Method for Fabricating Non-Volatile Memory Device with Charge Trapping Layer
    7.
    发明申请
    Method for Fabricating Non-Volatile Memory Device with Charge Trapping Layer 有权
    用电荷捕获层制造非易失性存储器件的方法

    公开(公告)号:US20090163014A1

    公开(公告)日:2009-06-25

    申请号:US12139623

    申请日:2008-06-16

    IPC分类号: H01L21/28

    摘要: A method for fabricating a non-volatile memory device with a charge trapping layer wherein a tunneling layer, a charge trapping layer, a blocking layer, and a control gate electrode are formed on a semiconductor substrate. A temperature of the control gate electrode is increased by applying a magnetic field to the control gate electrode. The blocking layer is densified by allowing the increased temperature to be transferred to the blocking layer contacting the control gate electrode.

    摘要翻译: 一种用于制造具有电荷捕获层的非易失性存储器件的方法,其中在半导体衬底上形成有隧道层,电荷俘获层,阻挡层和控制栅电极。 通过向控制栅电极施加磁场来增加控制栅电极的温度。 通过允许将升高的温度转移到与控制栅电极接触的阻挡层而使阻挡层致密化。

    Semiconductor device and method of manufacturing the same
    9.
    发明授权
    Semiconductor device and method of manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US09099348B2

    公开(公告)日:2015-08-04

    申请号:US13602038

    申请日:2012-08-31

    IPC分类号: H01L29/76 H01L27/115

    CPC分类号: H01L27/11582 H01L27/11573

    摘要: A semiconductor device includes: vertical channel layers; a pipe channel layer configured to connect lower ends of the vertical channel layers; and a pipe gate surrounding the pipe channel layer and including a first region, which is in contact with the pipe channel layer and includes a first-type impurity, and remaining second regions including a second-type impurity different from the first type impurity.

    摘要翻译: 半导体器件包括:垂直沟道层; 管道沟道层,被配置为连接垂直沟道层的下端; 以及围绕所述管道沟道层的管道浇口,并且包括与所述管道沟道层接触并且包括第一类型杂质的第一区域,以及包括与所述第一类型杂质不同的第二类型杂质的剩余的第二区域。

    3D non-volatile memory device and method of manufacturing the same
    10.
    发明授权
    3D non-volatile memory device and method of manufacturing the same 有权
    3D非易失性存储器件及其制造方法

    公开(公告)号:US08878277B2

    公开(公告)日:2014-11-04

    申请号:US13598528

    申请日:2012-08-29

    IPC分类号: H01L29/76

    摘要: A 3D non-volatile memory device includes a pipe gate, at least one first channel layer including a first pipe channel layer formed in the pipe gate and a pair of first source side channel layer and first drain side channel layer connected to the first pipe channel layer, and at least one second channel layer including a second pipe channel layer formed in the pipe gate and positioned over the first pipe channel layer and a pair of second source side channel layer and second drain side channel layer connected to the second pipe channel layer.

    摘要翻译: 3D非易失性存储器件包括管道浇口,至少一个第一沟道层,其包括形成在管道栅极中的第一管道沟道层,以及一对第一源极侧沟道层和与第一管道沟道连接的第一漏极侧沟道层 层,以及至少一个第二沟道层,其包括形成在管道浇口中并位于第一管道沟道层上的第二管道沟道层和连接到第二管道沟道层的一对第二源极侧沟道层和第二漏极侧沟道层 。