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    Apparatus for the determination of a trace amount of an analyte substance or organism
    2.
    发明授权
    Apparatus for the determination of a trace amount of an analyte substance or organism 失效
    一种用于分析物物质或生物体的痕迹量的测定

    公开(公告)号：US5674696A

    公开(公告)日：1997-10-07

    申请号：US328057

    申请日：1994-10-24

    申请人： Michihiro Nakamura ,  Satomi Matsui ,  Keiko Oka ,  Hitoshi Tsuruta

    发明人： Michihiro Nakamura ,  Satomi Matsui ,  Keiko Oka ,  Hitoshi Tsuruta

    IPC分类号： G01N33/53 ,  G01N27/416 ,  G01N33/543 ,  G01N27/327 ,  G01N33/569

    CPC分类号： G01N27/4145 ,  Y10S435/817 ,  Y10S436/806

    摘要： There is disclosed an apparatus for the determination of a trace amount of an analyte substance or organism. A substrate solution is brought into contact with a small diameter tube which has captured, at least on its inner surface, a trace amount of an analyte substance or organism. The trace amount has the ability to change the pH of the substrate solution. A pH change following a reaction of a substrate in the substrate solution in the small diameter tube is measured; the apparatus has a cuvette having an inlet and an outlet for the substrate solution, a pH electrode accomodated in the cuvette, a pump for supplying the substrate solution in the cuvette, a positioning structure for positioning, in the cuvette, the small diameter tube with the pH sensitive plane of the pH electrode and spacing the surface and the plane at 1 mm or below from each other, and a sealing structure for maintaining a formed by the outer surface of the small diameter tube accommodated in the cuvette and the inner surface of the cuvette at liquid tight condition.

    摘要翻译： 公开了一种用于分析物物质或生物体的痕迹量的测定的装置。 将底物溶液与小直径管接触，其至少在其内表面捕获痕量的被分析物质或生物体。 痕量具有改变的底物溶液的pH的能力。 测量小直径管中底物溶液中底物反应后的pH变化; 该装置具有一个具有用于底物溶液的入口和出口的比色杯，一个容纳在该比色皿中的pH电极，一个用于将该基质溶液供应到该比色杯中的泵，一个定位结构，用于在该小杯中定位该小直径管， pH电极的pH敏感平面，并将表面和平面彼此间隔1mm或1mm以下，并且保持由容纳在反应杯中的小直径管的外表面形成的密封结构， 液体条件下的比色杯。

    DUV-UV band spectroscopic optical system and spectrometer using same
    3.
    发明授权
    DUV-UV band spectroscopic optical system and spectrometer using same 有权
    DUV-UV光谱分光光学系统和光谱仪

    公开(公告)号：US08730471B2

    公开(公告)日：2014-05-20

    申请号：US13145942

    申请日：2009-12-17

    申请人： Keiko Oka ,  Yasuhiro Yoshitake

    发明人： Keiko Oka ,  Yasuhiro Yoshitake

    IPC分类号： G01J3/28

    CPC分类号： G01B11/0625 ,  G01B2210/56 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0278 ,  G01J3/0297 ,  G01J3/10 ,  G01N21/9501 ,  G01N21/956 ,  G02B13/143 ,  G02B21/16 ,  G02B27/0025 ,  G11B5/84

    摘要： Disclosed are a spectroscopic optical system and a spectrometer both enabling vertical illumination by means of an optical system using only refractive lenses and enabling wide-band color correction in the DUV-UV (190 to 400 nm) range. The spectroscopic optical system and spectrometer each comprise a light source (100), a folding mirror (110), a field stop (120), an object-side focusing lens system (130) for focusing light onto a sample, an image-side focusing lens (140) disposed on the image forming plane of the object-side focusing lens system, and a spectroscope (150) for dispersing regularly reflected light from the sample. The object-side focusing lens system (130) and the image-side focusing lens system (140) are each a spectroscopic optical system corrected with respect to color in a broad band of wavelength from 190 to 400 nm and configured from only refractive lenses enabling vertical illumination. The working distance (WD) of each lens is set shorter than a predetermined distance, and the doublet interval (D) is set longer than a predetermined distance.

    摘要翻译： 公开了一种分光光学系统和光谱仪，其通过仅使用折射透镜的光学系统实现垂直照明，并且能够在DUV-UV（190-400nm）范围内实现宽带色彩校正。 分光光学系统和光谱仪各自包括光源（100），折叠镜（110），场停止器（120），用于将光聚焦到样本上的物体侧聚焦透镜系统（130），图像侧 设置在物体侧聚焦透镜系统的图像形成平面上的聚焦透镜（140）以及用于从样品中均匀地分散反射光的分光镜（150）。 物体侧聚焦透镜系统（130）和图像侧聚焦透镜系统（140）分别是相对于190至400nm的波长宽带中的颜色校正的分光光学系统，并且仅由折射透镜构成，使得能够 垂直照明 每个透镜的工作距离（WD）设定为短于预定距离，并且双重间隔（D）被设定为比预定距离长。

    Wavefront aberration measuring method and device therefor
    4.
    发明授权
    Wavefront aberration measuring method and device therefor 有权
    波前像差测量方法及其装置

    公开(公告)号：US08705024B2

    公开(公告)日：2014-04-22

    申请号：US13145212

    申请日：2010-01-22

    申请人： Yasuhiro Yoshitake ,  Minoru Yoshida ,  Keiko Oka

    发明人： Yasuhiro Yoshitake ,  Minoru Yoshida ,  Keiko Oka

    IPC分类号： G01J1/00

    CPC分类号： G01M11/0257 ,  G01M11/0207

    摘要： Measurement cannot be made when trying to measure a wavefront aberration of a wide-angle lens, being wide in a field of view, comparing to a focus distance, by a Shack-Hartmann sensor, since an inclination of the wavefront exceeds an allowable value of inclination of the Shack-Hartmann sensor. The Shack-Hartmann sensor is inclined at a position of a pupil of a lens, and is controlled so that it lies within the allowable value mentioned above. Photographing is made through step & repeat while overlapping at the same position, to compose in such a manner that overlapping spots are piled up, and thereby measuring the wavefront aberration of the lens having a large pupil diameter.

    摘要翻译： 当通过Shack-Hartmann传感器测量广角镜头的波前像差（与视场相比宽的焦点距离）时，不能进行测量，因为波前的倾斜度超过了允许值 Shack-Hartmann传感器的倾角。 Shack-Hartmann传感器在透镜的瞳孔的位置处倾斜，并被控制成使其位于上述容许值内。 通过步骤重复进行拍摄，同时在相同位置重叠，以这样的方式组合，使得重叠的斑点堆积，从而测量具有大瞳孔直径的透镜的波前像差。

    Grism
    5.
    发明授权
    Grism 失效
    格里姆

    公开(公告)号：US06927914B2

    公开(公告)日：2005-08-09

    申请号：US10457408

    申请日：2003-06-10

    申请人： Noboru Ebizuka ,  Kashiko Kodate ,  Keiko Oka ,  Masanori Ie ,  Toshikazu Ebisuzaki

    发明人： Noboru Ebizuka ,  Kashiko Kodate ,  Keiko Oka ,  Masanori Ie ,  Toshikazu Ebisuzaki

    IPC分类号： G02B5/04 ,  G01J3/16 ,  G01J3/18 ,  G01J3/28 ,  G02B5/06 ,  G02B5/18 ,  G02B5/32 ,  G02B26/08 ,  G02B27/44

    CPC分类号： G01J3/12 ,  G01J3/16 ,  G01J3/18 ,  G01J3/2823 ,  G02B5/06 ,  G02B5/1814 ,  G02B5/1828 ,  G02B26/0883 ,  G02B27/4244

    摘要： In order to achieve highly dispersive spectrometry in wide wavelength with the use of a single grism, but not a plurality of grisms, the grism is composed of a prism the vertex angle of which can be varied and a volume phase holographic (VPH) grating. More specifically, the grism comprises a prism the vertex angle of which can be varied; and a VPH grating being a diffraction grating and disposed substantially orthogonal with respect to a side including the vertex angle of the prism; the VPH grating being rotated around an axis being substantially orthogonal to the side of the prism, whereby a slope angle defined by the VPH grating and a predetermined plane is varied.

    摘要翻译： 为了通过使用单个棱镜而不是多个棱镜来实现宽波长的高色散光谱，棱镜由顶角可以变化的棱镜和体积相位全息（VPH）光栅组成。 更具体地，棱镜包括其顶角可以变化的棱镜; 以及VPH光栅，其是衍射光栅，并且相对于包括所述棱镜的顶角的一侧大致正交地布置; VPH光栅围绕基本上正交于棱镜的一侧的轴线旋转，由此由VPH光栅和预定平面限定的斜角变化。

    DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME
    6.
    发明申请
    DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME 有权
    DUV-UV带光谱系统和使用它的光谱仪

    公开(公告)号：US20110279820A1

    公开(公告)日：2011-11-17

    申请号：US13145942

    申请日：2009-12-17

    申请人： Keiko Oka ,  Yasuhiro Yoshitake

    发明人： Keiko Oka ,  Yasuhiro Yoshitake

    IPC分类号： G01N21/47

    CPC分类号： G01B11/0625 ,  G01B2210/56 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0278 ,  G01J3/0297 ,  G01J3/10 ,  G01N21/9501 ,  G01N21/956 ,  G02B13/143 ,  G02B21/16 ,  G02B27/0025 ,  G11B5/84

    摘要： Disclosed are a spectroscopic optical system and a spectrometer both enabling vertical illumination by means of an optical system using only refractive lenses and enabling wide-band color correction in the DUV-UV (190 to 400 nm) range. The spectroscopic optical system and spectrometer each comprise a light source (100), a folding mirror (110), a field stop (120), an object-side focusing lens system (130) for focusing light onto a sample, an image-side focusing lens (140) disposed on the image forming plane of the object-side focusing lens system, and a spectroscope (150) for dispersing regularly reflected light from the sample. The object-side focusing lens system (130) and the image-side focusing lens system (140) are each a spectroscopic optical system corrected with respect to color in a broad band of wavelength from 190 to 400 nm and configured from only refractive lenses enabling vertical illumination. The working distance (WD) of each lens is set shorter than a predetermined distance, and the doublet interval (D) is set longer than a predetermined distance.

    摘要翻译： 公开了一种分光光学系统和光谱仪，其通过仅使用折射透镜的光学系统实现垂直照明，并且能够在DUV-UV（190-400nm）范围内实现宽带色彩校正。 分光光学系统和光谱仪各自包括光源（100），折叠镜（110），场停止器（120），用于将光聚焦到样本上的物体侧聚焦透镜系统（130），图像侧 设置在物体侧聚焦透镜系统的图像形成平面上的聚焦透镜（140）以及用于从样品中均匀地分散反射光的分光镜（150）。 物体侧聚焦透镜系统（130）和图像侧聚焦透镜系统（140）分别是相对于190至400nm的波长宽带中的颜色校正的分光光学系统，并且仅由折射透镜构成，使得能够 垂直照明 每个透镜的工作距离（WD）设定为短于预定距离，并且双重间隔（D）被设定为比预定距离长。

    MATERIAL FOR CELL CULTURE
    7.
    发明申请
    MATERIAL FOR CELL CULTURE 审中-公开
    细胞培养材料

    公开(公告)号：US20110027890A1

    公开(公告)日：2011-02-03

    申请号：US12159214

    申请日：2006-12-25

    申请人： Akio Fujita ,  Yuji Hotta ,  Keiko Oka ,  Michiyo Takagi

    发明人： Akio Fujita ,  Yuji Hotta ,  Keiko Oka ,  Michiyo Takagi

    IPC分类号： C12N5/02 ,  C07K14/00 ,  C07H21/00

    CPC分类号： C12N5/0068 ,  G01N33/54306

    摘要： A ligand construct containing at least two, identical or different, ligand molecules which are capable of binding to a cell surface receptor, the ligand molecules being coupled via a spacer, wherein the ligand construct has at least one functional group for binding substrates. According to the ligand construct of the present invention, the immobilization of the ligand construct to various artificial substrates is facilitated, so that an artificial matrix can be easily prepared on an optimal substrate, whereby cells can be stably cultured.

    摘要翻译： 含有至少两个相同或不同的配体分子的配体构建体，其能够结合细胞表面受体，配体分子通过间隔基偶联，其中配体构建体具有至少一个用于结合底物的官能团。 根据本发明的配体构建体，能够容易地将配体构建体固定化为各种人造底物，从而可以容易地在最佳底物上制备人造基质，由此能够稳定地培养细胞。

    WAVEFRONT ABERRATION MEASURING METHOD AND DEVICE THEREFOR
    8.
    发明申请
    WAVEFRONT ABERRATION MEASURING METHOD AND DEVICE THEREFOR 有权
    WAVEFRONT ABERRATION测量方法及其设备

    公开(公告)号：US20120019813A1

    公开(公告)日：2012-01-26

    申请号：US13145212

    申请日：2010-01-22

    申请人： Yasuhiro Yoshitake ,  Minoru Yoshida ,  Keiko Oka

    发明人： Yasuhiro Yoshitake ,  Minoru Yoshida ,  Keiko Oka

    IPC分类号： G01J1/00

    CPC分类号： G01M11/0257 ,  G01M11/0207

    摘要： Measurement cannot be made when trying to measure a wavefront aberration of a wide-angle lens, being wide in a field of view, comparing to a focus distance, by a Shack-Hartmann sensor, since an inclination of the wavefront exceeds an allowable value of inclination of the Shack-Hartmann sensor.The Shack-Hartmann sensor is inclined at a position of a pupil of a lens, and is controlled so that it lies within the allowable value mentioned above. Photographing is made through step & repeat while overlapping at the same position, to compose in such a manner that overlapping spots are piled up, and thereby measuring the wavefront aberration of the lens having a large pupil diameter.

    摘要翻译： 当通过Shack-Hartmann传感器测量广角镜头的波前像差（与视场相比宽的焦点距离）时，不能进行测量，因为波前的倾斜度超过了允许值 Shack-Hartmann传感器的倾角。 Shack-Hartmann传感器在透镜的瞳孔的位置处倾斜，并被控制成使其位于上述容许值内。 通过步骤重复进行拍摄，同时在相同位置重叠，以这样的方式组合，使得重叠的斑点堆积，从而测量具有大瞳孔直径的透镜的波前像差。