摘要:
A transistor circuit with hysteresis operation, which is formed with a detector part and selector part. The detector part detects a change in the level of an input signal according to one of first and second threshold levels, and generates an output signal having a level corresponding to the input signal. The level of the input signal is changed between a first level and a second level which is lower than the first level. The first and second threshold levels fall within a range defined between the first and second levels. The selector part selects one of the first and second threshold levels in accordance with the level of the output signal, and applies the selected one threshold level to the detector part.
摘要:
An output buffer circuit has a data input terminal which receives logic data, load and drive transistors, a driver for selectively turning on the transistors in accordance with the logic value of the logic data, a data output terminal which is connected to a power source terminal of the VDD level through a current path of the load transistor and is grounded through a current path of the drive transistor, and a capacitor connected as a load to the data output terminal. The output buffer circuit further has a transistion detector circuit for generating a pulse signal in response to a change in level of each of address signals, and a preset circuit for supplying, in response to the pulse signal, a charge or discharge current to the capacitor while a voltage at the data output terminal is not at the VDD/2 level.
摘要:
There is provided a signal propagating device for receiving an input signal at an input end thereof and supplying the input signal to a plurality of memory cells arranged in one row. The signal propagating device includes a word line connected to transmit the input signal and having a plurality of line segments electrically coupled to the memory cells. A preceding one of the line segments is formed to have a larger average width than a succeeding one of the line segments.
摘要:
A sense amplifier in use for a memory device is made up of a pair of Schmitt trigger circuits. These Schmitt trigger circuits are cross coupled with each other so that each of the Schmitt trigger circuits operates in response to a predetermined high potential difference. The predetermined potential difference is high enough to operate each Schmitt trigger circuit according to the steeper slope of the two long slopes of a hysteresis loop of the Schmitt trigger circuit.
摘要:
A process of forming an integrated circuit containing a bipolar transistor and an MOS transistor, by forming a base layer of the bipolar transistor using a non-selective epitaxial process so that the base layer has a single crystalline region on a collector active area and a polycrystalline region on adjacent field oxide, and concurrently implanting the MOS gate layer and the polycrystalline region of the base layer, so that the base-collector junction extends into the substrate less than one-third of the depth of the field oxide, and vertically cumulative doping density of the polycrystalline region of the base layer is between 80 percent and 125 percent of a vertically cumulative doping density of the MOS gate. An integrated circuit containing a bipolar transistor and an MOS transistor formed by the described process.
摘要:
A method for fabricating a semiconductor device having a first and second bipolar devices of the same dopant type includes: depositing a dielectric layer over a semiconductor layer, depositing a gate conductor layer over the dielectric layer, defining base regions of both bipolar devices, removing the gate conductor layer and dielectric layer in the base regions, depositing a base layer on the gate conductor layer and on the exposed semiconductor layer in the base regions, depositing an insulating layer over the base layer, forming a photoresist layer and defining emitter regions of both bipolar devices, removing the photoresist layer in the emitter regions thereby forming two emitter windows, masking the emitter window of the first bipolar device and exposing the base layer in the base region of the second bipolar device to an additional emitter implant through the associated emitter window.
摘要:
A multi-column electron beam exposure apparatus includes: a plurality of column cells; a wafer stage including an electron-beam-property detecting unit for measuring an electron beam property; and a controller for measuring beam properties of electron beams used in all the column cells by using the electron-beam-property detecting unit, and for adjusting the electron beams of the respective column cells so that the properties of the electron beams used in the column cells may be approximately identical. The electron beam property may be any of a beam position, a beam intensity, and a beam shape of the electron beam to be emitted. The electron-beam-property detecting unit may be a chip for calibration with a reference mark formed thereon or a Faraday cup.
摘要:
An electron beam lithography apparatus includes a storage for storing data on a drawing pattern assigned a rank based on an accuracy required for a device pattern, a drawing pattern adjustment unit to generate data on divided drawing patterns based on the rank, a settlement wait time adjustment unit to determine a settlement wait time based on the rank, and a controller to draw the device pattern while irradiating an electron beam based on the data on the divided drawing patterns and the settlement wait time. The drawing pattern adjustment unit determines upper limits on the long-side length of a divided drawing pattern or on the area of the divided drawing pattern based on the rank, and divides the drawing pattern based on the upper limits.
摘要:
An integrated circuit containing a bipolar transistor including an emitter diffused region with a peak doping density higher than 1·1020 atoms/cm3, and an emitter-base junction less than 40 nanometers deep in a base layer. A process of forming the bipolar transistor, which includes forming an emitter dopant atom layer between a base layer and an emitter layer, followed by a flash or laser anneal step to diffuse dopant atoms from the emitter dopant atom layer into the base layer.
摘要:
An electron beam exposure system is designed to correct a proximity effect. The electron beam exposure system includes: an electron beam generation unit for generating an electron beam; an electron beam exposure mask having opening portions that are arranged so that sizes of the opening portions change at a predetermined rate in order of arrangement; a mask deflection unit for deflecting the electron beam on the electron beam exposure mask; a substrate deflection unit for deflecting and projecting the electron beam onto a substrate; and a control unit for controlling deflection amounts in the mask deflection unit and the substrate deflection unit. The direction or directions of the change may be any one of a row direction and a column direction or may be the row and column directions.