Plasmon resonance detector
    1.
    发明申请
    Plasmon resonance detector 有权
    等离子体共振检测器

    公开(公告)号:US20100067016A1

    公开(公告)日:2010-03-18

    申请号:US12318109

    申请日:2008-12-22

    IPC分类号: G01N21/55 G01K7/02

    摘要: Provided is a plasmon resonance detector that can detect temperature change in optical devices, in which the metal structure having plasmon resonance absorption is used for the optical devices. A diode formed of a conductive substrate, an n-type semiconductor layer, an i-type semiconductor layer, a p-type semiconductor layer, an n electrode (negative electrode), a p electrode (positive electrode), an insulating film, or the like is used as a semiconductor device whose resistance value changes in accordance with temperature change. A nanochain formed by connecting a plurality of metal nanoparticles is disposed on this diode. When the nanochain is irradiated with light, the nanochain generates heat. The heat generated in the nanochain is conducted to the diode. The resistance value of the diode changes in accordance with temperature change, and thus this change is read, a temperature or an amount of heat generation of the nanochain is measured, and existence and strength of the plasmon resonance are detected.

    摘要翻译: 提供了一种等离子体共振检测器,其可以检测具有等离子体共振吸收的金属结构用于光学器件的光学器件中的温度变化。 由导电性基板,n型半导体层,i型半导体层,p型半导体层,n电极(负极),ap电极(正极),绝缘膜或 类似物被用作其电阻值根据温度变化而变化的半导体器件。 通过连接多个金属纳米颗粒形成的纳米链设置在该二极管上。 当纳米链被光照射时,纳米链产生热量。 在纳米链中产生的热量传导到二极管。 二极管的电阻值根据温度变化而变化,因此读取该变化,测定纳米级的发热温度或发热量,检测等离子体共振的存在和强度。