Overheat-sensing circuit and semiconductor integrated circuit device having the same
    1.
    发明申请
    Overheat-sensing circuit and semiconductor integrated circuit device having the same 审中-公开
    过热检测电路和半导体集成电路器件具有相同的功能

    公开(公告)号:US20060289461A1

    公开(公告)日:2006-12-28

    申请号:US11453028

    申请日:2006-06-15

    IPC分类号: H05B1/02

    CPC分类号: G01K3/005 G01K7/01

    摘要: An overheat-sensing circuit includes a temperature-sensing circuit for outputting a temperature-sensing voltage, a reference voltage generation circuit for outputting a reference voltage, and a comparison circuit that compares the temperature-sensing voltage with the reference voltage and outputs an overheat-sensing signal based on a result of the comparison. The reference voltage generation circuit outputs the reference voltage in accordance with a power supply voltage when the power supply voltage is within a predetermined voltage range. In contrast, the reference voltage generation circuit generates a limited voltage based on the power supply voltage and outputs the reference voltage in accordance with the limited voltage when the power supply voltage is outside the predetermined voltage range. This approach reduces a variation in an overheat-sensing temperature at which the comparison circuit outputs the overheat-sensing signal.

    摘要翻译: 过热检测电路包括用于输出温度感测电压的温度检测电路,用于输出参考电压的参考电压产生电路,以及将温度感测电压与参考电压进行比较的比较电路,并输出过热 - 基于比较结果的感测信号。 当电源电压在预定电压范围内时,参考电压产生电路根据电源电压输出参考电压。 相比之下,参考电压产生电路基于电源电压产生有限电压,并且当电源电压超出预定电压范围时,根据限制电压输出参考电压。 该方法减少了比较电路输出过热感测信号的过热感应温度的变化。

    Test mode circuit and reset control method therefor
    3.
    发明授权
    Test mode circuit and reset control method therefor 有权
    测试模式电路及其复位控制方法

    公开(公告)号:US07451025B2

    公开(公告)日:2008-11-11

    申请号:US11288170

    申请日:2005-11-29

    IPC分类号: G01R31/28

    CPC分类号: G01R31/34 G01R31/006

    摘要: A power control circuit is provided in a vehicle control ECU mounted in a vehicle. The control circuit, when making a shift to a test mode by a test mode circuit, closes a relay to supply a power voltage from a battery to a power line in the similar manner as an ignition main switch is turned on. A logic circuit section of the test mode circuit is reset by an OR logic of a set level of a test terminal and a level of the power line.

    摘要翻译: 在安装在车辆中的车辆控制ECU中设置有电力控制电路。 控制电路在通过测试模式电路转换到测试模式时,以与点火主开关接通的方式相似的方式闭合继电器以将电池从电池提供给电力线。 测试模式电路的逻辑电路部分由测试终端的设定电平的OR逻辑和电源线的电平复位。

    Data transfer method, image processing method, data transfer system and image processor
    6.
    发明授权
    Data transfer method, image processing method, data transfer system and image processor 失效
    数据传输方法,图像处理方法,数据传输系统和图像处理器

    公开(公告)号:US07268903B2

    公开(公告)日:2007-09-11

    申请号:US10050175

    申请日:2002-01-18

    IPC分类号: H04N1/41 H04N1/415

    CPC分类号: G06T9/005

    摘要: The invention relates to the data transfer method, the image processing method, the data transfer system and the image data processor for transferring digital data, especially for transferring image data. The invention has an object to provide the data transfer method, the image processing method, the data transfer system and the image data processor, wherein the compression ratio is changed corresponding to the transfer rate between connecting devices and the lack of image is avoided. The detecting means detects the data transfer capability of the transmission channel and the transfer end, and the control means changes the compression ratio of the digital data corresponding to the data transfer capability. Subsequently, the compressing means compresses the digital data based on the changed compression ratio and the transfer means transfers the compressed digital data to the transfer end.

    摘要翻译: 本发明涉及用于传送数字数据的数据传输方法,图像处理方法,数据传输系统和图像数据处理器,特别是用于传送图像数据。 本发明的目的是提供数据传送方法,图像处理方法,数据传送系统和图像数据处理器,其中,压缩比根据连接装置之间的传送速率而变化,并且避免了图像的缺失。 检测装置检测传输信道和传送端的数据传输能力,并且控制装置改变对应于数据传输能力的数字数据的压缩比。 随后,压缩装置基于改变的压缩比压缩数字数据,并且传送装置将压缩的数字数据传送到传送端。

    Trapezoid signal generating circuit

    公开(公告)号:US07154310B2

    公开(公告)日:2006-12-26

    申请号:US10808542

    申请日:2004-10-07

    申请人: Akio Kojima

    发明人: Akio Kojima

    IPC分类号: H03K4/94

    CPC分类号: H03K4/94

    摘要: A trapezoid signal generating circuit has a charging and discharging circuit for a capacitor to generate a trapezoid signal which has less change at its rising portion and falling portion. Current output circuits supply a charging current and a discharging current in accordance with a voltage outputted from a current control circuit, respectively. The current control circuit has a charging and discharging circuit similar to the charging and discharging circuit, and produces an output voltage. This voltage increases in accordance with a linear function for a period from a time point when an input signal changes its level to a time point when the voltage reaches a reference voltage, and decreases thereafter in accordance with a linear function. The current flowing into the capacitor also increases and decreases in accordance with the linear function, so that the terminal voltage of the capacitor increases and decreases in accordance with a quadratic function.

    Process for producing adamantane or analogue
    8.
    发明授权
    Process for producing adamantane or analogue 失效
    生产金刚烷或类似物的方法

    公开(公告)号:US07145048B2

    公开(公告)日:2006-12-05

    申请号:US10480463

    申请日:2002-06-12

    IPC分类号: C07C13/28

    摘要: The invention relates to a method of selectively producing adamantanes in a production apparatus made of an inexpensive material, not having any negative influence on the natural environment. The method for producing adamantanes includes isomerizing a tricyclic saturated hydrocarbon having at least 10 carbon atoms in the presence of a metal-carrying solid acid catalyst, wherein water and/or alcohol is made to coexist along with the catalyst during the isomerization.

    摘要翻译: 本发明涉及在由廉价材料制成的生产设备中选择性地生产金刚烷的方法,对自然环境没有任何负面影响。 生产金刚烷的方法包括在载有金属的固体酸催化剂的存在下异构化具有至少10个碳原子的三环饱和烃,其中在异构化期间使水和/或醇与催化剂共存。

    Circuit for supplying constant voltage
    9.
    发明授权
    Circuit for supplying constant voltage 有权
    提供恒压电路

    公开(公告)号:US07071671B2

    公开(公告)日:2006-07-04

    申请号:US10974769

    申请日:2004-10-28

    IPC分类号: G05F3/16

    CPC分类号: G05F3/242 G05F1/573

    摘要: A constant voltage supplying circuit including an output transistor is connected to a power source line and an output terminal. A base-emitter voltage of the output transistor is detected by a voltage detecting circuit composed of a transistor. A current-outputting circuit for supplying a current determined based on the voltage detected by the voltage detector to a reference voltage supplying circuit is used in the constant voltage supplying circuit. The reference voltage is supplied to a base of the output transistor to cancel a base-emitter voltage of the output transistor and to equalize the output voltage to a voltage generated in a reference voltage generating element included in the reference voltage supplying circuit. In this manner, the output voltage is kept constant notwithstanding variation of output current.

    摘要翻译: 包括输出晶体管的恒压供电电路连接到电源线和输出端。 输出晶体管的基极 - 发射极电压由由晶体管构成的电压检测电路来检测。 在恒压供给电路中使用用于将基于由电压检测器检测出的电压确定的电流提供给基准电压供给电路的电流输出电路。 参考电压被提供给输出晶体管的基极以消除输出晶体管的基极 - 发射极电压,并将输出电压与在参考电压供应电路中包括的参考电压产生元件中产生的电压相等。 以这种方式,尽管输出电流的变化,输出电压保持恒定。

    Probe card and method for manufacturing probe card
    10.
    发明申请
    Probe card and method for manufacturing probe card 失效
    探针卡和制造探针卡的方法

    公开(公告)号:US20050225336A1

    公开(公告)日:2005-10-13

    申请号:US10502365

    申请日:2003-01-24

    申请人: Akio Kojima

    发明人: Akio Kojima

    IPC分类号: G01R1/073 G01R31/02

    摘要: A probe card on which micro probe needles are arranged at high density and with high precision with neither the need of a complicated structure or variation in needle height. A probe card 1 installed in a wafer tester comprises a board 2 having a wiring pattern for transmitting a test signal to be impressed on a wafer under test, a built-up board 10 formed on the surface of the board 2, a comb-shaped silicon-made probe needle 20 arranged on the built-up board 10 and connected to the surface wiring pattern 11, and a flat portion 12 formed by plating on the surface wiring pattern 11 on the built-up board 10 and having a surface flattened by polishing. The probe needle 20 is loaded on the flat portion 12 and thus mounted on the board 2.

    摘要翻译: 探针卡,其上以高密度和高精度布置微探针,既不需要复杂的结构或针高度的变化。 安装在晶片测试器中的探针卡1包括具有用于传输待测试晶片上的测试信号的布线图案的板2,形成在板2的表面上的组合板10,梳状 布置在叠层板10上并连接到表面布线图案11的硅制探针20以及通过电镀在积层板10上的表面布线图案11上而形成的平坦部12,其平坦化表面 抛光。 探针20被装载在平坦部分12上,从而安装在板2上。