Method of forming semi-insulating silicon carbide single crystal
    7.
    发明申请
    Method of forming semi-insulating silicon carbide single crystal 有权
    形成半绝缘碳化硅单晶的方法

    公开(公告)号:US20060174825A1

    公开(公告)日:2006-08-10

    申请号:US11052899

    申请日:2005-02-09

    CPC分类号: C30B29/36 C30B23/00

    摘要: Embodiments related to a method of forming semi-insulating silicon carbide (SiC) single crystal are disclosed in which shallow donor levels originating, at least in part, from residual nitrogen impurities are compensated by the addition of one or more trivalent element(s) introduced by doping the SiC in a concentration that changes the SiC conductivity from n-type to semi-insulating. Related embodiments provide for the additional doping of the SiC single crystal with one or more deep level dopants. However, the resulting concentration of deep level dopants, as well as shallow donor or acceptor dopants, is not limited to concentrations below the detection limits of secondary ion mass spectrometry (SIMS) analysis.

    摘要翻译: 公开了与形成半​​绝缘碳化硅(SiC)单晶的方法相关的实施例,其中至少部分由残留氮杂质起源的浅供体水平通过加入一种或多种引入的三价元素来补偿 通过以将SiC导电性从n型改变为半绝缘的浓度掺杂SiC。 相关实施例提供了具有一个或多个深层掺杂剂的SiC单晶的附加掺杂。 然而,所产生的深层掺杂剂以及浅施主或受体掺杂剂的浓度不限于低于二次离子质谱(SIMS)分析检测限的浓度。