公开(公告)号：US20040227101A1

公开(公告)日：2004-11-18

申请号：US10771729

申请日：2004-02-04

申请人： Japan Science and Technology Agency ,  OLYMPUS CORPORATION ,  HAMAMATSU PHOTONICS K.K. ,  Nippon Roper KK

发明人： Yoshinori Iketaki ,  Takeshi Watanabe ,  Masaaki Fujii ,  Yasunori Igasaki ,  Toshio Suzuki

IPC分类号： G01N021/64

CPC分类号： G02B26/08

摘要： A microscope capable of being shaped into a beam with complete hollow shape by removing the disorder of the wavefront to the erase light, particularly, and capable of improving the spatial resolution by inducing a super-resolution near the limit, is provided. In the microscope, wherein a first light to excite a molecule from a ground-state to first electron excited state or a second light to excite the molecule from the first electron excited state to the second electron excited state with higher energy level, for a sample 56 including the molecule with three electronic states including at least a ground-state, are spatial phase-modulated into the prescribed beam shape, and parts of these first light and the second light are overlapped and focused to detect luminescence from the sample 56, a wavefront compensation means 61 is provided in the optical path of the first light and/or in the optical path of the second light, and the wavefront aberration caused in the first light and/or in the second light, is removed by the wavefront compensation means 61.

摘要翻译： 提供了能够通过将擦除光的波阵面除去特别是并且能够通过在接近极限附近引起超分辨率来改善空间分辨率而将具有完全中空形状的光束成形为的显微镜。 在显微镜中，其中将分子从基态激发到第一电子激发态的第一光或第二光以将分子从第一电子激发态激发至具有较高能级的第二电子激发态，对于样品 包括具有至少包括基态的三种电子状态的分子被空间相位调制成规定的波束形状，并且这些第一光和第二光的一部分被重叠和聚焦以检测来自样品56的发光， 波前补偿装置61设置在第一光的光路和/或第二光的光路中，并且在第一光和/或第二光中引起的波前像差被波前补偿装置除去 61。