PLATEN EXHAUST FOR CHEMICAL MECHANICAL POLISHING SYSTEM
    2.
    发明申请
    PLATEN EXHAUST FOR CHEMICAL MECHANICAL POLISHING SYSTEM 有权
    化学机械抛光系统的排气

    公开(公告)号:US20090264049A1

    公开(公告)日:2009-10-22

    申请号:US12105924

    申请日:2008-04-18

    CPC分类号: B24B37/04 B08B15/04 B24B55/12

    摘要: The present invention generally relates to a substrate transferring system. Particularly, the present invention relates to apparatus and method to effectively remove the chemical fume, vapor and other byproducts generated during a polishing process. One embodiment of the present invention provides an apparatus for polishing a substrate comprising a platen having a polishing surface configured to polish the substrate by contacting the substrate while moving relatively to the substrate, a polishing head configured to support the substrate and position the substrate to be in contact with the polishing surface during polishing, a solution nozzle configured to dispense a polishing solution on the polishing surface, and an exhaust assembly configured to remove fume, vapor and other byproducts generated during polishing.

    摘要翻译: 本发明一般涉及基片转印系统。 特别地,本发明涉及有效地除去在抛光过程中产生的化学烟雾,蒸气和其它副产物的装置和方法。 本发明的一个实施例提供了一种用于抛光衬底的装置,包括具有抛光表面的压板,所述抛光表面被配置为通过在相对于衬底移动的同时使衬底接触而抛光衬底;抛光头,其被配置为支撑衬底并将衬底定位为 在抛光期间与抛光表面接触,配置成在研磨表面上分配抛光溶液的溶液喷嘴以及被配置为去除在抛光期间产生的烟雾,蒸气和其它副产物的排气组件。

    NON-CONTACT WET WAFER HOLDER
    3.
    发明申请
    NON-CONTACT WET WAFER HOLDER 审中-公开
    非接触式湿纸架

    公开(公告)号:US20080268753A1

    公开(公告)日:2008-10-30

    申请号:US11739450

    申请日:2007-04-24

    IPC分类号: B24B1/00

    CPC分类号: B24B37/30 H01L21/6838

    摘要: The present invention relates to a load cup configured to speed up substrate transferring to and from a carrier head and to reduce corrosion during the transferring. One embodiment of the present invention provides a non-contact substrate holder comprising a pedestal having a top surface configured to support a substrate, and at least one injection port configured to eject a high velocity liquid stream on the top surface of the pedestal, wherein the liquid stream in configured to secure the substrate on the pedestal without the substrate contacting the top surface of the pedestal.

    摘要翻译: 本发明涉及一种负载杯,其被配置为加速基板向载体头转移和从载体头转移并减少转印期间的腐蚀。 本发明的一个实施例提供了一种非接触衬底保持器,其包括具有构造成支撑衬底的顶表面的基座和被配置为在基座的顶表面上喷射高速液体流的至少一个注入端口,其中, 液体流被配置成将基板固定在基座上,而基板不接触基座的顶面。

    PAD CONDITIONER AUTO DISK CHANGE
    4.
    发明申请
    PAD CONDITIONER AUTO DISK CHANGE 审中-公开
    PAD控制器自动盘更改

    公开(公告)号:US20100099342A1

    公开(公告)日:2010-04-22

    申请号:US12255442

    申请日:2008-10-21

    IPC分类号: B24D9/08

    CPC分类号: B24B53/017

    摘要: A method and apparatus for replacing a polishing pad conditioning disk is a chemical mechanical polishing system is provided. The apparatus comprises a disk load/unload station for unloading used conditioning disks from a pad conditioning assembly and loading unused conditioning disks onto the pad conditioning assembly, on or more disk storage stations for storing both used and unused conditioning disks, and a central robot having a range of motion sufficient for transferring both used an unused conditioning disks between the disk load/unload station and the one or more disk storage stations. Embodiments described herein reduce the length of system interruption by eliminating the need to safety lock out the system for the replacement of polishing pad conditioning disks.

    摘要翻译: 一种用于更换抛光垫调节盘的方法和装置是提供化学机械抛光系统。 该装置包括用于从衬垫调节组件卸载使用的调节盘并将未使用的调节盘装载到衬垫调节组件上的多个盘装载/卸载站,用于存储使用和未使用的调节盘的两个或多个盘存储站,以及一个中央机器人, 足够的运动范围,用于在盘装载/卸载站和一个或多个盘存储站之间使用未使用的调节盘。 本文所描述的实施例通过消除安全锁定系统来更换抛光垫调节盘来减少系统中断的长度。

    APPARATUS AND METHODS FOR CONDITIONING A POLISHING PAD
    6.
    发明申请
    APPARATUS AND METHODS FOR CONDITIONING A POLISHING PAD 审中-公开
    用于调节抛光垫的装置和方法

    公开(公告)号:US20090036035A1

    公开(公告)日:2009-02-05

    申请号:US12245758

    申请日:2008-10-05

    IPC分类号: B24B1/00 B24B7/00

    摘要: Apparatus and methods for conditioning a polishing pad include a base, an arm pivotally coupled to the base and adapted to support a conditioning disk, and an actuator coupled to the base and the arm. The actuator is adapted to cause the arm to press the conditioning disk against the polishing pad with a linearly variable amount of force. A first force is produced with the actuator. The first force is scaled by a linearly variable amount to a second force that is applied to the polishing pad by a conditioning disk. Numerous other aspects are disclosed.

    摘要翻译: 用于调理抛光垫的装置和方法包括基座,枢转地联接到基座并适于支撑调节盘的臂以及联接到基座和臂的致动器。 致动器适于使臂以线性可变量的力将调节盘压靠抛光垫。 用致动器产生第一力。 第一力通过线性可变量被缩放到通过调节盘施加到抛光垫的第二力。 公开了许多其他方面。

    APPARATUS AND METHODS FOR CONDITIONING A POLISHING PAD
    7.
    发明申请
    APPARATUS AND METHODS FOR CONDITIONING A POLISHING PAD 审中-公开
    用于调节抛光垫的装置和方法

    公开(公告)号:US20070212983A1

    公开(公告)日:2007-09-13

    申请号:US11684969

    申请日:2007-03-12

    IPC分类号: B24B51/00 B24B1/00 B24B21/18

    摘要: Apparatus and methods for conditioning a polishing pad include a base, an arm pivotally coupled to the base and adapted to support a conditioning disk, and an actuator coupled to the base and the arm. The actuator is adapted to cause the arm to press the conditioning disk against the polishing pad with a linearly variable amount of force. A first force is produced with the actuator. The first force is scaled by a linearly variable amount to a second force that is applied to the polishing pad by a conditioning disk. Numerous other aspects are disclosed.

    摘要翻译: 用于调理抛光垫的装置和方法包括基座,枢转地联接到基座并适于支撑调节盘的臂以及联接到基座和臂的致动器。 致动器适于使臂以线性可变量的力将调节盘压靠抛光垫。 用致动器产生第一力。 第一力通过线性可变量被缩放到通过调节盘施加到抛光垫的第二力。 公开了许多其他方面。

    Systems and methods for substrate polishing end point detection using improved friction measurement
    9.
    发明授权
    Systems and methods for substrate polishing end point detection using improved friction measurement 有权
    使用改进摩擦测量的基板抛光终点检测的系统和方法

    公开(公告)号:US09061394B2

    公开(公告)日:2015-06-23

    申请号:US13459079

    申请日:2012-04-28

    IPC分类号: B24B1/00 B24B37/013 B24B49/16

    CPC分类号: B24B37/013 B24B49/16

    摘要: Methods, apparatus, and systems for polishing a substrate are provided. The invention includes an upper platen; a torque/strain measurement instrument coupled to the upper platen; and a lower platen coupled to the torque/strain measurement instrument and adapted to drive the upper platen to rotate through the torque/strain measurement instrument. In other embodiments, the invention includes an upper carriage; a side force measurement instrument coupled to the upper carriage; and a lower carriage coupled to the side force measurement instrument and adapted to support a polishing head. Numerous additional aspects are disclosed.

    摘要翻译: 提供了用于抛光衬底的方法,装置和系统。 本发明包括上压板; 耦合到上压板的扭矩/应变测量仪器; 以及耦合到扭矩/应变测量仪器并适于驱动上压板旋转通过扭矩/应变测量仪器的下压板。 在其他实施例中,本发明包括一个上部托架; 耦合到上部托架的侧向力测量仪器; 以及耦合到所述侧向力测量仪器并适于支撑抛光头的下托架。 公开了许多附加方面。

    Roller assembly for a brush cleaning device in a cleaning module
    10.
    发明授权
    Roller assembly for a brush cleaning device in a cleaning module 有权
    用于清洁模块中的刷清洁装置的辊组件

    公开(公告)号:US08250695B2

    公开(公告)日:2012-08-28

    申请号:US12573500

    申请日:2009-10-05

    IPC分类号: A47L25/00

    CPC分类号: B08B1/04

    摘要: Embodiments described herein relate to an apparatus and method for a roller assembly that may be utilized in a brush cleaning module. In one embodiment, a roller assembly is described. The roller assembly includes an annular groove having at least two substantially parallel opposing sidewalls adapted to contact the major surfaces of a substrate along a periphery of the substrate, each of the opposing sidewalls comprising a compressible material having a pre-compressed dimension that is less than a thickness of the periphery of the substrate.

    摘要翻译: 本文所述的实施例涉及可用于刷清洁模块中的用于辊组件的装置和方法。 在一个实施例中,描述了辊组件。 辊组件包括具有至少两个基本上平行的相对侧壁的环形凹槽,所述至少两个基本上平行的相对侧壁适于沿着衬底的周边接触衬底的主表面,每个相对的侧壁包括具有预压缩尺寸小于 衬底的周边的厚度。