摘要:
One embodiment of the present invention sets forth an active bit line charge keeper circuit for improving the reliability of a static random access memory (SRAM) circuit. The active bit line charge keeper circuit includes two sub-circuits, each disposed between bit line pairs within the SRAM circuit. The first sub-circuit mitigates residual state associated with over-developed read state on the bit lines. The second sub-circuit mitigates the effects of residual state associated with reading one value on a given pair of bit lines and subsequently writing a different value. By mitigating the effects of residual state within an SRAM circuit, higher reliability at a given performance level may be achieved.
摘要:
One embodiment of the present invention sets forth a set of three building block circuits for designing a flexible timing generator for an integrated circuit. The first and second building blocks include delay elements that may be customized and fine-tuned prior to fabrication. The third building block may be tuned prior to fabrication as well as after fabrication. The three building blocks may be incorporated into a modular architecture, enabling designers to easily generate well-characterized, flexible, generic timer circuits.
摘要:
One embodiment of the present invention sets forth a technique for shifting the voltage level of signals from a low voltage domain to a high voltage domain, where VDDH is the supply voltage of the high voltage domain and VDDL is the supply voltage of the low voltage domain. A level shifting circuit uses a single input rather than dual rail inputs and does not produce a direct current flow in order to reduce the power consumption. The voltage level shifting circuit may also be used to shift a clock signal since the delays of the rising and falling edges of the clock signal are matched by using a delay element.
摘要:
One embodiment of the present invention sets forth a sense amplifier flop design that is tolerant of process variation. Specific staging of signal transitions through the sense amplifier flop circuit eliminate operational phases involving short-circuit currents between n-channel field-effect transistors (N-FETs) and p-channel field effect transistors (P-FETs) in a complementary-symmetry metal-oxide semiconductor process. By eliminating short-circuit currents between N-FETs and P-FETs within the sense amplifier flop, a large variation in conductivity ratio between N-FETs and P-FETs may be tolerated by the sense amplifier flop. This tolerance to conductivity ratio translates to a tolerance for process variation by the sense amplifier flop circuit.
摘要:
An apparatus and method are provided for preventing a current leakage or direct current when a low voltage domain is powered down. Included is a voltage transition circuit connected between a low voltage domain and a high voltage domain. Such voltage transition circuit includes a circuit component for preventing a current leakage when the low voltage domain is powered down.
摘要:
One embodiment of the present invention sets forth a set of three building block circuits for designing a flexible timing generator for an integrated circuit. The first and second building blocks include delay elements that may be customized and fine-tuned prior to fabrication. The third building block may be tuned prior to fabrication as well as after fabrication. The three building blocks may be incorporated into a modular architecture, enabling designers to easily generate well-characterized, flexible, generic timer circuits.
摘要:
One embodiment of the present invention sets forth a technique for shifting the voltage level of signals from the high voltage domain to a low voltage domain, where VDD_IO is the supply voltage of the high voltage domain and VDD_Logic is the supply voltage of the low voltage domain. A level shifting circuit using a combination of I/O and logic transistors avoids exceeding a maximum tolerable voltage across the gate and source of any of the transistors. The level shifting circuit operates includes a reference voltage circuit that is independent of VDD_IO, so the same level shifting circuit may be used for various VDD_IO voltages. Additionally, the voltage level shifting circuit is not sensitive to scaling of VDD_Logic and operates properly when VDD_Logic is reduced due to shrinking silicon process technology and/or is reduced for a low power application.
摘要:
One embodiment of the present invention sets forth a set of three building block circuits for designing a flexible timing generator for an integrated circuit. The first and second building blocks include delay elements that may be customized and fine-tuned prior to fabrication. The third building block may be tuned prior to fabrication as well as after fabrication. The three building blocks may be incorporated into a modular architecture, enabling designers to easily generate well-characterized, flexible, generic timer circuits.
摘要:
An apparatus and method are provided for preventing a current leakage or direct current when a low voltage domain is powered down. Included is a voltage transition circuit connected between a low voltage domain and a high voltage domain. Such voltage transition circuit includes a circuit component for preventing a current leakage when the low voltage domain is powered down.
摘要:
An apparatus includes a single-rail input connected to a low-voltage domain and a voltage-transition circuit connected to the single-rail input. The voltage-transition circuit is configured to convert a voltage of the low-voltage domain received via the single-rail input to a voltage of the high-voltage domain.