Coherent THz emitter with DC power reducing resistor
    1.
    发明授权
    Coherent THz emitter with DC power reducing resistor 有权
    具有直流功率降低电阻的相干THz发射器

    公开(公告)号:US07397428B2

    公开(公告)日:2008-07-08

    申请号:US10526560

    申请日:2003-09-04

    IPC分类号: H01Q5/00

    摘要: An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (11); and first and second contact elements (12, 13, 14) separated by a photoconducting gap provided by said photoconducting material (11), for applying a bias across said photoconducting gap, wherein at least one of said first and second contact elements (12, 13, 14) comprises a resistive element (14) for restricting current flow between said first and second contact elements in a second range of frequencies lower than the first range of frequencies.

    摘要翻译: 用于在第一频率范围内发射辐射的发射器,包括:光电导材料(11); 以及由所述光导材料(11)提供的光导间隔分开的用于跨所述光导间隙施加偏压的第一和第二接触元件(12,13,14),其中所述第一和第二接触元件(12, 13,14)包括用于在低于第一频率范围的第二频率范围内限制所述第一和第二接触元件之间的电流的电阻元件(14)。

    APPARATUS AND METHOD FOR INVESTIGATING A SAMPLE
    2.
    发明申请
    APPARATUS AND METHOD FOR INVESTIGATING A SAMPLE 有权
    用于调查样品的装置和方法

    公开(公告)号:US20110163234A1

    公开(公告)日:2011-07-07

    申请号:US12835409

    申请日:2010-07-13

    申请人: Julian A. Cluff

    发明人: Julian A. Cluff

    IPC分类号: G01N21/35 G01J1/42

    摘要: An apparatus for investigating a sample comprising: a source of beam radiation; a detector for detecting a beam of radiation reflected by the sample and an optical subsystem for manipulating the beam between source and detector wherein the optical subsystem comprises a first optical element arranged in use to angularly deflect the source beam within a given solid angle and a second optical element arranged to focus the beam from the first optical element onto a substantially flat image plane and wherein radiation reflected by the sample passes back through the first and second optical elements to the detector.

    摘要翻译: 一种用于调查样本的装置,包括:光束辐射源; 用于检测由样品反射的辐射束的检测器和用于在源和检测器之间操纵光束的光学子系统,其中光学子系统包括布置在使用中以在给定立体角内角度偏转源束的第一光学元件, 光学元件布置成将来自第一光学元件的光束聚焦到基本上平坦的图像平面上,并且其中由样本反射的辐射通过第一和第二光学元件返回到检测器。

    Apparatus and method for investigating a sample
    3.
    发明授权
    Apparatus and method for investigating a sample 有权
    用于调查样品的装置和方法

    公开(公告)号:US08373126B2

    公开(公告)日:2013-02-12

    申请号:US12835409

    申请日:2010-07-13

    申请人: Julian A. Cluff

    发明人: Julian A. Cluff

    IPC分类号: G01N21/35 G01J1/42

    摘要: An apparatus for investigating a sample comprising: a source of beam radiation; a detector for detecting a beam of radiation reflected by the sample and an optical subsystem for manipulating the beam between source and detector wherein the optical subsystem comprises a first optical element arranged in use to angularly deflect the source beam within a given solid angle and a second optical element arranged to focus the beam from the first optical element onto a substantially flat image plane and wherein radiation reflected by the sample passes back through the first and second optical elements to the detector.

    摘要翻译: 一种用于调查样本的装置,包括:光束辐射源; 用于检测由样品反射的辐射束的检测器和用于在源和检测器之间操纵光束的光学子系统,其中光学子系统包括布置在使用中以在给定立体角内角度偏转源束的第一光学元件, 光学元件布置成将来自第一光学元件的光束聚焦到基本上平坦的图像平面上,并且其中由样本反射的辐射通过第一和第二光学元件返回到检测器。

    Apparatus and method for investigating a sample
    4.
    发明授权
    Apparatus and method for investigating a sample 有权
    用于调查样品的装置和方法

    公开(公告)号:US07777187B2

    公开(公告)日:2010-08-17

    申请号:US11597089

    申请日:2005-05-11

    申请人: Julian A. Cluff

    发明人: Julian A. Cluff

    IPC分类号: G01N21/35

    摘要: An apparatus for investigating a sample comprising: a source of beam radiation; a detector for detecting a beam of radiation reflected by the sample and an optical subsystem for manipulating the beam between source and detector wherein the optical subsystem comprises a first optical element arranged in use to angularly deflect the source beam within a given solid angle and a second optical element arranged to focus the beam from the first optical element onto a substantially flat image plane and wherein radiation reflected by the sample passes back through the first and second optical elements to the detector.

    摘要翻译: 一种用于调查样本的装置,包括:光束辐射源; 用于检测由样品反射的辐射束的检测器和用于在源和检测器之间操纵光束的光学子系统,其中光学子系统包括布置在使用中以在给定立体角内角度偏转源束的第一光学元件, 光学元件布置成将来自第一光学元件的光束聚焦到基本上平坦的图像平面上,并且其中由样本反射的辐射通过第一和第二光学元件返回到检测器。

    Apparatus for varying the path length of a beam of radiation
    5.
    发明授权
    Apparatus for varying the path length of a beam of radiation 有权
    用于改变辐射束的路径长度的装置

    公开(公告)号:US07742172B2

    公开(公告)日:2010-06-22

    申请号:US10528197

    申请日:2003-09-18

    CPC分类号: G02B26/06 G01N21/3581

    摘要: An apparatus for varying the path length of a beam of radiation, the apparatus comprising: an element (51) rotatably mounted about an axis, said element comprising two reflective surfaces in fixed relation to one another such that radiation may be reflected between said reflective surfaces and out of the element (51); and driving means (55) for rotatably oscillating said element about said axis.

    摘要翻译: 一种用于改变辐射束的路径长度的装置,所述装置包括:围绕轴线可旋转地安装的元件(51),所述元件包括彼此固定的两个反射表面,使得辐射可以在所述反射表面 并从元素(51)出来; 以及用于围绕所述轴线可旋转地摆动所述元件的驱动装置(55)。