摘要:
Various methods of metering a multi-phase composition in a pipe using patch antenna(s), that operate in a radio or microwave frequency range, are disclosed including locating and then exciting the patch antenna(s) over a range of frequencies; measuring transmitted and reflected signals over time; estimating a shift in a resonant frequency from a baseline resonant frequency; then calculating a permittivity of the composition, based on the shift; and calculating a phase composition of the multi-phase composition. The present invention has been described in terms of specific embodiment(s), and it is recognized that equivalents, alternatives, and modifications, aside from those expressly stated, are possible and within the scope of the appending claims.
摘要:
Various methods of metering a multi-phase composition in a pipe using patch antenna(s), that operate in a radio or microwave frequency range, are disclosed including locating and then exciting the patch antenna(s) over a range of frequencies; measuring transmitted and reflected signals over time; estimating a shift in a resonant frequency from a baseline resonant frequency; then calculating a permittivity of the composition, based on the shift; and calculating a phase composition of the multi-phase composition. The present invention has been described in terms of specific embodiment(s), and it is recognized that equivalents, alternatives, and modifications, aside from those expressly stated, are possible and within the scope of the appending claims.
摘要:
An electrode array, a system and a method for reconstructing the distribution of electrical properties within a multi-material object. One embodiment includes electrodes arranged along a three-dimensional helical path to provide one or more helical arrays and circuitry to measure signals for calculating a conductivity or admittivity distribution representative of the interior of the structure. Image data may be obtained which is representative of the multi-material region.
摘要:
An electrode array, a system and a method for reconstructing the distribution of electrical properties within a multi-material object. One embodiment includes electrodes arranged along a three-dimensional helical path to provide one or more helical arrays and circuitry to measure signals for calculating a conductivity or admittivity distribution representative of the interior of the structure. Image data may be obtained which is representative of the multi-material region.
摘要:
A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.
摘要:
A method and system for inspecting a wind turbine is provided. The method includes providing at least one remotely operated aerial platform (ROAP), providing at least one non-destructive evaluation (NDE) device attached to the ROAP, and providing at least one distance measuring system attached to the ROAP. The distance measuring system is used for determining the distance between the ROAP and at least a portion of the wind turbine. The method also includes positioning the ROAP so that the at least one non-destructive evaluation device captures data used for inspecting the wind turbine.
摘要:
A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.