X-ray inspection apparatus and x-ray inspection method

    公开(公告)号:US10989674B2

    公开(公告)日:2021-04-27

    申请号:US16730901

    申请日:2019-12-30

    Abstract: Provided are an X-ray inspection apparatus and an X-ray inspection method. The X-ray inspection apparatus includes: an X-ray source; a sample moving mechanism; the TDI sensor; and a TDI computing unit. The TDI computing unit includes a data transfer unit configured to transfer, to an outside, data of accumulated charges obtained by accumulating and transferring the charges, and has a function of setting in advance, as a determination region, a plurality of columns of line sensors with which the sample is detectable, and of detecting the sample in the determination region. The data transfer unit is configured to set, as detecting rows, rows of the pixels with which the sample has been detected in the determination region and rows around the rows, and transfer, to the outside, the data of accumulated charges only for pixels in the detecting rows.

    X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

    公开(公告)号:US20200284738A1

    公开(公告)日:2020-09-10

    申请号:US16730901

    申请日:2019-12-30

    Abstract: Provided are an X-ray inspection apparatus and an X-ray inspection method. The X-ray inspection apparatus includes: an X-ray source; a sample moving mechanism; the TDI sensor; and a TDI computing unit. The TDI computing unit includes a data transfer unit configured to transfer, to an outside, data of accumulated charges obtained by accumulating and transferring the charges, and has a function of setting in advance, as a determination region, a plurality of columns of line sensors with which the sample is detectable, and of detecting the sample in the determination region. The data transfer unit is configured to set, as detecting rows, rows of the pixels with which the sample has been detected in the determination region and rows around the rows, and transfer, to the outside, the data of accumulated charges only for pixels in the detecting rows.

    SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND ANALYSIS METHOD USING SAME

    公开(公告)号:US20230417691A1

    公开(公告)日:2023-12-28

    申请号:US18129597

    申请日:2023-03-31

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: With the use of the sample cell, it is possible to control the thickness of a fluid sample to be analyzed. The sample cell includes a sample cell outer frame 107 having openings at both ends, a lower window member 104 configured to close an opening of the sample cell outer frame, a sample cell inner frame 106 having narrower openings at both ends than the openings of the sample cell outer frame, and an upper window member 105 configured to close an opening of the sample cell inner frame, in which at least one of the lower window member and the upper window member is made of a material that transmits X-rays, the sample cell inner frame is inserted into the sample cell outer frame, and a gap between the lower window member and the upper window member is filled with a fluid sample 100.

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