NEAR-INFRARED ABSORBING FILM COMPOSITION FOR LITHOGRAPHIC APPLICATION
    4.
    发明申请
    NEAR-INFRARED ABSORBING FILM COMPOSITION FOR LITHOGRAPHIC APPLICATION 审中-公开
    近红外吸收膜组合物用于光刻应用

    公开(公告)号:US20130157463A1

    公开(公告)日:2013-06-20

    申请号:US13325797

    申请日:2011-12-14

    IPC分类号: H01L21/302 G03F7/207 G02B5/22

    摘要: The present invention relates to a near-infrared (NIR) film composition for use in vertical alignment and correction in the patterning of integrated semiconductor wafers and a pattern forming method using the composition. The NIR absorbing film composition includes a NIR absorbing dye having a polymethine cation and a crosslinkable anion, a crosslinkable polymer and a crosslinking agent. The patterning forming method includes aligning and focusing a focal plane position of a photoresist layer by sensing near-infrared emissions reflected from a substrate containing the photoresist layer and a NIR absorbing layer formed from the NIR absorbing film composition under the photoresist layer. The NIR absorbing film composition and the pattern forming method are especially useful for forming material patterns on a semiconductor substrate having complex buried topography.

    摘要翻译: 本发明涉及用于集成半导体晶片的图案化的垂直取向和校正的近红外(NIR)膜组合物和使用该组合物的图案形成方法。 近红外吸收膜组合物包括具有聚甲炔阳离子和可交联阴离子的NIR吸收染料,可交联聚合物和交联剂。 图案形成方法包括通过感测从包含光致抗蚀剂层的基板反射的近红外发射和由光致抗蚀剂层下的NIR吸收膜组合物形成的NIR吸收层来对准和聚焦光致抗蚀剂层的焦平面位置。 近红外吸收膜组合物和图案形成方法对于在具有复杂掩埋形貌的半导体衬底上形成材料图案特别有用。

    Resist lower layer film-formed substrate
    7.
    发明授权
    Resist lower layer film-formed substrate 有权
    抗下层成膜基材

    公开(公告)号:US08288072B2

    公开(公告)日:2012-10-16

    申请号:US12071806

    申请日:2008-02-26

    IPC分类号: G03F7/004

    CPC分类号: G03F7/091 G03F7/0046

    摘要: A resist lower layer film composition, wherein an etching speed is fast, thus an etching time period can be shortened to minimize a film thickness loss of a resist pattern and a deformation of the pattern during etching, therefore, a pattern can be transferred with high accuracy and an excellent pattern can be formed on a substrate is provided.The resist lower layer film composition comprising at least a polymer having a repeating unit represented by the following general formula (1).

    摘要翻译: 一种抗蚀剂下层膜组合物,其中蚀刻速度快,因此可以缩短蚀刻时间周期,以最小化抗蚀剂图案的膜厚度损失和蚀刻期间图案的变形,因此,图案可以高转印 可以在基板上形成精度和极好的图案。 所述抗蚀剂下层膜组合物至少含有具有下述通式(1)表示的重复单元的聚合物。

    Antireflection film composition and patterning process using the same
    9.
    发明授权
    Antireflection film composition and patterning process using the same 有权
    防反射膜组合物和使用其的图案化工艺

    公开(公告)号:US07687228B2

    公开(公告)日:2010-03-30

    申请号:US12071804

    申请日:2008-02-26

    CPC分类号: G03F7/091

    摘要: An antireflection film composition, wherein an etching speed is fast, thus, when used as a resist lower layer, a film loss of a resist pattern and deformation of the pattern during etching can be minimized, and because of a high crosslinking density, a dense film can be formed after thermal crosslinking, thus, mixing with an upper layer resist can be prevented and the resist pattern after development is good is provided. The antireflection film composition comprising; at least a polymer having a repeating unit represented by the following general formula (I).

    摘要翻译: 一种防反射膜组合物,其中蚀刻速度快,因此,当用作抗蚀剂下层时,抗蚀剂图案的膜损失和蚀刻期间图案的变形可以最小化,并且由于交联密度高,致密的 可以在热交联后形成膜,因此可以防止与上层抗蚀剂的混合,显影后的抗蚀剂图案良好。 该防反射膜组合物包含: 至少一种具有由以下通式(I)表示的重复单元的聚合物。