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公开(公告)号：US09595936B2
公开(公告)日：2017-03-14
申请号：US14285067
申请日：2014-05-22
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Hanyi Ding , Alberto Valdes Garcia , Wayne H. Woods, Jr.
Abstract: A reconfigurable bandstop filter and methods of designing and reconfiguring the bandstop filter are disclosed. The reconfigurable bandstop filter includes a plurality of transmission lines each including a phase shifter. The reconfigurable bandstop filter further includes a signal input port having a phase shifter and a signal output port having a phase shifter. The signal input port and the signal output port is coupled to the plurality of transmission lines.
Abstract translation: 公开了一种可重构带阻滤波器以及设计和重新配置带阻滤波器的方法。 可重构带阻滤波器包括多个传输线，每条传输线包括移相器。 可重构带阻滤波器还包括具有移相器的信号输入端口和具有移相器的信号输出端口。 信号输入端口和信号输出端口耦合到多条传输线路。
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公开(公告)号：US09103855B2
公开(公告)日：2015-08-11
申请号：US13650487
申请日：2012-10-12
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Randall M. Burnett, II , Hanyi Ding , Kai D. Feng , Donald J. Papae , Francis F. Szenher
CPC classification number: G01R29/0821 , G01S3/023 , G01S2007/4086
Abstract: A radiation signal measurement system for millimeter wave transceivers is disclosed. Embodiments of the present invention utilize a laser to align the laser with an antenna. The transceiver is then moved into the path of the laser to align the laser with the transceiver. The transceiver or antenna orientation is changed such that the transceiver and antenna face each other, in an aligned position. Millimeter wave absorber material is applied to the inside and outside of the testing chamber to minimize reflections and interference from outside sources.
Abstract translation: 公开了一种用于毫米波收发器的辐射信号测量系统。 本发明的实施例利用激光将激光与天线对准。 然后将收发器移动到激光器的路径中，以将激光器与收发器对准。 收发器或天线方向改变，使得收发器和天线在对准的位置彼此面对。 将毫米波吸收材料施加到测试室的内部和外部，以最小化来自外部源的反射和干扰。
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3.发明授权公开(公告)号：US09054793B2
公开(公告)日：2015-06-09
申请号：US13945969
申请日：2013-07-19
Applicant: International Business Machines Corporation
Inventor： Donald J. Cook , Hanyi Ding , Xuefeng Liu , Randy L. Wolf
CPC classification number: H04B17/19 , G01R31/2822 , G01R31/2856 , G01R31/2879 , G06K19/07728 , H01L22/34
Abstract: Disclosed are test structures for radio frequency (RF) power stress and characterization. Each test structure incorporates a single device and is selectively operated in either a stress mode, during which the device is stressed under RF power, or in an analysis mode, during which the impact of the applied stress on the performance of the device is characterized. During the stress mode, an input RF power signal is applied to the device through an RF signal input port and an output RF power signal is captured from the device at an RF signal output port. Depending upon the impedance value of the device at issue, the RF signal input port and the RF signal output port are connected to either the same terminal or opposing terminals and the need for impedance tuning is avoided. Also disclosed are test systems and methods for selectively controlling operation of such a test structure.
Abstract translation: 公开了用于射频（RF）功率应力和表征的测试结构。 每个测试结构包括单个设备，并且在应力模式中选择性地操作，在该模式期间，器件在RF功率下受到压力，或者在分析模式下，其中施加的应力对器件的性能的影响被表征。 在应力模式期间，通过RF信号输入端口向设备施加输入RF功率信号，并且在RF信号输出端口处从设备捕获输出RF功率信号。 根据所讨论的器件的阻抗值，RF信号输入端口和RF信号输出端口连接到相同的端子或相对的端子，并且避免了阻抗调谐的需要。 还公开了用于选择性地控制这种测试结构的操作的测试系统和方法。
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4.发明申请MILLIMETER WAVE WAFER LEVEL CHIP SCALE PACKAGING (WLCSP) DEVICE 有权MILLIMETER WAVE WAFLE LEVEL CHIP SCALE PACKAGING（WLCSP）DEVICE公开(公告)号：US20150035145A1
公开(公告)日：2015-02-05
申请号：US14519635
申请日：2014-10-21
Applicant: International Business Machines Corporation
Inventor： Hanyi Ding , Richard S. Graf , Gary R. Hill , Wayne H. Woods, JR.
IPC: H01L23/00
CPC classification number: H01L24/17 , H01L22/12 , H01L22/14 , H01L23/3114 , H01L23/49811 , H01L23/49816 , H01L23/49838 , H01L23/5225 , H01L23/66 , H01L24/09 , H01L2224/0401 , H01L2224/16055 , H01L2224/16225 , H01L2224/16227 , H01L2224/1713 , H01L2924/0002 , H01L2924/1532 , H01L2924/2076 , H01L2924/00
Abstract: Various embodiments include wafer level chip scale package (WLCSP) structures and methods of tuning such structures. In some embodiments, the WLCSP structure includes: a printed circuit board (PCB) trace connection including at least one PCB ground connection connected with a PCB ground plane; a set of ground solder balls each contacting the printed circuit board trace connection; a set of chip pads contacting each of the ground solder balls in the set of ground solder balls; a chip ground plane connecting the set of chip pads; and a signal interconnect interposed between two of the set of ground solder balls, the signal interconnect including: a signal trace connection electrically isolated from the PCB ground plane; a signal ball contacting the signal PCB trace connection; a chip pad contacting the signal ball, and a signal trace connection on a chip contacting the chip pad.
Abstract translation: 各种实施例包括晶片级芯片级封装（WLCSP）结构和调谐这种结构的方法。 在一些实施例中，WLCSP结构包括：印刷电路板（PCB）迹线连接，其包括与PCB接地平面连接的至少一个PCB接地连接; 一组接地焊球，每个接触印刷电路板跟踪连接; 与所述一组接地焊球中的所述接地焊球接触的一组芯片焊盘; 连接该组芯片焊盘的芯片接地平面; 以及插入在所述一组接地焊球中的两个之间的信号互连，所述信号互连包括：与所述PCB接地平面电隔离的信号迹线连接; 信号球接触信号PCB跟踪连接; 接触信号球的芯片焊盘和与芯片焊盘接触的芯片上的信号迹线连接。
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公开(公告)号：US20140203885A1
公开(公告)日：2014-07-24
申请号：US13744761
申请日：2013-01-18
Applicant: International Business Machines Corporation
Inventor： Hanyi Ding , Yan Ding
CPC classification number: H01P5/10 , H01F41/02 , Y10T29/49073
Abstract: Aspects of the invention provide for a Marchand balun structure and a related design method. In one embodiment, a marchand balun structure includes: a first trace for an unbalanced port on a first metal layer, the first trace comprising: an unbalanced line including a first width for a first half and a second width for a second half, wherein the second width can be different from the first width; a pair of traces for balanced ports on a second metal layer, the pair of traces comprising: a pair of balanced lines; and a ground plane on a third metal layer, the ground plane comprising: a pair of openings directly under the pair of traces for balanced ports, wherein a center of the unbalanced line of the first trace is offset from a center of the pair of balanced lines of the pair of traces.
Abstract translation: 本发明的方面提供了Marchand平衡 - 不平衡变换器结构和相关的设计方法。 在一个实施例中，行军平衡 - 不平衡变换器结构包括：用于第一金属层上的不平衡端口的第一迹线，所述第一迹线包括：不平衡线，包括用于第一半的第一宽度和用于后半部分的第二宽度， 第二宽度可以不同于第一宽度; 用于第二金属层上的平衡端口的一对迹线，所述一对迹线包括：一对平衡线; 以及在第三金属层上的接地平面，所述接地平面包括：直接位于所述一对迹线下面的平衡端口的一对开口，其中所述第一迹线的不平衡线的中心偏离所述一对平衡的中心 线对的痕迹。
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Patent Agency Ranking
公开(公告)号：US20140152337A1
公开(公告)日：2014-06-05
申请号：US13705213
申请日：2012-12-05
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Hanyi Ding , Kai D. Feng , Ping-Chuan Wang , Zhijian Yang
IPC: G01R31/26
CPC classification number: H01L22/14 , G01R31/024 , G01R31/2644 , G01R31/2884 , H01L22/34 , H01L2924/0002 , H01L2924/00
Abstract: A system, method and apparatus may comprise a wafer having a plurality of spiral test structures located on the kerf of the wafer. The spiral test structure may comprise a spiral connected at either end by a capacitor to allow the spiral test structure to resonate. The spiral structures may be located on a first metal layer or on multiple metal layers. The system may further incorporate a test apparatus having a frequency transmitter and a receiver. The test apparatus may be a sensing spiral which may be placed over the spiral test structures. A controller may provide a range of frequencies to the test apparatus and receiving the resonant frequencies from the test apparatus. The resonant frequencies will be seen as reductions in signal response at the test apparatus.
Abstract translation: 系统，方法和装置可以包括具有位于晶片的切口上的多个螺旋测试结构的晶片。 螺旋测试结构可以包括在任一端由电容器连接的螺旋，以允许螺旋测试结构共振。 螺旋结构可以位于第一金属层上或多个金属层上。 该系统还可以包括具有频率发射器和接收器的测试装置。 测试装置可以是可以放置在螺旋测试结构上方的感测螺旋。 控制器可以向测试设备提供一定范围的频率并从测试设备接收谐振频率。 谐振频率将被看作是在测试装置处的信号响应的减小。
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公开(公告)号：US20140097858A1
公开(公告)日：2014-04-10
申请号：US13647719
申请日：2012-10-09
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Hanyi Ding , Kai D. Feng , Hailing Wang , Zhijian Yang
IPC: G01R31/00
CPC classification number: G01R31/2824 , H03K3/0315
Abstract: A test circuit for a ring oscillator comprising a plurality of inverting stages includes a power supply, the power supply configured to provide a voltage to the plurality of inverting stages of the ring oscillator at a power output; and a power sensing resistor located between the power output of the power supply and direct current (DC) bias inputs of the inverting stages of the ring oscillator, wherein a signal from the power sensing resistor is configured to be monitored to determine a characteristic of the ring oscillator.
Abstract translation: 包括多个反相级的环形振荡器的测试电路包括电源，所述电源被配置为在功率输出时向所述环形振荡器的所述多个反相级提供电压; 以及位于电源的功率输出和环形振荡器的反相级的直流（DC）偏置输入之间的功率感测电阻器，其中来自功率感测电阻器的信号被配置为被监视以确定 环形振荡器。
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公开(公告)号：US08581648B2
公开(公告)日：2013-11-12
申请号：US13761358
申请日：2013-02-07
Applicant: International Business Machines Corporation
Inventor： Hanyi Ding , Kai D. Feng , Zhenrong Jin , Francis F. Szenher
IPC: H03L7/06
Abstract: A method includes phase-shifting an output signal of a phase lock loop (PLL) circuit by applying an injection current to an output of a charge pump of a the PLL circuit. A circuit includes: a first phase lock loop (PLL) circuit and a second PLL circuit referenced to a same clock; a phase detector circuit that detects a phase difference between an output signal of the first PLL circuit and an output signal of the second PLL circuit; and an adjustable current source that applies an injection current to at least one of the first PLL circuit and the second PLL circuit based on an output of the phase detector circuit.
Abstract translation: 一种方法包括通过向PLL电路的电荷泵的输出施加注入电流来相移锁相环（PLL）电路的输出信号。 电路包括：第一锁相环（PLL）电路和参考相同时钟的第二PLL电路; 相位检测器电路，检测第一PLL电路的输出信号和第二PLL电路的输出信号之间的相位差; 以及可调电流源，其基于相位检测器电路的输出将注入电流施加到第一PLL电路和第二PLL电路中的至少一个。
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公开(公告)号：US09214726B2
公开(公告)日：2015-12-15
申请号：US13746029
申请日：2013-01-21
Applicant: International Business Machines Corporation
Inventor： Adem G. Aydin , Hanyi Ding
IPC: H01Q3/26
Abstract: Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.
Abstract translation: 本发明的方面提供了用于测试高频移相器阵列的架构和方法。 在一个实施例中，用于测试移相器阵列的架构包括：多个功率分配器，每个功率分配器被配置为从移相器阵列内的移相器接收输出，并将输出分离成第一信号和第二信号 ; 多个功率限幅器，每个功率限幅器被配置为接收第二信号并通过限制第二信号的幅度来修改第二信号; 第一功率组合器，被配置为从所述多个功率分配器中的每一个接收所述第一信号以产生第一输出; 以及第二功率组合器，其被配置为从所述多个功率限幅器中的每一个接收所述经修改的第二信号以产生第二输出。
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公开(公告)号：US09059494B2
公开(公告)日：2015-06-16
申请号：US13744761
申请日：2013-01-18
Applicant: International Business Machines Corporation
Inventor： Hanyi Ding , Yan Ding
CPC classification number: H01P5/10 , H01F41/02 , Y10T29/49073
Abstract: Aspects of the invention provide for a Marchand balun structure and a related design method. In one embodiment, a marchand balun structure includes: a first trace for an unbalanced port on a first metal layer, the first trace comprising: an unbalanced line including a first width for a first half and a second width for a second half, wherein the second width can be different from the first width; a pair of traces for balanced ports on a second metal layer, the pair of traces comprising: a pair of balanced lines; and a ground plane on a third metal layer, the ground plane comprising: a pair of openings directly under the pair of traces for balanced ports, wherein a center of the unbalanced line of the first trace is offset from a center of the pair of balanced lines of the pair of traces.
Abstract translation: 本发明的方面提供了Marchand平衡 - 不平衡变换器结构和相关的设计方法。 在一个实施例中，行军平衡 - 不平衡变换器结构包括：用于第一金属层上的不平衡端口的第一迹线，所述第一迹线包括：不平衡线，包括用于第一半的第一宽度和用于后半部分的第二宽度， 第二宽度可以不同于第一宽度; 用于第二金属层上的平衡端口的一对迹线，所述一对迹线包括：一对平衡线; 以及在第三金属层上的接地平面，所述接地平面包括：直接位于所述一对迹线下面的平衡端口的一对开口，其中所述第一迹线的不平衡线的中心偏离所述一对平衡的中心 线对的痕迹。
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