公开(公告)号：US09006674B2

公开(公告)日：2015-04-14

申请号：US13809903

申请日：2011-07-15

申请人： Juhyun Yu ,  Naoyuki Yamada ,  Shinichi Inoue ,  Akihiro Hiruta ,  Chihiro Ohkubo

发明人： Juhyun Yu ,  Naoyuki Yamada ,  Shinichi Inoue ,  Akihiro Hiruta ,  Chihiro Ohkubo

IPC分类号： H01L25/00 ,  H01L31/02 ,  H01L31/0224 ,  H01L31/115 ,  G01T1/24

CPC分类号： H01L31/02016 ,  G01T1/243 ,  H01L31/022408 ,  H01L31/115

摘要： A radioactive ray detecting apparatus provides for reduction of the dead area or region where radioactive rays cannot be detected, even if disposing the radioactive ray detectors to be dense or crowded. The radioactive ray detecting apparatus satisfies the following relationships, when assuming that distance between semiconductor elements is “XG1”, while the distance from the semiconductor element of one of the radioactive ray detectors up to the semiconductor element of other radioactive ray detectors is “XG2”, and distance between the semiconductor elements alighted in a Y-direction is “YG1”, and a horizontal pitch of a predetermined pixel pitch to be used as the radioactive ray detector is “a” and a vertical pitch thereof is “b”, width of a surface of each of plural numbers of semiconductor elements is “c” and length thereof is “d”, respectively: c=a−(XG1+XG2)/2 d=b−YG1=2e+(n−2)f.

摘要翻译： 放射线检测装置即使将放射线检测器设置得密集或拥挤，也能够减少无法检测放射线的死区或区域。 当假设半导体元件之间的距离为“XG1”时，放射线检测装置满足以下关系，而从其中一个放射线检测器的半导体元件到其他放射线检测器的半导体元件的距离为“XG2” ，并且在Y方向下降的半导体元件之间的距离为“YG1”，作为放射线检测器使用的预定像素间距的水平间距为“a”，其垂直间距为“b”，宽度 c = a-（XG1 + XG2）/ 2 d = b-YG1 = 2e +（n-2）f，其中多个半导体元件中的每一个的表面分别为“c”，其长度为“d”

公开(公告)号：US20130241016A1

公开(公告)日：2013-09-19

申请号：US13809903

申请日：2011-07-15

申请人： Juhyun Yu ,  Naoyuki Yamada ,  Shinichi Inoue ,  Akihiro Hiruta ,  Chihiro Ohkubo

发明人： Juhyun Yu ,  Naoyuki Yamada ,  Shinichi Inoue ,  Akihiro Hiruta ,  Chihiro Ohkubo

IPC分类号： H01L31/02

CPC分类号： H01L31/02016 ,  G01T1/243 ,  H01L31/022408 ,  H01L31/115

摘要： A radioactive ray detecting apparatus for enabling to reduce the dead area or region where the radioactive rays cannot be detected, even if disposing the radioactive ray detectors to be dense or crowded, is provided. The radioactive ray detecting apparatus satisfies the following relationships, when assuming that distance between semiconductor elements, being provided with putting a substrate therebetween, is “XG1”, while distance from the semiconductor element of one of the radioactive ray detectors up to the semiconductor element of other radioactive ray detectors, facing to the semiconductor element and neighboring with one radioactive ray detector, is “XG2”, and distance between the semiconductor elements alighted in a Y-direction is “YG1”, and further assuming that a horizontal pitch of a predetermined pixel pitch to be used as the radioactive ray detector is “a” and a vertical pitch thereof is “b”, width of a surface of each of plural numbers of semiconductor elements, upon which radioactive rays are incident, is “c” and length thereof is “d”, and among plural numbers of intra-element pixel regions of respective one of the plural numbers of semiconductor elements, and that length of the intra-element pixel regions, which are positioned at both end portions of respective one of the plural numbers of semiconductor elements, is “e”, and length of each one of the plural numbers of intra-element pixel regions, being put between the intra-element pixel regions, which are positioned at both end portions of each of the plural numbers of semiconductor elements, is “f”, respectively: c=a−(XG1+XG2)/2 d=b−YG1=2e+(n−2)f e=b/n−YG1/2 f=b/n (however, “n” is a positive integer).

摘要翻译： 即使设置致密或拥挤的放射线检测器，也能够提供能够减少无法检测放射线的死区或者区域的放射线检测装置。 放射线检测装置满足以下关系，假设设置有放置基板的半导体元件之间的距离为“XG1”，而从放射线检测器之一的半导体元件到半导体元件的半导体元件 面向半导体元件并与一个放射线检测器相邻的其他放射线检测器为“XG2”，并且在Y方向上下降的半导体元件之间的距离为“YG1”，并且进一步假设预定的 要用作放射线检测器的像素间距为“a”，其垂直间距为“b”，放射线入射的多个半导体元件中的每一个的表面的宽度为“c”，长度 是“d”，并且在多个半导体元件中的相应一个半导体元件的多个像素间像素区域中， 位于多个半导体元件的相应一个半导体元件的两端部的元件像素区域为“e”，并且多个像素内像素区域中的每一个的长度被放置在内部元件之间， 分别位于多个半导体元件的每一个的两端部的元件像素区域分别为“f”：c = a-（XG1 + XG2）/ 2 d = b-YG1 = 2e +（n-2 ）fe = b / n-YG1 / 2 f = b / n（然而，“n”是正整数）。

公开(公告)号：US08497482B2

公开(公告)日：2013-07-30

申请号：US12842456

申请日：2010-07-23

申请人： Juhyun Yu ,  Yoshinori Sunaga ,  Naoyuki Yamada ,  Shinichi Inoue ,  Isao Takahashi

发明人： Juhyun Yu ,  Yoshinori Sunaga ,  Naoyuki Yamada ,  Shinichi Inoue ,  Isao Takahashi

IPC分类号： G01T1/24

CPC分类号： G01T7/00 ,  G01T1/242 ,  G01T1/243

摘要： A radiation detector module includes a radiation detecting substrate including a plurality of semiconductor devices mounted thereon for detecting radiation, a fixing member for holding the radiation detecting substrate, and a circuit substrate connected to the radiation detecting substrate. The radiation detecting substrate further includes a mounting board including an edge portion connected to the circuit substrate at one end thereof, and a flexible substrate including a wiring pattern connected to the plurality of semiconductor devices. The fixing member includes a bottom, a first side wall extending in a normal direction to the bottom from one end of the bottom, a second side wall extending in the normal direction to the bottom from the other end of the bottom, and substrate supporting portions on the first side wall and the second side wall.

摘要翻译： 辐射检测器模块包括：辐射检测基板，包括安装在其上的用于检测辐射的多个半导体器件，用于保持放射线检测基板的固定部件和连接到放射线检测基板的电路基板。 放射线检测基板还包括安装基板，其包括在其一端连接到电路基板的边缘部分，以及包括连接到多个半导体器件的布线图案的柔性基板。 固定构件包括底部，从底部的一端沿垂直方向延伸到底部的第一侧壁，从底部的另一端沿垂直方向延伸到底部的第二侧壁和基底支撑部分 在第一侧壁和第二侧壁上。

公开(公告)号：US08344330B2

公开(公告)日：2013-01-01

申请号：US12458199

申请日：2009-07-02

申请人： Juhyun Yu ,  Yoshinori Sunaga ,  Hidetaka Kawauchi ,  Tsuneaki Kawaguchi ,  Isao Takahashi ,  Shinichi Inoue ,  Naoyuki Yamada ,  Masahiko Kobayashi

发明人： Juhyun Yu ,  Yoshinori Sunaga ,  Hidetaka Kawauchi ,  Tsuneaki Kawaguchi ,  Isao Takahashi ,  Shinichi Inoue ,  Naoyuki Yamada ,  Masahiko Kobayashi

IPC分类号： G01T1/24

CPC分类号： G01T1/243

摘要： A radiation detector includes a semiconductor element capable of detecting a radiation, a substrate on which the semiconductor element is mounted, and a support member disposed adjacent to the semiconductor element for supporting the substrate. The substrate includes a first end portion on which the semiconductor element is mounted, and a second end portion opposite the first end portion for disposing the support member. The support member includes a first support and a second support, and the first support and the second support each includes a protrusion and an engagement hole for engaging with the protrusion. The protrusion of the first support engages with the engagement hole of the second support to fix the first support and the second support such that the substrate is compressed and supported by the first support and the second support.

摘要翻译： 辐射检测器包括能够检测辐射的半导体元件，其上安装有半导体元件的基板和邻近半导体元件设置的用于支撑基板的支撑部件。 基板包括安装半导体元件的第一端部和与第一端部相对的第二端部，用于设置支撑部件。 支撑构件包括第一支撑件和第二支撑件，并且第一支撑件和第二支撑件各自包括突起和用于与突起接合的接合孔。 第一支撑件的突起与第二支撑件的接合孔接合以固定第一支撑件和第二支撑件，使得基板被第一支撑件和第二支撑件压缩和支撑。

公开(公告)号：US20100200761A1

公开(公告)日：2010-08-12

申请号：US12458199

申请日：2009-07-02

申请人： Juhyun Yu ,  Yoshinori Sunaga ,  Hidetaka Kawauchi ,  Tsuneaki Kawaguchi ,  Isao Takahashi ,  Shinichi Inoue ,  Naoyuki Yamada ,  Masahiko Kobayashi

发明人： Juhyun Yu ,  Yoshinori Sunaga ,  Hidetaka Kawauchi ,  Tsuneaki Kawaguchi ,  Isao Takahashi ,  Shinichi Inoue ,  Naoyuki Yamada ,  Masahiko Kobayashi

IPC分类号： G01T1/24

CPC分类号： G01T1/243

摘要： A radiation detector includes a semiconductor element capable of detecting a radiation, a substrate on which the semiconductor element is mounted, and a support member disposed adjacent to the semiconductor element for supporting the substrate. The substrate includes a first end portion on which the semiconductor element is mounted, and a second end portion opposite the first end portion for disposing the support member. The support member includes a first support and a second support, and the first support and the second support each includes a protrusion and an engagement hole for engaging with the protrusion. The protrusion of the first support engages with the engagement hole of the second support to fix the first support and the second support such that the substrate is compressed and supported by the first support and the second support.

摘要翻译： 辐射检测器包括能够检测辐射的半导体元件，其上安装有半导体元件的基板和邻近半导体元件设置的用于支撑基板的支撑部件。 基板包括安装半导体元件的第一端部和与第一端部相对的第二端部，用于设置支撑部件。 支撑构件包括第一支撑件和第二支撑件，并且第一支撑件和第二支撑件各自包括突起和用于与突起接合的接合孔。 第一支撑件的突起与第二支撑件的接合孔接合以固定第一支撑件和第二支撑件，使得基板被第一支撑件和第二支撑件压缩和支撑。

公开(公告)号：US20150019110A1

公开(公告)日：2015-01-15

申请号：US14383240

申请日：2013-03-05

申请人： Ryo Suzuki ,  Takeshi Miyaura ,  Yoshiyasu Ito ,  Toyomori Tsuiki ,  Naoyuki Yamada

发明人： Ryo Suzuki ,  Takeshi Miyaura ,  Yoshiyasu Ito ,  Toyomori Tsuiki ,  Naoyuki Yamada

IPC分类号： F02D41/36

CPC分类号： F02D41/36 ,  F02D41/2467 ,  F02D41/40 ,  F02D2200/0602 ,  Y02T10/44

摘要： An electronic control unit detects a manner of fluctuation of a fuel pressure with injection of fuel by a fuel injection valve with the use of a fuel pressure sensor, and calculates a tendency of deviation of an actual fuel injection characteristic of the fuel injection valve with respect to a basic fuel injection characteristic on the basis of a result of comparison between a detected temporal waveform and a basic temporal waveform. The tendency of deviation is reflected at a predetermined reflection rate (R) at the time of updating a learned value (Gij) for compensating for an individual difference of the fuel injection valve. The predetermined reflection rate (R) is increased when an accumulated value (D) of a vehicle travel distance is shorter than a predetermined value (Dth) as compared with when the accumulated value (D) is longer than or equal to the predetermined value (Dth).

摘要翻译： 电子控制单元通过使用燃料压力传感器由燃料喷射阀喷射燃料来检测燃料压力的波动的方式，并且计算燃料喷射阀的实际燃料喷射特性相对于 基于检测到的时间波形与基本时间波形之间的比较结果，获得基本的燃料喷射特性。 在更新用于补偿燃料喷射阀的个体差异的学习值（Gij）时，以预定的反射率（R）反映偏差的趋势。 与当累积值（D）大于或等于预定值（D）相比，当车辆行驶距离的累积值（D）小于预定值（Dth）时，预定反射率（R）增加 Dth）。

公开(公告)号：US08566005B2

公开(公告)日：2013-10-22

申请号：US12731431

申请日：2010-03-25

申请人： Naoyuki Yamada ,  Koji Ishizuka

发明人： Naoyuki Yamada ,  Koji Ishizuka

IPC分类号： F02D41/30 ,  F02M63/00

CPC分类号： F02D41/401 ,  F02D2200/0602 ,  F02D2250/04 ,  F02M47/027 ,  F02M63/0225 ,  Y02T10/44

摘要： An actual maximum fuel injection rate is computed based on a falling waveform and a rising waveform of the fuel pressure. The falling waveform represents the fuel pressure detected by a fuel sensor during a period in which the fuel pressure increases due to a fuel injection rate decrease. The rising waveform represents the fuel pressure detected by the fuel sensor during a period in which the fuel pressure decreases due to a fuel injection rate increase. The falling waveform and the rising waveform are modeled by modeling functions. A reference pressure is computed based on pressure during a specified time period before the falling waveform is generated. An intersection pressure is computed, at which the straight lines expressed by the modeling functions intersect to each other. The maximum fuel injection rate is computed based on a fuel pressure drop from the reference pressure to the intersection pressure.

摘要翻译： 基于下降波形和燃料压力的上升波形来计算实际的最大燃料喷射率。 下降波形表示在燃料压力由于燃料喷射速率降低而增加的时段期间由燃料传感器检测到的燃料压力。 上升波形表示燃料传感器在由于燃料喷射率增加而燃料压力降低的时段期间检测到的燃料压力。 下降波形和上升波形由建模功能建模。 基于在产生下降波形之前的指定时间段内的压力来计算参考压力。 计算交叉压力，在该交点压力下，由建模功能表达的直线彼此相交。 基于从参考压力到交叉口压力的燃料压降来计算最大燃料喷射速率。

公开(公告)号：US20100093055A1

公开(公告)日：2010-04-15

申请号：US12574947

申请日：2009-10-07

申请人： Naoyuki Fukuchi ,  Satoru Okamoto ,  Wataru Miyanaga ,  Sen Takeshita ,  Masaru Takayanagi ,  Yumiko Fukuda ,  Takao Ikenoue ,  Naoyuki Yamada ,  Naoko Arashida

发明人： Naoyuki Fukuchi ,  Satoru Okamoto ,  Wataru Miyanaga ,  Sen Takeshita ,  Masaru Takayanagi ,  Yumiko Fukuda ,  Takao Ikenoue ,  Naoyuki Yamada ,  Naoko Arashida

IPC分类号： C12N9/00 ,  G01N33/566 ,  C07D243/10 ,  C07D243/00

CPC分类号： C07D487/04 ,  A61K31/55 ,  A61K31/551 ,  C07D519/00 ,  C12Q1/485 ,  G01N33/5035 ,  G01N33/573 ,  G01N33/6845 ,  G01N33/6872 ,  G01N2333/4719 ,  G01N2333/91215 ,  G01N2500/04 ,  G01N2800/042

摘要： A method of screening a compound having a hypoglycemic effect (hereinafter referred to as “hypoglycemic compound”), a remedy for diabetes which contains a compound having a novel function mechanism, etc. More specifically speaking, a method of screening a hypoglycemic compound capable of binding to the β subunit of a trimeric GTP-binding protein, a remedy for diabetes comprising a hypoglycemic compound, which is characterized by being capable of binding to the β subunit of a trimeric GTP-binding protein, as the active ingredient, etc.

摘要翻译： 筛选具有降血糖作用的化合物的方法（以下称为“降血糖化合物”），含有具有新的功能机制的化合物的糖尿病治疗剂等。更具体地说，可以列举一种能够将降血糖化合物 绑定到＆bgr 三聚GTP结合蛋白的亚单位，包含降血糖化合物的糖尿病治疗剂，其特征在于能够结合到该组合物上。 三聚GTP结合蛋白的亚基作为活性成分等

公开(公告)号：US07372035B2

公开(公告)日：2008-05-13

申请号：US11206738

申请日：2005-08-19

申请人： Kazuma Yokoi ,  Hiroshi Kitaguchi ,  Takafumi Ishitsu ,  Naoyuki Yamada ,  Kensuke Amemiya ,  Yuuichirou Ueno ,  Katsutoshi Tsuchiya ,  Norihito Yanagita

发明人： Kazuma Yokoi ,  Hiroshi Kitaguchi ,  Takafumi Ishitsu ,  Naoyuki Yamada ,  Kensuke Amemiya ,  Yuuichirou Ueno ,  Katsutoshi Tsuchiya ,  Norihito Yanagita

IPC分类号： G01T1/24

CPC分类号： G01T1/241 ,  G01T1/249

摘要： In a radiological imaging apparatus, a radiation detecting section includes semiconductor detectors arranged in four columns and four rows. Each of the semiconductor detectors includes a semiconductor base material, and an anode electrode film (first electrode film) and a cathode electrode film (second electrode film) lying opposite each other so as to sandwich the semiconductor base material between them. A first conductive member is installed on each first electrode film. Second electrode films of four semiconductor detectors within a row are connected together using one second conductive member. A shaping amplifier connected to the first conductive members with a wire executes a waveform shaping process using a shaping time shorter than that of a shaping amplifier connected to the second conductive member with a wire; the first conductive members are provided for the four semiconductor detectors within a column.

摘要翻译： 在放射线成像装置中，放射线检测部包括以四列四列排列的半导体检测器。 每个半导体检测器包括半导体基底材料，以及彼此相对放置以将半导体基底材料夹在它们之间的阳极电极膜（第一电极膜）和阴极电极膜（第二电极膜）。 第一导电构件安装在每个第一电极膜上。 一行中的四个半导体检测器的第二电极膜使用一个第二导电构件连接在一起。 使用导线连接到第一导电部件的整形放大器使用比使用导线连接到第二导电部件的整形放大器的成形时间短的成形时间来执行波形整形处理; 为列中的四个半导体检测器提供第一导电构件。

公开(公告)号：US20050147720A1

公开(公告)日：2005-07-07

申请号：US11039791

申请日：2005-01-24

申请人： Naoyuki Yamada ,  Shinichi Ozawa ,  Naoko Kageyama ,  Hiroshi Miyano

发明人： Naoyuki Yamada ,  Shinichi Ozawa ,  Naoko Kageyama ,  Hiroshi Miyano

IPC分类号： G01N33/02 ,  G01N33/533 ,  G01N33/58 ,  G01N33/68

CPC分类号： G01N33/6827

摘要： A sample is analyzed for trace amounts of protein by dot blotting and subsequent fluorescence staining. According to this method, trace amounts of proteins such as an allergen in a food, a drink, a food additive, a medicament and feed etc. can be simply analyzed with high sensitivity. By providing the objective analysis method as described above, quantitative analysis and limit analysis of a protein contained in a sample can be performed.

摘要翻译： 通过斑点印迹和随后的荧光染色分析样品中痕量的蛋白质。 根据该方法，可以以高灵敏度简单地分析痕量的食品，饮料，食品添加剂，药物和饲料中的过敏原等蛋白质。 通过提供如上所述的客观分析方法，可以进行样品中包含的蛋白质的定量分析和极限分析。