摘要:
An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.
摘要:
An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.
摘要:
An intra-ocular lens comprising a lens part and a fixing part for fixing the lens part in an eye, the lens part comprising a colorless and transparent polyimide containing at least one of repeating units represented by formulae (I) to (IV): ##STR1## wherein X.sub.1 represents ##STR2## X.sub.2 represents ##STR3## X.sub.3 represents ##STR4## Further, the lens part and the fixing part may be integrally molded together, if desired.
摘要:
Disclosed herein is an image processing apparatus including an interlace/progressive conversion section configured to carry out interpolation processing on image data of the current field by making use of the image data of the current field and image data of a field leading ahead of the current field by one field period in order to obtain image data of a progressive system with no delay time.
摘要:
A image processing apparatus includes an interlace/progressive converter that converts interlaced input image data into progressive image data; an up-convert material detector that detects low quality up-convert material likelihood of the interlaced input image data; and an image processor that obtains output image data by processing progressive image data on the basis of the detected signal of the up-convert material detector, wherein the up-convert material detector detects the low quality up-convert material likelihood on the basis of ratio of the sum of an inter-field pixel value difference and the sum of in-field pixel value difference, the pixels in a predetermined area being obtained as sequential notable pixels using image data of a first field and a second field that are continuous in each field.
摘要:
A probe structure for measuring electric characteristics of a semiconductor element containing a first electrically conductive circuit board having a structure wherein the contact portions, which are contacted with the terminals of a material to be tested, are disposed in a first insulator in the direction of the thickness thereof so as to penetrate the insulator and are connected to a first electrically conductive wiring formed between the first insulator and a second insulator. The probe structure also contains a second electrically conductive circuit board having a coefficient of thermal expansion which is the same as or similar to that of the material to be tested and having a structure wherein the first electrically conductive wiring is connected to a second electrically conductive wiring which, in turn, is connected to an electric tester for testing the electric characteristics of the material to be tested. The first electrically conductive circuit board is electrically connected to the second electrically conductive circuit board, and an elastic body is disposed between the first electrically conductive circuit board and the second electrically conductive circuit board.