摘要:
The invention relates to a method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells. The method and apparatus are based on the detection of light deflected at a crack.
摘要:
A method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells, are provided. The method and apparatus are based on the detection of light deflected at a crack.
摘要:
A method for the thermographic inspection of nonmetallic materials, particularly coated nonmetallic materials, is provided. The method includes heating at least one part of the surface of the nonmetallic material, preferably a part of the surface furnished with a nonmetallic coating, by a short energy pulse, preferably a light pulse, or by periodic input of heat, and recording the temporal and spatial temperature profile at least at a plurality of successive time points.
摘要:
Methods and apparatus for separating of parts from workpieces is provided, in which at least one part is separated from a workpiece by means of radiation, in particular by means of laser radiation, and in which the radiation acts on the workpiece in a zone of interaction in such a way that regions of the workpiece are abraded, changed in their shape and/or are separated; in which the light intensity is received from the interaction zone and/or its vicinity and is transformed into electrical signals by a photoelectric sensor, and in which, with use of the electrical signals, it is determined when the processing procedure is to be terminated.
摘要:
A mesh (36) is placed around a bundle (32) of fused glass fibers. The bundle is then immersed in a leaching bath (44). The ends of the bundle are protected from the bath fluid by furrules (34). Some of the glass of the bundle is leached out, so as to provide a flexible fiber bundle.
摘要:
A method of mounting electro-optical devices on an optical element using an auxiliary substrate is provided herein. Electro-optical fiber optic assemblies are also described herein.
摘要:
To detect defects in a continuously moving strip of transparent material, especially a wide thin glass strip, a narrow monochromatic light beam is guided transverse to the motion direction of the moving strip and is coupled into the moving strip, preferably through an edge region of the moving strip, by a transparent liquid arranged between the moving strip and the light source producing the monochromatic light beam. In a first embodiment the monochromatic light beam is inclined to an upper surface of the moving strip through which it passes and is coupled into the moving strip by a transparent liquid whose index of refraction is greater than that of the atmosphere surrounding the moving strip. In a second embodiment the monochromatic light beam is parallel to the upper surface of the strip and is coupled into an edge surface of the continuously moving strip by a transparent liquid whose index of refraction is about equal to that of the moving material. In the first embodiment the light guide system for the light beam includes a prism, whose light outlet surface is parallel to the upper surface of the glass strip. The transparent liquid is arranged between the prism and the glass strip, which is supported on rolls.
摘要:
The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in the interior of the material. A fault in the partial volume is detected by light scattering, bright field absorption, and/or deflection of light of the first radiation source by the fault. The apparatus for detecting faults includes a first radiation source for illuminating a definite partial volume of the material, a detector for detecting light from this partial volume, and a second radiation source. The second radiation source is arranged in relation to the material so that the associated optical path in the partial volume passes exclusively in the interior of the material.
摘要:
A single free-beam region for coupling electromagnetic radiation in and out is provided in order in the case of an AWG coupler for spectrally separating electromagnetic radiation to achieve a more stable thermal characteristic and a space-saving layout.