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    Detection values determination system
    1.
    发明授权
    Detection values determination system 有权

    公开(公告)号：US11002865B2

    公开(公告)日：2021-05-11

    申请号：US15776085

    申请日：2016-11-20

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl ,  Roger Steadman Booker

    IPC: G01T1/29

    Abstract: The invention relates to a detection values determination system, especially for photon-counting CT scanners, comprising a detection pulse providing unit for providing detection pulses for an array of detection pixels 17, which is provided with an anti-charge-sharing grid 15 for suppressing charge sharing between different clusters 14 of the detection pixels, wherein the detection pulses are indicative of the energy of photons incident on the detection pixels. Charge-sharing-corrected detection values are determined based on the provided detection pulses, wherein for determining a charge-sharing-corrected detection value for a detection pixel of a cluster only detection pixels of the same cluster are considered. This allows for a relatively high detective quantum efficiency, wherein the technical efforts for providing the charge sharing correction can be relatively low.

    Photon-counting computed tomography
    2.
    发明授权
    Photon-counting computed tomography 有权

    公开(公告)号：US10980506B2

    公开(公告)日：2021-04-20

    申请号：US16305529

    申请日：2017-06-29

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl ,  Roger Steadman ,  Christoph Herrmann ,  Roland Proksa

    IPC: A61B6/00 ,  G01N23/046 ,  G01N23/083 ,  G06T11/00

    Abstract: An image signal processing system (ISP) comprising an input interface (IN) for receiving photon counting projection data acquired by an X-ray imaging apparatus (IA) having a photon counting detector (D). A calibration data memory (CMEM) of the system holds calibration data. The calibration data encodes photon counting data versus path lengths curves for different energy thresholds of i) said detector (D) or ii) of a different detector. At least one of said curves is not one-to-one. A path length convertor (PLC) of the system converts an entry in said photon counting projection data into an associated path length based on said calibration data.

    Polarization correction for direct conversion x-ray detectors
    3.
    发明授权
    Polarization correction for direct conversion x-ray detectors 有权

    公开(公告)号：US10725188B2

    公开(公告)日：2020-07-28

    申请号：US15762160

    申请日：2016-10-11

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Roger Steadman Booker ,  Ewald Roessl ,  Heiner Daerr

    IPC: G01T7/00 ,  G01T1/24 ,  A61B6/00

    Abstract: Photon-counting x-ray detectors (3) suffer from a degradation of their performance due to polarization. In order to correct the effects of polarization to the generated x-ray images, the invention suggests (i) exposing the radiation detector (3) to a first radiation pulse emitted by a further radiation source (11) and obtaining a first electric pulse signal generated by the radiation detector (3) in response thereto, (ii) later exposing the 5 radiation detector (3) to a second radiation pulse emitted by the further radiation source (11) during the acquisition of the image and obtaining a second electric pulse signal generated by the radiation detector (3) in response thereto, and (iii) comparing amplitudes of the first and second electric pulse signals and generating the x-ray image based on a result of the comparison. The invention provides a corresponding x-ray device and a corresponding method.

    Imaging apparatus and method
    7.
    发明授权
    Imaging apparatus and method 有权

    公开(公告)号：US09782138B2

    公开(公告)日：2017-10-10

    申请号：US15036521

    申请日：2015-09-22

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Thomas Koehler ,  Roland Proksa ,  Bernhard Johannes Brendel ,  Ewald Roessl

    IPC: A61B6/00 ,  A61B6/03 ,  G21K1/02

    CPC classification number: A61B6/4291 ,  A61B6/032 ,  A61B6/4241 ,  A61B6/54 ,  A61B6/542 ,  G21K1/025

    Abstract: An imaging apparatus comprising a radiation source (2) for emitting radiation from a focal region (20) through an imaging area (5), a detection unit (6) for detecting radiation from said imaging area (5), said detection unit comprising an anti-scatter grid (62) and a detector (61), a gantry (1) to which said radiation source (2) and said detection unit (6) are mounted and a controller (9) for controlling said detection unit (6) to detect radiation at a plurality of projection positions and for manipulating the position, setting and/or orientation of at least a part of said radiation source (2) and/or said detection unit (6) at first projection positions (80) so that the radiation incident on the detector (61) at said first projection positions is attenuated by said anti-scatter grid (62) to a larger extent compared to second projection positions (80) representing the remaining projection positions.

    ALIGNING SOURCE-GRATING-TO-PHASE-GRATING DISTANCE FOR MULTIPLE ORDER PHASE TUNING IN DIFFERENTIAL PHASE CONTRAST IMAGING
    9.
    发明申请
    ALIGNING SOURCE-GRATING-TO-PHASE-GRATING DISTANCE FOR MULTIPLE ORDER PHASE TUNING IN DIFFERENTIAL PHASE CONTRAST IMAGING 有权
    在不同阶段对比成像中对多个阶段相位调整进行归一化光栅相位刻痕距离

    公开(公告)号：US20150216499A1

    公开(公告)日：2015-08-06

    申请号：US14421008

    申请日：2013-08-20

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Gerhard Martens ,  Heiner Daerr ,  Thomas Detlef Istel ,  Ewald Roessl ,  Udo Van Stevendaal

    IPC: A61B6/00

    CPC classification number: A61B6/587 ,  A61B6/484 ,  A61B6/582 ,  A61B6/588 ,  A61B6/589 ,  G01N23/20025 ,  G01N23/20075 ,  G01N2223/643

    Abstract: The present invention relates handling misalignment in an X-ray imaging system for differential phase contrast imaging. In order to provide a reduction for the pretuning and adjustment requirements for manufacture and maintenance in a differential phase contrast imaging system, an X-ray imaging system (10) for differential phase contrast imaging, is provided that comprises a differential phase contrast setup (12) with an X-ray source (14) and an X-ray detector (16), a grating arrangement (18) comprising a source grating (20), a phase grating (22) and an analyser grating (24), wherein the source grating is arranged between the X-ray source and the phase grating, and the analyser grating is arranged between the phase grating and the detector. Further, a moving arrangement for a relative movement between an object under examination and at least one of the gratings is provided, as well as a processing unit (32), and a translation arrangement (34) for translating the source grating. The phase grating, the analyser grating and the detector are provided as a rigid interferometer unit (36), in which the phase grating and the analyser grating are mounted in parallel to each other. The source grating is misaligned in respect to the interferometer unit such that moiré fringes are detectable in the plane of the detector. The processing unit is configured to detect moiré patterns in signals provided by the detector upon X-ray radiation. The processing unit is further configured to compute a translation signal (38) for translating the source grating for achieving a predetermined moiré pattern. The translation arrangement is configured to adjust the positioning of the source grating at least in the X-ray projection direction (30), based on the value of the translation signal.

    Abstract translation: 本发明涉及用于微分相位成像的X射线成像系统中的处理未对准。 为了降低差分相位成像系统中的制造和维护的预调节和调整要求，提供了用于差分相位成像的X射线成像系统（10），其包括差分相位对比度设置（12 ）与X射线源（14）和X射线检测器（16），包括源光栅（20），相位光栅（22）和分析器光栅（24）的光栅装置（18） 源光栅布置在X射线源和相位光栅之间，分析器光栅布置在相位光栅和检测器之间。 此外，提供了用于在检查对象和至少一个光栅之间的相对运动的移动装置，以及处理单元（32）和用于平移源光栅的平移装置（34）。 相位光栅，分析器光栅和检测器被提供为刚性干涉仪单元（36），其中相位光栅和分析器光栅彼此平行地安装。 源光栅相对于干涉仪单元不对准，使得在检测器的平面中可以检测到莫尔条纹。 处理单元被配置为在X射线辐射时检测由检测器提供的信号中的莫尔图案。 处理单元还被配置为计算用于平移源光栅以实现预定莫尔图案的平移信号（38）。 平移装置被配置为至少基于转换信号的值来调整源光栅的至少在X射线投射方向（30）上的定位。

    X-RAY BEAM SHAPER
    10.
    发明申请
    X-RAY BEAM SHAPER 有权
    X射线光束形状

    公开(公告)号：US20150092917A1

    公开(公告)日：2015-04-02

    申请号：US14381234

    申请日：2013-02-06

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl

    IPC: G21K1/02 ,  A61B6/06 ,  G01N23/04

    CPC classification number: G21K1/02 ,  A61B6/032 ,  A61B6/06 ,  A61B6/4021 ,  A61B6/4035 ,  G01N23/04

    Abstract: An imaging system (500) includes a focal spot (508) that rotates along a path around an examination region and emits a radiation beam that traverses a field of view of the examination region and a subject or object therein. The system further includes a detector array (520) that is located opposite the radiation source, across the examination region. The detector array detects radiation traversing the field of view and outputs a signal indicative of the detected radiation. The system further includes a beam shaper that is located between the radiation source and the examination region. The beam shaper rotates with the focal spot and, relative to the focal spot, in an opposite direction of the focal spot with a same angular frequency as the rotating of the focal spot and attenuates the radiation beam which reduces a flux density across the detector array at each rotational angle of the focal spot.

    Abstract translation: 成像系统（500）包括焦点（508），其沿着检查区域周围的路径旋转并且发射穿过检查区域的视野的辐射束以及其中的被摄体或物体。 该系统还包括跨越检查区域与辐射源相对定位的检测器阵列（520）。 检测器阵列检测穿过视野的辐射，并输出指示检测到的辐射的信号。 该系统还包括位于辐射源和检查区域之间的光束整形器。 光束整形器与焦点一起旋转并且相对于焦斑以与焦点的旋转相同的角频率与焦点的相反方向旋转，并且衰减辐射束，从而降低了检测器阵列上的通量密度 在焦斑的每个旋转角度。

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