摘要:
A method of detecting stress of an integrated circuit including first and second patterns formed from different materials may comprise: determining one or more stress detection points of the first pattern; dividing a region including a first stress detection point of the one or more stress detection points into a plurality of divided regions; calculating areas of the second pattern at the divided regions; and/or detecting a stress level applied to the first stress detection point of the first pattern by the second pattern based on the areas of the second pattern at the divided regions.
摘要:
A window cover for a display device includes a base plate, a printed layer, a specular layer and a light-providing sheet. The base plate has a first face and a second face opposite to the first face. The printed layer is arranged on the first face of the base plate. Further, the printed layer has a printed pattern formed. The specular layer is arranged on the printed layer to reflect a light incident to the specular layer. The light-providing sheet is placed on the second face of the base plate to provide the light to the printed layer. The display device may have improved appearance design.