forces the comb structures toward each other.

    摘要翻译: 用于将球栅阵列集成电路器件连接到测试电路的简单结构插座10具有基座14,对应于球栅阵列布置的触点26,两个梳结构70的嵌套组件16和用于间隔相对的杠杆组件18 每个接触件的尖端部分彼此远离以限定用于接收球的间隙。 杠杆组件具有两个矩形框架86,每个矩形框架86由远端横向件94,近端横向件和连接远端和近端十字件的两个侧件构成。 两个矩形框架布置成使得侧片在其大致中间部分相交。 这允许通过将近端十字片朝向基部压下,远端横向部件将梳结构朝向彼此推力。

    Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit
    2.
    发明申请
    Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit 失效
    用于连接球栅阵列集成电路器件用于测试电路的插座

    公开(公告)号:US20080024151A1

    公开(公告)日:2008-01-31

    申请号:US11569418

    申请日:2005-04-13

    IPC分类号: G01R1/073 G01R31/02

    摘要: A simple structure socket 10 for connecting a ball grid array integrated circuit device to a test circuit has a base 14, contacts 26 arranged corresponding to the ball grid array, a nest assembly 16 of two comb structures 70 and a lever assembly 18 for spacing opposed tip portions of each contact away from each other to define a gap for receiving a ball. The lever assembly has two rectangular frames 86 each made of a distal cross piece 94, a proximal cross piece and two side pieces connecting the distal and proximal cross pieces. The two rectangular frames are arranged so that the side pieces are intersected at substantially mid portions thereof. This allows that, by depressing the proximal cross pieces toward the base, the distal cross pieces forces the comb structures toward each other.

    摘要翻译: 用于将球栅阵列集成电路器件连接到测试电路的简单结构插座10具有基座14,对应于球栅阵列布置的触点26,两个梳结构70的嵌套组件16和用于间隔相对的杠杆组件18 每个接触件的尖端部分彼此远离以限定用于接收球的间隙。 杠杆组件具有两个矩形框架86,每个矩形框架86由远端横向件94,近端横向件和连接远端和近端十字件的两个侧件构成。 两个矩形框架布置成使得侧片在其大致中间部分相交。 这允许通过将近端十字片朝向基部压下,远端横向部件将梳结构朝向彼此推力。

    Contact for IC socket
    3.
    发明授权
    Contact for IC socket 失效
    联系IC插座

    公开(公告)号:US5352130A

    公开(公告)日:1994-10-04

    申请号:US73588

    申请日:1993-06-08

    申请人: Takayuki Nagumo

    发明人: Takayuki Nagumo

    摘要: An IC socket including contacts capable of facilitating remounting of an IC package and ensuring a reliability of engagement with the IC package. A contact of an IC socket, which comprises a socket body having a plurality of contacts arranged to be engaged with IC package leads while being resiliently depressed and a cover provided to be vertically movable for the socket body and to displace the contacts outwardly against their resilience to release the contacts from engagement when the cover is moved down, is provided with a fixing portion which is fixed to the socket body, a C-shaped cantilever portion which is formed integral with an upper part of the fixing portion and has an opening facing the inside of the socket body, a resilient curved portion which is formed integral with an upper part of the C-shaped cantilever portion in a circular curved shape, as if the C-shaped part is substantially reversed, to have an almost S-shaped profile in coupling with the cantilever portion, a contact portion which is formed with the resilient curved portion to come in contact with the lead, and an engaging portion engaged with said cover, which is formed integral with the resilient curved portion and provided in an opposite direction to the contact portion in reference to the resilient curved portion.

    摘要翻译: 一种IC插座,包括能够便于重新安装IC封装并确保与IC封装的接合可靠性的触点。 IC插座的触点,其包括具有多个触点的插座主体,所述多个触点布置成与IC封装引线接合,同时弹性地压下,并且设置为可垂直移动以用于插座主体并且抵抗其弹性向外移位触点 为了在盖向下移动时将接点释放接合,设置有固定在插座本体上的固定部,与固定部的上部一体形成的C形悬臂部, 插座主体的内部,与C形悬臂部分的上部一体地形成为圆形弯曲形状的弹性弯曲部分,好像C形部分基本上相反,具有几乎S形 与悬臂部分联接的形状,形成有弹性弯曲部分以与引线接触的接触部分和与所述盖接合的接合部分, 其与弹性弯曲部分形成一体,并且相对于弹性弯曲部分设置在与接触部分相反的方向上。

    (METH)ACRYLIC RESIN COMPOSITION
    4.
    发明申请
    (METH)ACRYLIC RESIN COMPOSITION 有权
    (METH)丙烯酸树脂组合物

    公开(公告)号:US20120205043A1

    公开(公告)日:2012-08-16

    申请号:US13503546

    申请日:2010-10-20

    摘要: Provided is an adhesive (meth)acrylic resin composition being high in adhesiveness and capable of affording an adhered body which can be used at high temperatures of 250° C. or higher, and possessing low outgassing property and heat resistance. A (meth)acrylic resin composition including (A) a polyfunctional (meth)acrylate, and (B) a photopolymerization initiator that exhibits a mass loss on heating of 15% by mass or less when increasing temperature from 30° C. to 250° C. at a temperature increase rate of 10° C./min. under nitrogen flow, wherein the glass transition temperature of a cured body obtained from the composition is 250° C. or higher.

    摘要翻译: 本发明提供粘合性高的粘合性(甲基)丙烯酸树脂组合物,能够提供可在250℃以上的高温下使用且具有低脱气性和耐热性的粘合体。 包含(A)多官能(甲基)丙烯酸酯的(甲基)丙烯酸树脂组合物和(B)当将温度从30℃升高到250℃时,加热时质量损失为15质量%以下的光聚合引发剂 C.以10℃/ min的升温速率。 在氮气流下,由组合物得到的固化体的玻璃化转变温度为250℃以上。

    SOCKET FOR CONNECTING BALL-GRID-ARRAY INTEGRATED CIRCUIT DEVICE TO TEST CIRCUIT
    5.
    发明申请
    SOCKET FOR CONNECTING BALL-GRID-ARRAY INTEGRATED CIRCUIT DEVICE TO TEST CIRCUIT 失效
    将球形阵列集成电路设备连接到测试电路的插座

    公开(公告)号:US20100197152A1

    公开(公告)日:2010-08-05

    申请号:US12756205

    申请日:2010-04-08

    IPC分类号: H01R12/22

    摘要: A simple structure socket 10 for connecting a ball grid array integrated circuit device to a test circuit has a base 14, contacts 26 arranged corresponding to the ball grid array, a nest assembly 16 of two comb structures 70 and a lever assembly 18 for spacing opposed tip portions of each contact away from each other to define a gap for receiving a ball. The lever assembly has two rectangular frames 86 each made of a distal cross piece 94, a proximal cross piece and two side pieces connecting the distal and proximal cross pieces. The two rectangular frames are arranged so that the side pieces are intersected at substantially mid portions thereof. This allows that, by depressing the proximal cross pieces toward the base, the distal cross pieces forces the comb structures toward each other.

    摘要翻译: 用于将球栅阵列集成电路器件连接到测试电路的简单结构插座10具有基座14,对应于球栅阵列布置的触点26,两个梳结构70的嵌套组件16和用于间隔相对的杠杆组件18 每个接触件的尖端部分彼此远离以限定用于接收球的间隙。 杠杆组件具有两个矩形框架86,每个矩形框架86由远端横向件94,近端横向件和连接远端和近端十字件的两个侧件构成。 两个矩形框架布置成使得侧片在其大致中间部分相交。 这允许通过将近端十字片朝向基部压下,远端横向部件将梳结构朝向彼此推力。

    Socket for connecting ball-grid-array integrated circuit device to test circuit
    6.
    发明授权
    Socket for connecting ball-grid-array integrated circuit device to test circuit 失效
    用于将球栅阵列集成电路器件连接到测试电路的插座

    公开(公告)号:US07714602B2

    公开(公告)日:2010-05-11

    申请号:US11569418

    申请日:2005-04-13

    IPC分类号: G01R31/26 G01R31/02

    摘要: A simple structure socket 10 for connecting a ball grid array integrated circuit device to a test circuit has a base 14, contacts 26 arranged corresponding to the ball grid array, a nest assembly 16 of two comb structures 70 and a lever assembly 18 for spacing opposed tip portions of each contact away from each other to define a gap for receiving a ball. The lever assembly has two rectangular frames 86 each made of a distal cross piece 94, a proximal cross piece and two side pieces connecting the distal and proximal cross pieces. The two rectangular frames are arranged so that the side pieces are intersected at substantially mid portions thereof. This allows that, by depressing the proximal cross pieces toward the base, the distal cross pieces forces the comb structures toward each other.

    摘要翻译: 用于将球栅阵列集成电路器件连接到测试电路的简单结构插座10具有基座14,对应于球栅阵列布置的触点26,两个梳结构70的嵌套组件16和用于间隔相对的杠杆组件18 每个接触件的尖端部分彼此远离以限定用于接收球的间隙。 杠杆组件具有两个矩形框架86,每个矩形框架86由远端横向件94,近端横向件和连接远端和近端十字件的两个侧件构成。 两个矩形框架布置成使得侧片在其大致中间部分相交。 这允许通过将近端十字片朝向基部压下,远端横向部件将梳结构朝向彼此推力。

    IC socket
    7.
    发明授权
    IC socket 失效
    IC插座

    公开(公告)号:US5352131A

    公开(公告)日:1994-10-04

    申请号:US71583

    申请日:1993-06-02

    申请人: Takayuki Nagumo

    发明人: Takayuki Nagumo

    CPC分类号: H05K7/1023

    摘要: An IC socket for testing various IC packages is has guide sections to restrict the cover from tilting during operation without providing guide posts at four corners of the socket. The IC socket has a body with a plurality of contacts for electrical contact with leads of an IC package and a cover releasably loading the IC package on the socket body by vertical movement, a plurality of guide sections extending vertically being formed on the respective insides of four side surfaces of the cover, and a plurality of engaging sections for engaging with the guide sections, supporting vertical movement of the cover and preventing the cover from tilting during testing of the IC package, being formed respectively, on four side surfaces of the socket body.

    摘要翻译: 用于测试各种IC封装的IC插座具有引导部分,以在操作期间限制盖不倾斜,而不在插座的四个角处提供引导柱。 IC插座具有主体,该主体具有多个触点,用于与IC封装的引线电接触;以及盖,通过垂直运动可释放地将IC封装装载到插座主体上;垂直延伸的多个引导部分形成在 盖子的四个侧表面和多个接合部分,用于与引导部分接合,支撑盖子的垂直运动,并且在IC封装的测试期间防止盖子在插座的四个侧表面上分别形成 身体。

    PUSH-TYPE CONNECTOR
    8.
    发明申请
    PUSH-TYPE CONNECTOR 审中-公开

    公开(公告)号:US20120178312A1

    公开(公告)日:2012-07-12

    申请号:US13423638

    申请日:2012-03-19

    IPC分类号: H01R4/28

    CPC分类号: H01R4/4863 H01R9/2408

    摘要: Provided is a push-type connector having a structure for preventing an operational error of a lever member of the connector by an operator. A first operating part 35a of a first lever member 3a at a first position is positioned anterior to a second operating part 35b of a second lever member 3b at a third position, in relation to the pushing direction of the lever. Further, first operating part 35a of first lever member 3a projects further than second operating part 35b of second lever member 3b in the direction toward the front end of the lever or the operator side. Therefore, second lever member 3b is not likely to be an obstacle to the operation of first lever member 3a, and first lever member 3a is not likely to be an obstacle to the operation of second lever member 3b.

    Push-type connector
    9.
    发明授权
    Push-type connector 失效
    推式连接器

    公开(公告)号:US08062077B2

    公开(公告)日:2011-11-22

    申请号:US12989106

    申请日:2009-03-24

    IPC分类号: H01R4/48

    CPC分类号: H01R4/4863 H01R9/2408

    摘要: Provided is a push-type connector having a structure for preventing an operational error of a lever member of the connector by an operator. A first operating part 35a of a first lever member 3a at a first position is positioned anterior to a second operating part 35b of a second lever member 3b at a third position, in relation to the pushing direction of the lever. Further, first operating part 35a of first lever member 3a projects further than second operating part 35b of second lever member 3b in the direction toward the front end of the lever or the operator side. Therefore, second lever member 3b is not likely to be an obstacle to the operation of first lever member 3a, and first lever member 3a is not likely to be an obstacle to the operation of second lever member 3b.

    摘要翻译: 提供了一种具有用于防止操作者对连接器的杠杆构件的操作错误的结构的推式连接器。 在第一位置处的第一杆构件3a的第一操作部35a相对于杆的推动方向位于第三位置处的第二杆构件3b的第二操作部35b的前方。 此外,第一杆构件3a的第一操作部35a在朝向杆的前端或操作者侧的方向上比第二杆构件3b的第二操作部35b突出。 因此,第二杆构件3b不可能成为第一杆构件3a的操作的障碍物,并且第一杆构件3a不可能成为第二杆构件3b的操作的障碍。

    IC socket
    10.
    发明授权
    IC socket 失效
    IC插座

    公开(公告)号:US5306167A

    公开(公告)日:1994-04-26

    申请号:US71584

    申请日:1993-06-02

    申请人: Takayuki Nagumo

    发明人: Takayuki Nagumo

    摘要: The present invention relates to an IC socket to be used for testing various IC packages, an object of which is to provide the IC socket with means facilitating insertion and removal of IC packages either in testing by employing an automatic loader or in testing with manual operation. It is constructed to have a socket body formed with a plurality of contacts for establishing electric contact with leads of an IC package, a cover 2 for removably fitting the IC package on the socket body, latches 4 having hooks 42 arranged at least at two diagonally opposing corners of said cover 2, and hooking to said socket body 1, and projections extending in the same direction to the hooks 42, releasing blocks 5 arranged in the vicinity of said latches and movable in the vertical direction with respect to said projection 43, and catching portions 11 formed in said socket body 1 and to be hooked the hook 42 of said latch 4.

    摘要翻译: 本发明涉及一种用于测试各种IC封装的IC插座,其目的是为IC插座提供便于插入和拆卸IC封装的装置,或者在使用自动装载机的测试中或通过手动操作进行测试 。 其构造为具有形成有多个触点的插座主体,用于与IC封装的引线建立电接触,用于将IC封装可拆卸地装配在插座主体上的盖2,具有至少两个对角线布置的钩42的闩锁4 所述盖2的相对的角部并且钩住所述插座主体1,并且沿相同方向延伸到钩42,释放布置在所述闩锁附近并相对于所述突起43在垂直方向上移动的块5, 以及形成在所述插座主体1中并钩住所述闩锁4的钩42的卡扣部分11。