摘要:
Techniques and mechanisms for exchanging single-ended communications with a protocol stack of an integrated circuit package. In an embodiment, an integrated circuit (IC) chip includes a protocol stack comprising a transaction layer which performs operations compatible with a Peripheral Component Interconnect Express™ (PCIe™) specification. Transaction layer packets, exchanged between the transaction layer and a link layer of the protocol stack, are compatible with a PCIe™ format. In another embodiment, a physical layer of the protocol stack is to couple the IC chip to another IC chip for an exchange of the transaction layer packets via single-ended communications. A packaged device includes both of the IC chips.
摘要:
A system is described for providing a patch mechanism within an input/output (I/O) controller, which can be used to workaround defects and conditions existing in the I/O controller. The system includes a patch module coupled to a completion queue included in the I/O controller. The patch module is used to sample incoming cycles received by the I/O controller and to determine if the captured incoming cycle matches one or more of preprogrammed trigger conditions. The patch module is capable of working around a captured non-posted request cycle by controlling header information loaded into the completion queue and by instructing the completion queue whether or not to discard a completion received from a designated end-device.
摘要:
An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.
摘要:
A system and apparatus combining a hub and a function as a single chip compound device. A single serial interface engine (SIE) is shared between a hub endpoint and a function endpoint. The hub endpoint and function endpoint being integrated on a single chip. A single backend interface is coupled between the SIE and the endpoints. The backend interface selects which of the hub endpoints or the function endpoints can access the shared SIE at any time period. In one embodiment, a first address is associated with the hub and a second address is associated with the function. The backend interface selects between the hub and function by comparing a translated address received from the SIE with each of the first address and the second address. The result of the comparisons via suitable combinational logic serves as a select signal for a multiplexer between the hub/function and the SIE.
摘要:
An Automated Dynamic low voltage monitoring (LVM) based Low-Power (ADLLP) debug capability for a system-on-chip (SoC) as well as the open/closed-chassis platform for faster TTM (Time to Market) of the final platform or system. ADLLP Debug is achieved by detection of the probe connection between a target system (e.g., SoC) and debug host system. A user can dynamically override the power, clocks and LVM for intellectual property (IP) blocks not part of the debug trace by instructing a Power Management Controller (PMC) via the Inter Processor Communication (IPC) mailbox (or any other suitable mailbox driver) to set the registers in a Target Firmware (TFW) based on the probe and debug use-case.
摘要:
Methods and apparatus for managing sideband routers in an On-Die System Fabric (OSF) are described. In one embodiment, a sideband OSF router is configurable during runtime based, at least in part, on information stored in a table accessible by an agent coupled to the sideband OSF router. Other embodiments are also disclosed.
摘要:
A clock and reset unit for providing power saving modes to a pipelined microprocessor and for guaranteeing that power saving instruction is the last to be executed before the clocks stop, upon wake-up the next instruction executed is the first instruction in the interrupt service routine (ISR) and that upon return from the ISR, the instruction immediately following the power saving instruction is executed. A register is provided in the clock and reset unit for initiating a power saving mode. A software programmer selects a particular power saving mode by setting a corresponding bit in this register (i.e., writing a predetermined value to this register). A processor stalling signal generator for generating a signal that indicates to the processor that the peripheral is not ready to process a processor request (thereby causing the processor to insert wait states until the peripheral is ready) is provided. The clock and reset unit is also provided a signal from an interrupt handler indicating that the processor will be executing the ISR upon leaving the power save instruction. In response to this signal, the clock and reset unit de-assert the wait state request and brought the processor out of the power saving instruction.
摘要:
An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.
摘要:
A method and apparatus for generating both a uniform duty cycle clock and a variable duty cycle clock with a single state machine. A single state machine is provided having a series of states through which it transitions when in a first mode. The series of states causes the output of the state machine to be a uniform duty cycle clock signal. The state machine has a second group of states through which it transitions in a second mode. A transition scheme among the second group of states permits the duty cycle of a state machine output clock signal to vary.
摘要:
An apparatus and method of reducing power consumption in an integrated device having a first module with a mandatory operating frequency and a second module with a flexible frequency requirement. The integrated device is powered by a serial bus. The first module is segregated from the second module in the time domain by a frequency independent interface. The second module is then operated at a lower frequency when power conservation is needed. The operating frequency of the second module can be dynamically changed to improve performance of the second module when a power budget for the device permits.