摘要:
An input/output subsystem is configured as a plurality of input/output subsystem images, each of which appears to a program as an independent input/output subsystem. An input/output subsystem image is identified by an input/output subsystem image identifier, which is used by various programs to designate the particular input/output subsystem image for which an I/O operation is to be performed. An operating system is provided with access to a plurality of input/output subsystem images of the input/output subsystem. One or more controls are provided to the operating system image to enable the operating system image to access the plurality of input/output subsystem images.
摘要:
An input/output subsystem is configured as a plurality of input/output subsystem images, each of which appears to a program as an independent input/output subsystem. In response to an operating system image submitting an input/output (I/O) request requesting access to an input/output subsystem image, a determination is made as to whether the operating system image is authorized to access the input/output subsystem image. In response to the access being authorized, the I/O request is authorized.
摘要:
In an environment employing a fabric, such as a cascading switch network, a predictable input/output (I/O) configuration is provided. The I/O configuration explicitly specifies the one or more peripheral units accessible by a program, such as an operating system. Other peripheral units not specified in the I/O configuration are not accessible, thus, providing a secure environment.
摘要翻译:在采用诸如级联交换网络的结构的环境中,提供了可预测的输入/输出(I / O)配置。 I / O配置明确指定程序可访问的一个或多个外围设备,例如操作系统。 在I / O配置中未指定的其他外围单元不可访问,因此提供安全的环境。
摘要:
An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.
摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.
摘要:
Input/output (I/O) measurement facilities are provided. An extended I/O measurement block facility is provided that enables measurement blocks to be stored in discontiguous areas of main storage and to be accessed directly via addresses. In a further aspect, an extended I/O measurement word facility is provided that facilitates the obtaining of measurement data for single I/O operations.
摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.