Formation of single-crystal thin SiC films
    2.
    发明授权
    Formation of single-crystal thin SiC films 失效
    单晶薄SiC薄膜的形成

    公开(公告)号:US6117233A

    公开(公告)日:2000-09-12

    申请号:US907130

    申请日:1997-08-06

    IPC分类号: C30B1/02 C30B23/02

    CPC分类号: C30B1/023 C30B29/36

    摘要: Thin, single-crystal SiC films are obtained by means of a pyrolysis process, the substrate to be coated being covered with a carbonaceous polysilane, the adhering layer being pyrolyzed in an inert atmosphere and the amorphous layer of SiC obtained in this way being crystallized by maintaining it at a temperature of over 700.degree. C. Using a special variation of the process, it is easy to form doped SiC films. To this end the dopant is added in the form of a silane compound.

    摘要翻译: 通过热解法获得薄的单晶SiC膜,待涂覆的基底被碳质聚硅烷覆盖,粘附层在惰性气氛中热解,以这种方式获得的非晶层由 将其保持在700℃以上的温度。使用该工艺的特殊变化,容易形成掺杂的SiC膜。 为此,掺杂剂以硅烷化合物的形式加入。