公开(公告)号：US09791375B2

公开(公告)日：2017-10-17

申请号：US14668500

申请日：2015-03-25

Applicant: FUJIFILM Corporation

Inventor： Shogo Yamazoe ,  Masayuki Naya ,  Megumi Shiota

IPC: G01J3/44 ,  G01N21/00 ,  G01N21/65 ,  G01B11/14 ,  G01J3/02

CPC classification number: G01N21/658 ,  G01B11/14 ,  G01J3/0227 ,  G01J3/4412 ,  G01N2201/0612

Abstract: Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detected by a position detection unit disposed on the rear surface side of the optical electric field enhancing device, and excitation light is applied to the detected position by an excitation light application unit. Signal light emitted from the analyte when the excitation light is applied is detected from the rear surface side of the transparent substrate.

公开(公告)号：US09728388B2

公开(公告)日：2017-08-08

申请号：US14875129

申请日：2015-10-05

Applicant: FUJIFILM Corporation

Inventor： Masayuki Naya ,  Shogo Yamazoe ,  Megumi Shiota ,  Makoto Suematsu

IPC: G01N21/00 ,  H01J49/16 ,  G01N21/65 ,  H01J49/00 ,  H01J49/04 ,  H01J49/40

CPC classification number: H01J49/164 ,  G01N21/658 ,  G01N2201/06113 ,  G01N2201/068 ,  H01J49/0004 ,  H01J49/0418 ,  H01J49/40

Abstract: A metal film of a measurement device including a transparent dielectric substrate is irradiated with first light from a transparent dielectric substrate side, an optical electric field enhanced by an optical electric field enhancing effect of a localized plasmon induced to a surface of the metal film by the irradiation is generated, light emitted from the transparent dielectric substrate side is detected, a specimen installed on a surface of a metal fine concavo-convex structure layer and a matrix agent are irradiated with second light from a side opposite to the side of the irradiation with the first light in a state where a voltage is applied to the metal fine concavo-convex structure layer through a voltage application electrode, an analysis target substance for mass spectrometry in the specimen is desorbed from the surface by the irradiation, and the desorbed analysis target substance is detected.