摘要:
A method for reducing an effect of flare produced by a lithographic apparatus for imaging a design layout onto a substrate is described. A flare map in an exposure field of the lithographic apparatus is simulated by mathematically combining a density map of the design layout at the exposure field with a point spread function (PSF), wherein system-specific effects on the flare map may be incorporated in the simulation. Location-dependent flare corrections for the design layout are calculated by using the determined flare map, thereby reducing the effect of flare. Some of the system-specific effects included in the simulation are: a flare effect due to reflection from black border of a mask, a flare effect due to reflection from one or more reticle-masking blades defining an exposure slit, a flare effect due to overscan, a flare effect due reflections from a gas-lock sub-aperture of a dynamic gas lock (DGL) mechanism, and a flare effect due to contribution from neighboring exposure fields.
摘要:
A method for reducing an effect of flare produced by a lithographic apparatus for imaging a design layout onto a substrate is described. A flare map in an exposure field of the lithographic apparatus is simulated by mathematically combining a density map of the design layout at the exposure field with a point spread function (PSF), wherein system-specific effects on the flare map may be incorporated in the simulation. Location-dependent flare corrections for the design layout are calculated by using the determined flare map, thereby reducing the effect of flare. Some of the system-specific effects included in the simulation are: a flare effect due to reflection from black border of a mask, a flare effect due to reflection from one or more reticle-masking blades defining an exposure slit, a flare effect due to overscan, a flare effect due reflections from a gas-lock sub-aperture of a dynamic gas lock (DGL) mechanism, and a flare effect due to contribution from neighboring exposure fields.
摘要:
The present invention relates to a method of selecting a subset of patterns from a design, to a method of performing source and mask optimization, and to a computer program product for performing the method of selecting a subset of patterns from a design. According to certain aspects, the present invention enables coverage of the full design while lowering the computation cost by intelligently selecting a subset of patterns from a design in which the design or a modification of the design is configured to be imaged onto a substrate via a lithographic process. The method of selecting the subset of patterns from a design includes identifying a set of patterns from the design related to the predefined representation of the design. By selecting the subset of patterns according to the method, the selected subset of patterns constitutes a similar predefined representation of the design as the set of patterns.
摘要:
The present invention relates to a method of selecting a subset of patterns from a design, to a method of performing source and mask optimization, and to a computer program product for performing the method of selecting a subset of patterns from a design. According to certain aspects, the present invention enables coverage of the full design while lowering the computation cost by intelligently selecting a subset of patterns from a design in which the design or a modification of the design is configured to be imaged onto a substrate via a lithographic process. The method of selecting the subset of patterns from a design includes identifying a set of patterns from the design related to the predefined representation of the design. By selecting the subset of patterns according to the method, the selected subset of patterns constitutes a similar predefined representation of the design as the set of patterns.
摘要:
The invention concerns a gesture recognition method for gesture-based interaction at an apparatus. The method comprises receiving one or more images of an object; creating feature images for the received one or more images; determining binary values for pixels in corresponding locations of said feature images and concatenating the binary values to form a binary string for said pixel; repeating the previous step for each corresponding pixel of said feature image to form a feature map and forming a histogram representation of the feature map. The invention also concerns an apparatus and a computer program.
摘要:
Methods, apparatuses, and computer program products are herein provided for enabling hand gesture recognition using an example infrared (IR) enabled mobile terminal. One example method may include determining a hand region in at least one captured frame using an adaptive omnidirectional edge operator (AOEO). The method may further include determining a threshold for hand region extraction using a recursive binarization scheme. The method may also include determining a hand location using the determined threshold for the extracted hand region in the at least one captured frame. The method may also include determining a fingertip location based on the determined hand location. Similar and related example apparatuses and example computer program products are also provided.
摘要:
A method for providing a mechanism for gesture recognition may include causing down-sampling of image data received to generate down-sampled image blocks for a plurality of image frames, causing extraction of a plurality of features from the down-sampled image blocks, determining a moving status of the down-sampled image blocks based on changes in values of respective features in consecutive frames, and determining a direction of motion of an object in the image data based on movement of a first border and a second border of a projection histogram determined based on the moving status of respective down-sampled image blocks. A corresponding apparatus and computer program product are also provided.
摘要:
One embodiment of a method for process window optimized optical proximity correction includes applying optical proximity corrections to a design layout, simulating a lithography process using the post-OPC layout and models of the lithography process at a plurality of process conditions to produce a plurality of simulated resist images. A weighted average error in the critical dimension or other contour metric for each edge segment of each feature in the design layout is determined, wherein the weighted average error is an offset between the contour metric at each process condition and the contour metric at nominal condition averaged over the plurality of process conditions. A retarget value for the contour metric for each edge segment is determined using the weighted average error and applied to the design layout prior to applying further optical proximity corrections.
摘要:
A method for providing orientation independent face detection may include generating multiple mosaic images from an input image in which each of the multiple mosaic images has a different scale, employing a plurality of differently oriented edge detectors to perform edge detection on the multiple mosaic images including combining edges of the multiple mosaic images having the different scales, and performing face detection in regions corresponding to the differently oriented edge detectors based on respective feature maps produced by the differently oriented edge detectors. An apparatus and computer program product corresponding to the method are also provided.