Coherent THz emitter with DC power reducing resistor
    1.
    发明授权
    Coherent THz emitter with DC power reducing resistor 有权
    具有直流功率降低电阻的相干THz发射器

    公开(公告)号:US07397428B2

    公开(公告)日:2008-07-08

    申请号:US10526560

    申请日:2003-09-04

    IPC分类号: H01Q5/00

    摘要: An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (11); and first and second contact elements (12, 13, 14) separated by a photoconducting gap provided by said photoconducting material (11), for applying a bias across said photoconducting gap, wherein at least one of said first and second contact elements (12, 13, 14) comprises a resistive element (14) for restricting current flow between said first and second contact elements in a second range of frequencies lower than the first range of frequencies.

    摘要翻译: 用于在第一频率范围内发射辐射的发射器,包括:光电导材料(11); 以及由所述光导材料(11)提供的光导间隔分开的用于跨所述光导间隙施加偏压的第一和第二接触元件(12,13,14),其中所述第一和第二接触元件(12, 13,14)包括用于在低于第一频率范围的第二频率范围内限制所述第一和第二接触元件之间的电流的电阻元件(14)。

    Spectroscopy apparatus and associated technique
    2.
    发明授权
    Spectroscopy apparatus and associated technique 有权
    光谱仪及相关技术

    公开(公告)号:US07728296B2

    公开(公告)日:2010-06-01

    申请号:US10550183

    申请日:2004-03-19

    IPC分类号: G01N21/35

    摘要: Apparatus and method for detecting an explosive material, involving irradiating an object with a continuous wave (CW) or pulsed beam of Terahertz radiation, preferably in the frequency range of 100 GHz to 100 THz and detecting radiation transmitted and/or reflected from the object. A spectrum is constructed from the detected radiation, which is indicative of a fundamental property of the explosive material. This constructed spectrum is compared with one or more known spectra of explosive materials to determine whether a likeness exists.

    摘要翻译: 用于检测爆炸性材料的装置和方法,包括用连续波(CW)或太赫兹辐射的脉冲波束照射物体,优选在100GHz至100THz的频率范围内,并检测从物体发射和/或反射的辐射。 从检测到的辐射构建光谱,其表示爆炸物质的基本特性。 将这种构建的光谱与一种或多种已知的爆炸材料的光谱进行比较,以确定是否存在相似性。

    Method and apparatus for investigating a non-planar sample
    4.
    发明授权
    Method and apparatus for investigating a non-planar sample 有权
    用于研究非平面样品的方法和装置

    公开(公告)号:US08665423B2

    公开(公告)日:2014-03-04

    申请号:US10569374

    申请日:2004-08-27

    IPC分类号: G01J3/00

    摘要: Method and apparatus for investigating a sample particularly a pharmaceutical tablet. An emitter and/or the sample are initially positioned so that the emitter is at a predetermined distance and normal angle to a first point on a surface of the sample. The emitter then irradiates the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz at a plurality of points on the surface of the sample. Relative motion is possible between the emitter and the sample so that the surface of the sample can be tracked to maintain the predetermined distance and normal angle at each of the plurality of points, and allow radiation transmitted and/or reflected from the sample at the plurality of points to be detected. This has particular application to imaging the structure or composition of a coating on a pharmaceutical tablet.

    摘要翻译: 用于研究样品的方法和装置,特别是药物片剂。 发射器和/或样品最初被定位成使得发射体与样品表面上的第一点处于预定距离和法线的角度。 然后,发射体在样品表面上的多个点处以25GHz至100THz的多个频率的辐射照射样品。 可以在发射体和样本之间进行相对运动,使得可以跟踪样品的表面以在多个点中的每一个处保持预定距离和法线角度,并且允许在多个点处从样品发射和/或反射的辐射 要检测的点。 这具有用于成像药物片剂上的涂层的结构或组成的特殊应用。

    TeraHertz probe array imaging system
    5.
    发明授权
    TeraHertz probe array imaging system 有权
    TeraHertz探针阵列成像系统

    公开(公告)号:US09075002B2

    公开(公告)日:2015-07-07

    申请号:US10588891

    申请日:2005-02-11

    摘要: A probe array (1) for an imaging system for examining an object (19) comprising at least one emitter (7) for emitting radiation, a plurality of detectors (9) for detecting radiation and means for directing radiation emitted by the at least one emitter (7) to the object (19) and for directing radiation reflected from the object (19) to at least two of the plurality of detectors (9) wherein in use the emitted radiation is scanned by means (21) across the object (19).

    摘要翻译: 一种用于检查物体(19)的成像系统的探针阵列(1),包括用于发射辐射的至少一个发射器(7),用于检测辐射的多个检测器(9)和用于引导由所述至少一个 发射器(7)到物体(19)并且用于将从物体(19)反射的辐射引导到多个检测器(9)中的至少两个,其中在使用中,所发射的辐射通过装置(21)扫过物体 19)。

    Method and apparatus for investigating a sample
    6.
    发明授权
    Method and apparatus for investigating a sample 有权
    用于调查样品的方法和装置

    公开(公告)号:US07485863B2

    公开(公告)日:2009-02-03

    申请号:US10568949

    申请日:2004-08-20

    申请人: Bryan E. Cole

    发明人: Bryan E. Cole

    IPC分类号: G01N21/35

    摘要: Method and apparatus for irradiating a sample with Terhertz radiation and detecting non-specular radiation in order to characterise the internal structure of the sample. Terahertz radiation specularly reflected from the surface is minimised so that it does not mask the weaker signal originating from the internal structure of the sample.

    摘要翻译: 用于用Terhertz辐射照射样品并检测非镜面辐射以便表征样品的内部结构的方法和装置。 从表面镜面反射的太赫兹辐射被最小化,使得其不掩盖源自样品的内部结构的较弱信号。