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1.发明申请Microelectronic Circuit Structure With Layered Low Dielectric Constant Regions And Method Of Forming Same 失效具有层状低介电常数区域的微电子电路结构及其形成方法公开(公告)号：US20080185728A1
公开(公告)日：2008-08-07
申请号：US11670524
申请日：2007-02-02
IPC分类号： H01L23/48 , H01L21/4763
CPC分类号： H01L21/7682 , H01L21/76808 , H01L21/76835 , H01L23/5222 , H01L23/5329 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： A method for manufacturing a microelectronic circuit includes the steps of providing a first wiring level comprising first wiring level conductors separated by a first wiring level dielectric material; forming a plurality of alternating layers of layer dielectric material and sacrificial material over the first wiring level; and forming a plurality of interconnect openings and a plurality of gap openings in the alternating layers of layer dielectric material and sacrificial material. The interconnect openings are formed over the first wiring level conductors. The method further includes forming (i) metallic conductors comprising second wiring level conductors, and (ii) interconnects, at the interconnect openings; and removing the layers of the sacrificial material through the gap openings.
摘要翻译： 一种制造微电子电路的方法包括以下步骤：提供包括由第一布线层介电材料隔开的第一布线层导体的第一布线层; 在所述第一布线层上形成层状介电材料和牺牲材料的多个交替层; 以及在层介电材料和牺牲材料的交替层中形成多个互连开口和多个间隙开口。 互连开口形成在第一布线层导体上。 该方法还包括形成（i）包括第二布线层导体的金属导体，和（ii）互连开口处的互连; 并且通过间隙开口去除牺牲材料的层。
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