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公开(公告)号:US20250145431A1
公开(公告)日:2025-05-08
申请号:US19013922
申请日:2025-01-08
Applicant: Applied Materials, Inc.
Inventor: Bhaskar PRASAD , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Srinivasa Rao YEDLA
Abstract: A method and apparatus for lifting a process station from a processing module is described herein. The apparatus includes a lift assembly disposed on the processing module, a lift cage, and one or more guide pins. The lift assembly is disposed to be capable of reaching each of the process stations disposed within the processing module. The lift assembly is used for replacement and maintenance of the process stations and further enables the automated removal and placement of the process stations within the processing module. Maintenance methods enabled by the lift assembly are additionally disclosed herein.
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公开(公告)号:US20230116153A1
公开(公告)日:2023-04-13
申请号:US17851638
申请日:2022-06-28
Applicant: Applied Materials, Inc.
Inventor: Lakshmikanth Krishnamurthy SHIRAHATTI , Kirankumar Neelasandra SAVANDAIAH , Prashant A. DESAI , Thomas BREZOCZKY
IPC: H01L21/67
Abstract: Aspects of the disclosure provided herein generally relate to a fluid flow network configured to cool subsystems of a substrate processing system. Aspects of the disclosure provide a fluid flow network and method that adjusts the flow of the cooling fluid through each subsystem of the substrate processing system. The methods described herein can include maintaining a flow rate of the cooling fluid through each subsystem over a range of cooling fluid pressures. The methods described herein can further include configuring the fluid flow network to equalize a flow rate of the cooling fluid through similar subsystems such that the flow rate through each subsystem is similar without adjustment.
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公开(公告)号:US20230088457A1
公开(公告)日:2023-03-23
申请号:US17863145
申请日:2022-07-12
Applicant: Applied Materials, Inc.
Inventor: Lakshmikanth Krishnamurthy SHIRAHATTI , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Pallab KARMAKAR
Abstract: A substrate processing system that includes a multi-station processing chamber that includes a plurality of process stations is provided. Each process station has one or more processing components cooled by a cooling system. In one embodiment, the cooling system includes a closed loop monitoring system comprising a flow control valve fluidly coupled to a coolant supply line, a valve position measuring system for continuously monitoring the position of the valve, and a valve position controller for adjusting the position of the valve.
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公开(公告)号:US20220076981A1
公开(公告)日:2022-03-10
申请号:US17014474
申请日:2020-09-08
Applicant: Applied Materials, Inc.
Inventor: Lakshmikanth Krishnamurthy SHIRAHATTI , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Ganesh SUBBUSWAMY
IPC: H01L21/683 , H01L21/687 , H01L21/67
Abstract: A substrate support for a processing region comprises a compliant sealing device comprising. The compliant sealing device comprises a coupling mechanism, a sealing device body, and a bellows. The coupling mechanism comprises a mating surface configured to interface with an opposing surface of an electrostatic chuck. The mating surface is configured to form a separable seal when disposed against the opposing surface of the electrostatic chuck. The sealing device body is connected to the coupling mechanism and comprises a passageway. The bellows surrounds the sealing device body.
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公开(公告)号:US20220013383A1
公开(公告)日:2022-01-13
申请号:US16923792
申请日:2020-07-08
Applicant: Applied Materials, Inc.
IPC: H01L21/67 , H01L21/677 , H01L21/687 , C23C14/35
Abstract: Embodiments disclosed herein include a substrate processing module and a method of moving a workpiece. The substrate processing module includes a shutter stack and two process stations. The shutter stack is disposed between the process stations. The method of moving a workpiece includes moving a supporting portion from a first location to a shutter stack in a first direction, retrieving the workpiece from the shutter stack, and moving the supporting portion to a second location. The transfer chamber assembly and method allows for moving workpieces to and from the shutter stack to the two process stations. A central transfer robot of the substrate processing module is configured to grip both substrates and shutter discs, allowing for one robot when typically two robots would be required.
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公开(公告)号:US20200381276A1
公开(公告)日:2020-12-03
申请号:US16877357
申请日:2020-05-18
Applicant: Applied Materials, Inc.
Inventor: Srinivasa Rao YEDLA , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Bhaskar PRASAD , Shashikanth CHENNAKESHAVA , Sreenath SOVENAHALLI , Shankar KODLE
IPC: H01L21/67 , H01L21/687 , B25J15/00 , B25J9/04 , B25J11/00
Abstract: Aspects of the disclosure provided herein generally provide a substrate processing system that includes at least one processing module that includes a plurality of process stations coupled thereto and a substrate transferring device disposed within a transfer region of the processing module for transferring a plurality of substrates to two or more of the plurality of process stations. The methods and apparatuses disclosed herein are useful for performing vacuum processing on substrates wherein one or more substrates are transferred within the transfer region of processing module that is in direct communication with at least a portion of a processing region of a plurality of separately isolatable process stations during the process of transferring the one or more substrates. In some embodiments, a substrate is positioned and maintained on the same substrate support member during the process of transferring the substrate within the processing module and while the substrate is being processed in each of the plurality of process stations.
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公开(公告)号:US20240258136A1
公开(公告)日:2024-08-01
申请号:US18430398
申请日:2024-02-01
Applicant: Applied Materials, Inc.
IPC: H01L21/67 , C23C14/35 , H01L21/677 , H01L21/687
CPC classification number: H01L21/67184 , C23C14/35 , H01L21/67167 , H01L21/67196 , H01L21/67742 , H01L21/67766 , H01L21/68707
Abstract: Embodiments disclosed herein include a substrate processing module and a method of moving a workpiece. The substrate processing module includes a shutter stack and two process stations. The shutter stack is disposed between the process stations. The method of moving a workpiece includes moving a supporting portion from a first location to a shutter stack in a first direction, retrieving the workpiece from the shutter stack, and moving the supporting portion to a second location. The transfer chamber assembly and method allows for moving workpieces to and from the shutter stack to the two process stations. A central transfer robot of the substrate processing module is configured to grip both substrates and shutter discs, allowing for one robot when typically two robots would be required.
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公开(公告)号:US20240153801A1
公开(公告)日:2024-05-09
申请号:US18141926
申请日:2023-05-01
Applicant: Applied Materials, Inc.
Inventor: Bhaskar PRASAD , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Lakshmikanth Krishnamurthy SHIRAHATTI
IPC: H01L21/677
CPC classification number: H01L21/67706 , H01L21/67709 , H01L21/6773
Abstract: A substrate process station includes a housing including a transport region and process region. The process station further includes a magnetic levitation assembly disposed in the transport region configured to levitate and propel a substrate carrier. The magnetic levitation assembly includes a first track segment including first rails disposed in the transport region and below the process region, wherein the first rails each include a first plurality of magnets. The process station further includes a pedestal assembly comprising a pedestal disposed within the housing. The pedestal is moveable between a pedestal transfer position and a process position, wherein the pedestal is disposed between the first rails in the pedestal transfer position to receive a substrate from the substrate carrier, and wherein the pedestal is moveable between the first rails to position the received substrate in the process region in the process position.
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公开(公告)号:US20220336248A1
公开(公告)日:2022-10-20
申请号:US17230775
申请日:2021-04-14
Applicant: Applied Materials, Inc.
Inventor: Anubhav SRIVASTAVA , Bhaskar PRASAD , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Srinivasa Rao YEDLA , Lakshmikanth Krishnamurthy SHIRAHATTI
IPC: H01L21/683 , H01L21/677
Abstract: Embodiments of the present disclosure generally relate to methods and apparatus for processing substrates. More specifically, embodiments of the present disclosure relate to transfer apparatus and substrate-supporting members. In an embodiment, an apparatus for transferring a substrate is provided. The apparatus includes a hub and a plurality of transfer arms extending from the hub. The apparatus further includes a plurality of substrate-supporting members, wherein each of the transfer arms has a first end coupled to the hub and a second end coupled to a respective one of the plurality of substrate-supporting members. The apparatus further includes a first electrical interface connection for electrostatically chucking a substrate and located at a first position on each substrate-supporting member, and a second electrical interface connection for electrostatically chucking the substrate and located at a second position on each substrate-supporting member. Substrate processing modules are also described.
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10.
公开(公告)号:US20220270898A1
公开(公告)日:2022-08-25
申请号:US17185360
申请日:2021-02-25
Applicant: Applied Materials, Inc.
Inventor: Kirankumar Neelasandra SAVANDAIAH , Nitin Bharadwaj SATYAVOLU , Srinivasa Rao YEDLA , Bhaskar PRASAD , Thomas BREZOCZKY
Abstract: A method and apparatus for substrate processing and a cluster tool including a transfer chamber assembly and a plurality of processing assemblies. Processing chamber volumes are sealed from the transfer chamber volume using a support chuck on which a substrate is disposed. A seal ring assembly is coupled to the support chuck. The seal ring assembly includes an inner assembly, an assembly bellows circumscribing the inner assembly, and a bellows disposed between the inner and outer platform. An inner ring is disposed between inner assembly of the seal ring assembly and the bottom surface of the support chuck. An outer ring disposed between the seal ring assembly and the lower sealing surface of the process chamber wall. The support chuck is raised to form an isolation seal between the processing chamber volume and the transfer chamber volume using the bellows, the inner ring, and the outer ring.
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