摘要:
A refrigeration apparatus (1) is provided with a refrigerant circuit (1E) along which are connected a compressor (2), an outdoor heat exchanger (4), an expansion mechanism, an indoor heat exchanger (41) for providing room air conditioning, and a cooling heat exchanger (45, 51) for providing storage compartment cooling. The refrigerant circuit (1E) includes a discharge side three way switch valve (101) for varying the flow rate of a portion of the refrigerant which is discharged out of the compressor (2) and then distributed to the indoor heat exchanger (41) and the outdoor heat exchanger (4) during a heat recovery operation mode in which the indoor heat exchanger (41) and the outdoor heat exchanger (4) operate as condensers. As a result of such arrangement, even when the amount of heat obtained in the cooling heat exchanger (45, 51) exceeds the amount of heat required in the indoor heat exchanger (41), surplus heat is discharged without excessive decrease in the discharge pressure of the compressor (2).
摘要:
A method of milling cerium compound by means of a ball mill using a milling medium, characterized in that ratio Hb/r of radius r of a cylindrical ball mill container and depth Hb of the milling medium in the ball mill container disposed horizontally ranges from 1.2 to 1.9, and the ball mill container is rotated at a rotational speed which is 50% or less of critical rotational speed Nc=299/r1/2 of the ball mill container converted from the radius r expressed in centimeter. The milling method can be carried out in a wet or dry process, and the cerium compound is preferably cerium oxide. The method can be also applied for producing a cerium compound slurry.
摘要翻译:一种通过使用研磨介质的球磨机研磨铈化合物的方法,其特征在于,圆柱形球磨机容器的半径r与深度H b b的比值H b / 水平设置的球磨机容器中的研磨介质的SUB> 1.2〜1.9,球磨容器以临界旋转速度N C = 50%以下的转速旋转, 从以半径r表示的半径r转换的球磨机容器的299 / r 1/2倍。 研磨方法可以在湿法或干法中进行,铈化合物优选为氧化铈。 该方法也可用于制备铈化合物浆料。
摘要:
A charged particle beam apparatus obtains an image by detecting a generation signal inclusively indicative of secondary electrons generated from a specimen. The apparatus has an input unit for inputting current and voltage values to be applied to a charged particle optical system through which the charged particle beam travels, a memory unit for storing shape, position and physical properties of the charged particle optical system and accuracy of the applied current or voltage, an electromagnetic field calculation unit for calculating an electromagnetic field near a path of the charged particle beam, a charged particle trajectory calculation unit for calculating a trajectory of the charged particle beam in the calculated electromagnetic field, a memory unit for storing a result of the trajectory calculation and a controller for controlling the charged particle optical system on the basis of the result of the trajectory calculation.
摘要:
When performing an inspection using a charge control function in a SEM wafer inspection apparatus, acceleration voltage, control voltage and deceleration voltage are changed in conjunction so that incident energy determined by “acceleration voltage−deceleration voltage” and bias voltage determined by “deceleration voltage−control voltage” do not change. By this means, charge of a wafer can be controlled, while restraining electrostatic lens effect generated near a control electrode. As a result, an inspection using a charge control function at low incident energy and in a wide viewing field can be performed, and a highly sensitive inspection of semiconductor patterns subject to damages due to electron beam irradiation can be realized. Acceleration voltage, control voltage and deceleration voltage are changed in conjunction so that incident energy determined by “acceleration voltage−deceleration voltage” and bias voltage determined by “deceleration voltage−control voltage” do not change.
摘要:
In a refrigerating apparatus in which a plurality of application-side heat exchangers (41, 45, 51) are connected to a heat-source side heat exchanger (4), liquid lines for a plurality of channels in a refrigerant circuit (1E) share a liquid side communication pipe (11) in order to reduce the number of pipes. Further, the liquid side communication pipe (11) is provided adjacent to a low-pressure gas side communication pipe (15) for at least one channel so as to contact it in order to supercool a liquid refrigerant by a low-pressure gas refrigerant. Thus, workability for connecting the pipes is improved and a refrigerating ability may not be decreased even if communication pipes (11, 15, 17) become long.
摘要:
A circuit pattern inspecting instrument includes an electron-optical system for irradiating an electron beam on a sample, an electron beam deflector, a detector for detecting secondary charged particles from the sample, and a mode setting unit for switching between a first mode and a second mode. An electron beam current is larger in the first mode than in the second mode, and an electron beam scanning speed is higher in the first mode than in the second mode. The circuit pattern inspecting instrument is configured so that first the sample is observed in the first mode, then a particular position on the sample is selected based on image data produced by an output of the detector in the first mode, and then the particular position on the sample is observed in the second mode.
摘要:
An auxiliary scanning control system for facsimile is provided with a white line skip function to speed communication. A mechanism is provided whereby the data corresponding to the first line of information following the line skipping operation is added to that of the next line and stored in a memory unit, so that the information of the first line is not neglected in subsequent printing.
摘要:
A method for extracting a dihydroperoxide of a dialkylbenzene of the formula, ##STR1## wherein each R.sub.1, R.sub.2, R.sub.3 and R.sub.4 is independently a lower alkyl group, from an aqueous alkali solution of the said dihydroperoxide with at least one organic solvent selected from the group consisting of C.sub.4 -C.sub.10 ketones, C.sub.4 -C.sub.10 ethers and C.sub.4 -C.sub.8 alcohols, which comprises extracting the dihydroperoxide by a countercurrent multi-stage extraction at a temperature between 0.degree. and 85.degree. C with a temperature gradient, the aqueous alkali solution being fed to the lower temperature zone, the organic solvent being fed to the higher temperature zone, and each aqueous alkali solution and organic solvent being fed countercurrently, whereby the dihydroperoxide is obtained in the form of organic solvent solution from the lower temperature zone.
摘要:
A circuit for synchronizing a motor at the receiving end of a communication link with one at the transmitting end thereof, the circuit preventing an indication of synchronization until the receiving end motor reaches its rated speed.
摘要:
A semiconductor wafer inspection tool and a semiconductor wafer inspection method capable of conducting an inspection under appropriate conditions in any one of an NVC (Negative Voltage Contrast) mode and a PVC (Positive Voltage Contrast) mode is provided. Primary electrons 2 are irradiated onto a wafer to be inspected 6 and the irradiation position thereof is scanned in an XY direction. Secondary electrons (or reflected electrons) 10 from the wafer to be inspected 6 are controlled by a charge control electrode 5 and detected by a sensor 11. An image processor converts a detection signal from the sensor 11 to a detected image, compares the detected image with a predetermined reference image, judges defects, an overall control section 14 selects inspection conditions from recipe information for each wafer to be inspected 6 and sets a voltage to be applied to the charge control electrode 5. A Z stage 8 sets the distance between the wafer to be inspected 6 and the charge control electrode 5 according to this voltage.