公开(公告)号：US20070146947A1

公开(公告)日：2007-06-28

申请号：US11588163

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： H02H3/00

CPC分类号： H02H3/335 ,  H01H2071/044

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

摘要翻译： 一种用于测试具有泄漏电流检测电路的漏电流保护装置的寿命的装置和具有开关装置的跳闸机构。 在一个实施例中，该装置是接地故障模拟单元，泄漏电流检测电路的故障检测器和跳闸机构，以及具有用于控制故障检测器的操作的MCU的寿命测试检测控制单元。 在操作中，第一信号（脉冲信号）被发送到开关装置的栅极，以在开关装置的阴极处产生第一电压，第二信号被发送到接地故障模拟单元以产生模拟接地故障 测量在开关装置的栅极处产生第二电压的漏电流检测电路以及第一和第二电压，以确定泄漏电流检测电路和跳闸机构中是否存在故障。

公开(公告)号：US07522064B2

公开(公告)日：2009-04-21

申请号：US11588016

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： G08B21/00

CPC分类号： H02H3/335 ,  G01R31/3278

摘要： An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.

摘要翻译： 一种用于测试泄漏电流保护装置的寿命的装置，包括微控制器单元，第一故障检测器和第二故障检测器中的至少一个，音频警报和视觉报警中的至少一个，电源电路。 在操作中，第一故障检测器和/或第二故障检测器接收来自漏电流保护装置的至少一个信号，并且产生至少一个对应于要由MCU接收的至少一个信号的DC电压。 MCU将至少一个DC电压与预定阈值进行比较，以确定漏电流保护装置中是否存在故障，并且如果存在至少一个故障，则激活该报警电路。

公开(公告)号：US20070146945A1

公开(公告)日：2007-06-28

申请号：US11588017

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： H02H3/00 ,  H02H9/08

CPC分类号： H02H3/335 ,  G01R31/3278

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.

摘要翻译： 一种用于测试具有漏电流检测电路和跳闸机构的漏电流保护装置的寿命的装置。 在一个实施例中，该装置包括用于在AC电力的每个负半波期间产生模拟接地故障的接地故障模拟电路，用于产生反映漏电流检测电路的特性的签名信号的签名信号发生电路， 跳闸机构，当产生模拟接地故障时，以及具有微控制器和报警电路的寿命测试检测控制电路。 在操作中，寿命检测检测控制电路从签名信号发生电路接收签名信号，分析接收到的签名信号，以确定泄漏电流检测电路和跳闸机构中是否存在至少一个故障，并且如果 至少存在一个故障。

公开(公告)号：US07525441B2

公开(公告)日：2009-04-28

申请号：US11588017

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： G08B21/00

CPC分类号： H02H3/335 ,  G01R31/3278

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.

摘要翻译： 一种用于测试具有漏电流检测电路和跳闸机构的漏电流保护装置的寿命的装置。 在一个实施例中，该装置包括用于在AC电力的每个负半波期间产生模拟接地故障的接地故障模拟电路，用于产生反映泄漏电流检测电路的特性的签名信号的签名信号产生电路， 跳闸机构，当产生模拟接地故障时，以及具有微控制器和报警电路的寿命测试检测控制电路。 在操作中，寿命检测检测控制电路从签名信号发生电路接收签名信号，分析接收到的签名信号，以确定泄漏电流检测电路和跳闸机构中是否存在至少一个故障，并且如果 至少存在一个故障。

公开(公告)号：US07592924B2

公开(公告)日：2009-09-22

申请号：US11588048

申请日：2006-10-25

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： G08B21/00

CPC分类号： H02H3/335 ,  H02H3/021

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

摘要翻译： 一种用于测试具有泄漏电流检测电路的漏电流保护装置的寿命的装置和具有开关装置的跳闸机构。 在一个实施例中，该装置是接地故障模拟单元，泄漏电流检测电路的故障检测器和跳闸机构，以及具有用于控制故障检测器的操作的MCU的寿命测试检测控制单元。 在操作中，第一信号（脉冲信号）被发送到开关装置的栅极，以在开关装置的阴极处产生第一电压，第二信号被发送到接地故障模拟单元以产生模拟接地故障 测量在开关装置的栅极处产生第二电压的漏电流检测电路以及第一和第二电压，以确定泄漏电流检测电路和跳闸机构中是否存在故障。

公开(公告)号：US07492559B2

公开(公告)日：2009-02-17

申请号：US11588163

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： H02H9/08

CPC分类号： H02H3/335 ,  H01H2071/044

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

公开(公告)号：US20070195470A1

公开(公告)日：2007-08-23

申请号：US11588048

申请日：2006-10-25

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： H02H3/00

CPC分类号： H02H3/335 ,  H02H3/021

摘要： An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

公开(公告)号：US20070146944A1

公开(公告)日：2007-06-28

申请号：US11588016

申请日：2006-10-26

申请人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

发明人： Feng Zhang ,  Hongliang Chen ,  Fu Wang ,  Wusheng Chen ,  Yulin Zhang ,  Huaiyin Song

IPC分类号： H02H3/00

CPC分类号： H02H3/335 ,  G01R31/3278

摘要： An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.

摘要翻译： 一种用于测试泄漏电流保护装置的寿命的装置，包括微控制器单元，第一故障检测器和第二故障检测器中的至少一个，音频警报和视觉报警中的至少一个，电源电路。 在操作中，第一故障检测器和/或第二故障检测器接收来自漏电流保护装置的至少一个信号，并且产生至少一个对应于要由MCU接收的至少一个信号的DC电压。 MCU将至少一个DC电压与预定阈值进行比较，以确定漏电流保护装置中是否存在故障，并且如果存在至少一个故障，则激活该报警电路。

公开(公告)号：USD813103S1

公开(公告)日：2018-03-20

申请号：US29555641

申请日：2016-02-24

申请人： Guande Li ,  Hongliang Chen

设计人： Guande Li ,  Hongliang Chen

公开(公告)号：USD849601S1

公开(公告)日：2019-05-28

申请号：US29621269

申请日：2017-10-06

申请人： Guande Li ,  Hongliang Chen

设计人： Guande Li ,  Hongliang Chen