公开(公告)号：US06301167B1

公开(公告)日：2001-10-09

申请号：US09638385

申请日：2000-08-12

申请人： Ill Young Lee ,  Sang Sik Lee ,  Jong Hyun Kim ,  Duk Chun Park ,  Byung Soo Ham ,  Byung Koo Ham

发明人： Ill Young Lee ,  Sang Sik Lee ,  Jong Hyun Kim ,  Duk Chun Park ,  Byung Soo Ham ,  Byung Koo Ham

IPC分类号： G11C700

CPC分类号： G11C29/56

摘要： An apparatus for testing a semiconductor memory is disclosed, which includes a power control module for varying an output voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module, thus implementing an accurate operation state of an actual mounting environment of a semiconductor memory device by varying and supplying a certain voltage supplied from a power supply unit when testing whether a semiconductor memory device is defective or not using a main board of a computer apparatus.

摘要翻译： 公开了一种用于测试半导体存储器的装置，其包括用于改变电源单元的输出电压并根据来自主体的CPU（中央处理单元）的功率控制信号向半导体存储器供应的功率控制模块 以及用于将来自主板的CPU的功率控制信号提供给功率控制模块的接口单元，从而通过改变和提供从半导体存储器件提供的一定电压来实现半导体存储器件的实际安装环境的精确操作状态 当使用计算机装置的主板来测试半导体存储器件是否有故障时，电源单元。