Generating high resolution images from low resolution images for semiconductor applications

    公开(公告)号:US10769761B2

    公开(公告)日:2020-09-08

    申请号:US16019422

    申请日:2018-06-26

    IPC分类号: G06T5/00 G06T3/40

    摘要: Methods and systems for generating a high resolution image for a specimen from a low resolution image of the specimen are provided. One system includes one or more computer subsystems configured for acquiring a low resolution image of a specimen. The system also includes one or more components executed by the one or more computer subsystems. The one or more components include a deep convolutional neural network that includes one or more first layers configured for generating a representation of the low resolution image. The deep convolutional neural network also includes one or more second layers configured for generating a high resolution image of the specimen from the representation of the low resolution image. The second layer(s) include a final layer configured to output the high resolution image and configured as a sub-pixel convolutional layer.