公开(公告)号：US10607677B2

公开(公告)日：2020-03-31

申请号：US16183021

申请日：2018-11-07

Applicant: Micron Technology, Inc.

Inventor： Scott James Derner ,  Christopher John Kawamura

IPC: G11C11/22 ,  G11C7/14

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A first ferroelectric memory cell may be initialized to a first state and a second ferroelectric memory cell may be initialized to a different state. Each state may have a corresponding digit line voltage. The digit lines of the first and second ferroelectric memory cells may be connected so that charge-sharing occurs between the two digit lines. The voltage resulting from the charge-sharing between the two digit lines may be used by other components as a reference voltage.

公开(公告)号：US20200066321A1

公开(公告)日：2020-02-27

申请号：US16675021

申请日：2019-11-05

Applicant: Micron Technology, Inc.

Inventor： Scott James Derner ,  Christopher John Kawamura ,  Charles L. Ingalls

IPC: G11C11/22

Abstract: Methods, systems, and apparatuses related to a reprogrammable non-volatile latch are described. A latch may include ferroelectric cells, ferroelectric capacitors, a sense component, and other circuitry and components related to ferroelectric memory technology. The ferroelectric latch may be independent from (or exclusive of) a main ferroelectric memory array. The ferroelectric latch may be positioned anywhere in the memory device. In some instances, a ferroelectric latch may be positioned and configured to be dedicated to single piece of circuitry in the memory device.

公开(公告)号：US10372566B2

公开(公告)日：2019-08-06

申请号：US15267817

申请日：2016-09-16

Applicant: Micron Technology, Inc.

Inventor： Christopher John Kawamura ,  Scott James Derner ,  Charles L. Ingalls

IPC: G06F11/00 ,  G06F11/20 ,  G11C11/22 ,  G06F11/10 ,  G11C29/52

Abstract: Methods, systems, and apparatuses for storing operational information related to operation of a non-volatile array are described. For example, the operational information may be stored in a in a subarray of a memory array for use in analyzing errors in the operation of memory array. In some examples, an array driver may be located between a command decoder and a memory array. The array driver may receive a signal pattern used to execute an access instruction for accessing non-volatile memory cells of a memory array and may access the first set of non-volatile memory cells according to the signal pattern. The array driver may also store the access instruction (e.g., the binary representation of the access instruction) at a non-volatile subarray of the memory array.

公开(公告)号：US20190130955A1

公开(公告)日：2019-05-02

申请号：US16184480

申请日：2018-11-08

Applicant: Micron Technology, Inc.

Inventor： Daniele Vimercati ,  Scott James Derner ,  Umberto Di Vincenzo ,  Christopher Johnson Kawamura ,  Eric S. Carman

IPC: G11C11/22

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A ground reference scheme may be employed in a digit line voltage sensing operation. A positive voltage may be applied to a memory cell; and after a voltage of the digit line of the cell has reached a threshold, a negative voltage may be applied to cause the digit line voltages to center around ground before a read operation. In another example, a first voltage may be applied to a memory cell and then a second voltage that is equal to an inverse of the first voltage may be applied to a reference capacitor that is in electronic communication with a digit line of the memory cell to cause the digit line voltages to center around ground before a read operation.

公开(公告)号：US10163480B1

公开(公告)日：2018-12-25

申请号：US15662002

申请日：2017-07-27

Applicant: Micron Technology, Inc.

Inventor： Christopher John Kawamura ,  Scott James Derner

IPC: G11C5/10 ,  G11C11/22 ,  G11C11/4074 ,  H01L27/108 ,  H01L27/11507 ,  H01L23/528 ,  G11C11/408

Abstract: Methods, systems, and devices for periphery fill and localized capacitance are described. A memory array may be fabricated with certain containers connected to provide capacitance rather than to operate as memory cells. For example, a memory cell having one or two transistors, or other switching components, and one capacitor, such as a ferroelectric or dielectric capacitor, may be electrically isolated from one or more containers sharing a common access line, and the isolated containers may be used as capacitors. The capacitors may be used for filtering in some examples. Or the capacitance may be used to boost or regulate voltage in, for example, support circuitry.

公开(公告)号：US20180158502A1

公开(公告)日：2018-06-07

申请号：US15844145

申请日：2017-12-15

Applicant: Micron Technology, Inc.

Inventor： Scott James Derner ,  Christopher John Kawamura ,  Charles L. Ingalls

IPC: G11C11/22

CPC classification number: G11C11/2275 ,  G11C11/221 ,  G11C11/2273

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A first value may be written to a first memory cell and a second value may be written to a second memory cell. Each value may have a corresponding voltage when the memory cells are discharged onto their respective digit lines. The voltage on each digit line after a read operation may be temporarily stored at a node in electronic communication with the respective digit line. A conductive path may be established between the nodes so that charge sharing occurs between the nodes. The voltage resulting from the charge sharing may be used to adjust a reference voltage that is used by other components.

公开(公告)号：US20180102158A1

公开(公告)日：2018-04-12

申请号：US15831076

申请日：2017-12-04

Applicant: Micron Technology, Inc.

Inventor： Scott James Derner ,  Christopher John Kawamura ,  Charles L. Ingalls

IPC: G11C11/22

Abstract: Methods, systems, and apparatuses related to a reprogrammable non-volatile latch are described. A latch may include ferroelectric cells, ferroelectric capacitors, a sense component, and other circuitry and components related to ferroelectric memory technology. The ferroelectric latch may be independent from (or exclusive of) a main ferroelectric memory array. The ferroelectric latch may be positioned anywhere in the memory device. In some instances, a ferroelectric latch may be positioned and configured to be dedicated to single piece of circuitry in the memory device.

公开(公告)号：US09934837B2

公开(公告)日：2018-04-03

申请号：US15057914

申请日：2016-03-01

Applicant: Micron Technology, Inc.

Inventor： Daniele Vimercati ,  Scott James Derner ,  Umberto Di Vincenzo ,  Christopher John Kawamura ,  Eric S. Carman

IPC: G11C11/22

CPC classification number: G11C11/2273 ,  G11C11/221 ,  G11C11/2293

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A ground reference scheme may be employed in a digit line voltage sensing operation. A positive voltage may be applied to a memory cell; and after a voltage of the digit line of the cell has reached a threshold, a negative voltage may be applied to cause the digit line voltages to center around ground before a read operation. In another example, a first voltage may be applied to a memory cell and then a second voltage that is equal to an inverse of the first voltage may be applied to a reference capacitor that is in electronic communication with a digit line of the memory cell to cause the digit line voltages to center around ground before a read operation.

公开(公告)号：US09847117B1

公开(公告)日：2017-12-19

申请号：US15276139

申请日：2016-09-26

Applicant: Micron Technology, Inc.

Inventor： Scott James Derner ,  Christopher John Kawamura ,  Charles L. Ingalls

IPC: G11C11/22

CPC classification number: G11C11/2275 ,  G11C11/221 ,  G11C11/2273

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A first value may be written to a first memory cell and a second value may be written to a second memory cell. Each value may have a corresponding voltage when the memory cells are discharged onto their respective digit lines. The voltage on each digit line after a read operation may be temporarily stored at a node in electronic communication with the respective digit line. A conductive path may be established between the nodes so that charge sharing occurs between the nodes. The voltage resulting from the charge sharing may be used to adjust a reference voltage that is used by other components.

公开(公告)号：US20170270991A1

公开(公告)日：2017-09-21

申请号：US15073989

申请日：2016-03-18

Applicant: Micron Technology, Inc.

Inventor： Christopher John Kawamura ,  Scott James Derner

IPC: G11C11/22

CPC classification number: G11C11/2273 ,  G11C11/221 ,  G11C11/2275

Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A memory device may maintain a digit line voltage at a ground reference for a duration associated with biasing a ferroelectric capacitor of a memory cell. For example, a digit line that is in electronic communication with a ferroelectric capacitor may be virtually grounded while a voltage is applied to a plate of the ferroelectric capacitor, and the ferroelectric capacitor may be isolated from the virtual ground after a threshold associated with applying the voltage to the plate is reached. A switching component (e.g., a transistor) that is in electronic communication with the digit line and virtual ground may be activated to virtually ground the digit line and deactivated to isolate the digit line from virtual ground.