Determining width and height of electron spot

    公开(公告)号:US11257651B2

    公开(公告)日:2022-02-22

    申请号:US16973497

    申请日:2019-06-24

    申请人: Excillum AB

    摘要: A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.

    Method for controlling an x-ray source

    公开(公告)号:US11350512B2

    公开(公告)日:2022-05-31

    申请号:US17057192

    申请日:2019-06-07

    申请人: Excillum AB

    IPC分类号: H05G1/52 H01J35/14 H05G1/26

    摘要: A method for controlling an X-ray source configured to emit, from an X-ray spot on a target, X-ray radiation generated by an interaction between an electron beam and the target, wherein the X-ray spot is determined by the field of view of an X-ray optical system of the X-ray source. The method includes providing the target, providing the electron beam forming an electron spot on the target and interacting with the target to generate X-ray radiation, and adjusting a width and total power of the electron beam such that a maximum of the power density profile in the electron spot is below a predetermined limit, and such that a total power delivered to the target in the X-ray spot is increased.

    Vapour monitoring
    3.
    发明授权

    公开(公告)号:US10930464B2

    公开(公告)日:2021-02-23

    申请号:US16499582

    申请日:2018-03-27

    申请人: Excillum AB

    摘要: A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.

    Characterization of an electron beam

    公开(公告)号:US11579318B2

    公开(公告)日:2023-02-14

    申请号:US17777747

    申请日:2020-11-12

    申请人: Excillum AB

    IPC分类号: G01T1/34

    摘要: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also a corresponding liquid metal jet X-ray source.

    Method for protecting an X-ray source and an X-ray source

    公开(公告)号:US11438996B2

    公开(公告)日:2022-09-06

    申请号:US16967151

    申请日:2019-02-08

    申请人: Excillum AB

    IPC分类号: H05G2/00 H05G1/54

    摘要: A method for protecting an X-ray source including: a liquid jet generator configured to form a liquid jet moving along a flow axis; an electron source configured to provide an electron beam interacting with the liquid jet to generate X-ray radiation; the method including: generating the liquid jet: monitoring a quality measure indicating a performance of the liquid jet; identifying, based on the quality measure, a malperformance of the liquid jet; and if said malperformance is identified, causing the X-ray source to enter a safe mode for protecting the X ray source. Further, to corresponding devices.

    X-ray source and method for generating x-ray radiation

    公开(公告)号:US11342154B2

    公开(公告)日:2022-05-24

    申请号:US16766935

    申请日:2018-11-30

    申请人: Excillum AB

    IPC分类号: H01J35/14 H01J35/08

    摘要: The present inventive concept relates to an X-ray source comprising: a liquid target source configured to provide a liquid target moving along a flow axis; an electron source configured to provide an electron beam; and a liquid target shaper configured to shape the liquid target to comprise a non-circular cross section with respect to the flow axis, wherein the non-circular cross section has a first width along a first axis and a second width along a second axis, wherein the first width is shorter than the second width, and wherein the liquid target comprises an impact portion being intersected by the first axis; wherein the x-ray source is configured to direct the electron beam towards the impact portion such that the electron beam interacts with the liquid target within the impact portion to generate X-ray radiation.

    Structured x-ray target
    7.
    发明授权

    公开(公告)号:US10784069B2

    公开(公告)日:2020-09-22

    申请号:US16340449

    申请日:2017-10-19

    申请人: Excillum AB

    摘要: A system and method for generating X-ray radiation. The system includes an electron source operable to generate an electron beam and an X-ray target for generating X-ray radiation upon interaction with the electron beam. The method includes moving the electron beam over an edge separating a first region and a second region of the X-ray target, wherein the first region and the second region have different capability to generate X-ray radiation upon interaction with the electron beam. The system allows for a lateral extension of the electron beam to be determined based on a change in a quantity indicative of the interaction between the electron beam and the first region and between the electron beam and the second region, and the movement of the electron beam.