Abstract:
A high voltage metal-oxide-semiconductor (HVMOS) transistor includes a gate poly, wherein a channel is formed in an area projected from the gate poly in a thickness direction when the HVMOS is activated; two carrier drain drift regions, adjacent to the area projected from the gate poly, wherein at least one of the carrier drain drift regions has a gradient doping concentration; and two carrier plus regions, respectively locate within the two carrier drain drift regions, wherein the two carrier plus regions and the two carrier drain drift regions are communicating with each other through the channel when the HVMOS is activated.
Abstract:
A nasal filter includes a main body, a cover, and a filtering medium. The main body has a hollow cylinder, a boss connected to a spherical member, a flange, and a plurality of internal guide vanes. The hollow cylinder has a front and a rear opening. A first threaded portion is formed on the outer surface at the front end portion of the hollow cylinder. A thru hole is formed on the cover and aligns correspondingly to the front opening of the hollow cylinder. A second threaded portion is formed on the inner surface of the cover for mating to the first threaded portion on the hollow cylinder. The filtering medium is held in between the cover and the hollow cylinder and covers the thru hole. A filter pad is further included to provide additional functions. Accordingly, the nasal filter offers air purification and doe not cover the mouth.
Abstract:
A high voltage metal-oxide-semiconductor (HVMOS) transistor includes a gate poly, wherein a channel is formed in an area projected from the gate poly in a thickness direction when the HVMOS is activated; two carrier drain drift regions, adjacent to the area projected from the gate poly, wherein at least one of the carrier drain drift regions has a gradient doping concentration; and two carrier plus regions, respectively locate within the two carrier drain drift regions, wherein the two carrier plus regions and the two carrier drain drift regions are communicating with each other through the channel when the HVMOS is activated.
Abstract:
A method of fabricating a semiconductor device is provided. The method comprises: forming a first layer; forming a P-well on the first layer; forming an isolation region in the P-well; performing an extra implantation on a surface between the P-well and the first layer; and forming a source/drain region. The method of the present invention can solve the punch through problem of the conventional iso-NMOS transistor without increasing cost.