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    Method of measuring target object in a sample using mass spectrometry
    1.
    发明授权
    Method of measuring target object in a sample using mass spectrometry 有权
    使用质谱法测定样品中的目标物体的方法

    公开(公告)号：US07956321B2

    公开(公告)日：2011-06-07

    申请号：US12239344

    申请日：2008-09-26

    申请人： Yohei Murayama ,  Manabu Komatsu ,  Hiroyuki Hashimoto

    发明人： Yohei Murayama ,  Manabu Komatsu ,  Hiroyuki Hashimoto

    IPC分类号： H01J49/00

    CPC分类号： H01J49/40 ,  H01J49/0004 ,  Y10T436/24

    摘要： In-plane distribution of a target object contained in a sample is measured. The sample dispersedly placed on a substrate is treated to promote ionization of the target object. Then, the mass and flying amount of an ion containing the target object or a component thereof is determined by irradiating an ion beam to the sample and performing time-of-flight secondary ion mass spectrometry of the ion that flies from a portion in the sample where the ion beam is irradiated, and the in-plane distribution of the target object is determined from the mass and flying amount data obtained at plural portions by scanning the beam on the sample plane. The step of treating the sample to promote ionization of the target object includes contacting an aqueous solution of an acid that does not crystallize at ordinary temperature with the sample. A high spatial resolution two-dimensional image can be obtained.

    摘要翻译： 测量包含在样本中的目标对象的平面内分布。 处理分散放置在基板上的样品，以促进目标物体的电离。 然后，通过向样品照射离子束并进行从样品的一部分飞出的离子的飞行时间二次离子质谱法来确定含有目标物体或其成分的离子的质量和飞散量 其中照射离子束，并且通过在样品平面上扫描光束从多个部分获得的质量和飞行量数据确定目标物体的面内分布。 处理样品以促进目标物体的电离的步骤包括使常温下不结晶的酸的水溶液与样品接触。 可以获得高空间分辨率的二维图像。

    In-plane distribution measurement method
    3.
    发明授权
    In-plane distribution measurement method 有权
    平面内分布测量方法

    公开(公告)号：US07446309B2

    公开(公告)日：2008-11-04

    申请号：US11283912

    申请日：2005-11-22

    申请人： Yohei Murayama ,  Manabu Komatsu ,  Hiroyuki Hashimoto

    发明人： Yohei Murayama ,  Manabu Komatsu ,  Hiroyuki Hashimoto

    IPC分类号： H01J49/00

    CPC分类号： H01J49/40 ,  H01J49/0004 ,  Y10T436/24

    摘要： In plane distribution of a target object contained in a sample is measured. The sample dispersedly placed on a substrate is treated to promote ionization of the target object. Then, the mass and flying amount of an ion containing the target object or a component thereof is determined by irradiating an ion beam to the sample and performing time-of-flight secondary ion mass spectrometry of the ion that flies from a portion in the sample where the ion beam is irradiated, and the in-plane distribution of the target object is determined from the mass and flying amount data obtained at plural portions by scanning the beam on the sample plane. The step of treating the sample to promote ionization of the target object includes contacting an aqueous solution of an acid that does not crystallize at ordinary temperature with the sample. A high spatial resolution two-dimensional image can be obtained.

    摘要翻译： 测量样品中包含的目标物体的平面分布。 处理分散放置在基板上的样品，以促进目标物体的电离。 然后，通过向样品照射离子束并进行从样品的一部分飞出的离子的飞行时间二次离子质谱法来确定含有目标物体或其成分的离子的质量和飞散量 其中照射离子束，并且通过在样品平面上扫描光束从多个部分获得的质量和飞行量数据确定目标物体的面内分布。 处理样品以促进目标物体的电离的步骤包括使常温下不结晶的酸的水溶液与样品接触。 可以获得高空间分辨率的二维图像。

    METHOD FOR OBTAINING INFORMATION AND DEVICE THEREFOR
    5.
    发明申请
    METHOD FOR OBTAINING INFORMATION AND DEVICE THEREFOR 有权
    获取信息的方法及其设备

    公开(公告)号：US20080179512A1

    公开(公告)日：2008-07-31

    申请号：US12017584

    申请日：2008-01-22

    申请人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    发明人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    IPC分类号： B01D59/44

    CPC分类号： H01J49/142

    摘要： A method for obtaining information on a mass of an object by time-of-flight mass spectrometry. This method includes placing colloidal metal particles for promoting ionization of the object inside the object at a depth ranging from 0.1 nm to 100 nm in opposition to a primary beam for the ionization; irradiating the object with the primary beam selected from the group of ions, neutral particles, and electrons, which can be focused, pulsed, and are capable of scanning, and laser beams, which can be focused, pulsed, and are capable of scanning to ionize a constituent of the object and to allow the ionized constituent to fly out of the object; and obtaining information on the mass of the flying constituent of the object by time-of-flight mass spectrometry.

    摘要翻译： 一种通过飞行时间质谱法获得物体质量信息的方法。 该方法包括将胶体金属颗粒放置在与离子化的主光束相反的0.1nm至100nm范围内的物体内部物体的离子化; 用可以被聚焦，脉冲和能够扫描的离子，中性粒子和电子组中选择的主要束照射物体，以及可以被聚焦，脉冲且能够扫描的激光束 电离物体的成分并使离子化成分从物体飞出; 并通过飞行时间质谱法获得关于物体飞行成分质量的信息。

    Method for obtaining information and device therefor
    6.
    发明授权
    Method for obtaining information and device therefor 有权
    获取信息的方法及其设备

    公开(公告)号：US07851749B2

    公开(公告)日：2010-12-14

    申请号：US12017584

    申请日：2008-01-22

    申请人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    发明人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    IPC分类号： H01J49/00

    CPC分类号： H01J49/142

    摘要： A method for obtaining information on a mass of an object by time-of-flight mass spectrometry. This method includes placing colloidal metal particles for promoting ionization of the object inside the object at a depth ranging from 0.1 nm to 100 nm in opposition to a primary beam for the ionization; irradiating the object with the primary beam selected from the group of ions, neutral particles, and electrons, which can be focused, pulsed, and are capable of scanning, and laser beams, which can be focused, pulsed, and are capable of scanning to ionize a constituent of the object and to allow the ionized constituent to fly out of the object; and obtaining information on the mass of the flying constituent of the object by time-of-flight mass spectrometry.

    摘要翻译： 一种通过飞行时间质谱法获得物体质量信息的方法。 该方法包括将胶体金属颗粒放置在与离子化的主光束相反的0.1nm至100nm范围内的物体内部物体的离子化; 用可以被聚焦，脉冲和能够扫描的离子，中性粒子和电子组中选择的主要束照射物体，以及可以被聚焦，脉冲且能够扫描的激光束 电离物体的成分并使离子化成分从物体飞出; 并通过飞行时间质谱法获得关于物体飞行成分质量的信息。

    Information obtaining method
    7.
    发明授权
    Information obtaining method 有权
    信息获取方法

    公开(公告)号：US07795579B2

    公开(公告)日：2010-09-14

    申请号：US12120512

    申请日：2008-05-14

    申请人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    发明人： Manabu Komatsu ,  Hiroyuki Hashimoto ,  Yohei Murayama ,  Kazuhiro Ban

    IPC分类号： B01D59/44

    CPC分类号： H01J49/145

    摘要： An information obtaining method for obtaining information about a mass of a component of an analyte using a time of flight mass spectrometer and obtaining information about a distribution state of the component based on the obtained information about the mass includes the step of: (1) adding a self-reactive substance to the analyte on a base to facilitate ionization of the component; (2) irradiating the analyte with a primary beam in the presence of the self-reactive substance, thereby ionizing the components and allowing resulting ions to fly; (3) obtaining information about mass of the flying ions using the time of flight mass spectrometer; and (4) obtaining information about the distribution state of the component on the base based on the information about the mass.

    摘要翻译： 使用飞行时间质谱仪获取关于分析物的成分的质量的信息的信息获取方法，基于获得的关于质量的信息获得关于部件的分布状态的信息，包括以下步骤：（1）添加 对基底上的分析物的自反应物质，以促进组分的离子化; （2）在存在自反应物质的情况下用主光束照射分析物，从而电离成分并允许所得离子飞行; （3）使用飞行时间质谱仪获取关于飞行离子质量的信息; 和（4）基于关于质量的信息获得关于组件在基础上的分布状态的信息。