-
公开(公告)号:US20230193425A1
公开(公告)日:2023-06-22
申请号:US18014466
申请日:2021-07-09
发明人: Kohei TOKUDA , Takuya MITSUNOBU , Mamoru SAITO , Yuto FUKUDA , Yasuto GOTO , Hidetoshi SHINDO , Fumiaki NAKAMURA , Koji KAWANISHI , Ryohei MIMURA
IPC分类号: C22C18/04
CPC分类号: C22C18/04
摘要: A plated steel including a plated layer on a surface of a steel, in which Expression 1 of 0≤Cr+Ti+Ni+Co+V+Nb+Cu+Mn 0.25 and Expression 2 of 0≤Sr+Sb+Pb+B+Li+Zr+Mo+W+Ag+P≤0.50 are satisfied, and Expression 3 of I(MgZn2 (41.31°))/IΣ(MgZn2)≤0.265 and Expression 6 of 0.150≤{I(MgZn2 (20.79°))+I(MgZn2 (42.24°))}/IΣ(MgZn2) are further satisfied in an X-ray diffraction pattern of a surface of the plated layer measured using Cu-Kα rays under a condition that an X-ray output is 40 kV and 150 mA.
-
公开(公告)号:US20240336996A1
公开(公告)日:2024-10-10
申请号:US18703998
申请日:2022-08-16
发明人: Kohei TOKUDA , Mamoru SAITO , Yuto FUKUDA , Yasuto GOTO , Yasuhiro MAJIMA , Naoyuki YAMATO , Fumiaki NAKAMURA , Hidetoshi SHINDO , Koji KAWANISHI , Kenichiro MATSUMURA , Hiroshi TAKEBAYASHI
CPC分类号: C22C18/04 , C23C30/005
摘要: A plated steel sheet comprises a plated layer on a surface of a steel sheet, in which in the plated layer, the total amount ΣA of Sn, Bi, and In is less than 0.75%, the total amount ΣB of Ca, Y, La, and Ce is 0.03 to 0.60%, the total amount ΣC of Cr, Ti, Ni, Co, V, Nb, Cu, and Mn is 0 to 1.00%, Sn≤Si, and 20.0≤Mg/Si are satisfied, and in an X-ray diffraction pattern of a surface of the plated layer, an X-ray diffraction peak of Al2.15Zn1.85Ca, an X-ray diffraction peak of CaZn2, and an X-ray diffraction peak of η′-MgZn2 satisfy a predetermined relationship.
-
公开(公告)号:US20240043980A1
公开(公告)日:2024-02-08
申请号:US18271990
申请日:2021-11-30
发明人: Kohei TOKUDA , Mamoru SAITO , Takuya MITSUNOBU , Tetsuya TOBA , Yasuto GOTO , Atsushi MORISHITA , Yasuaki KAWAMURA , Fumiaki NAKAMURA , Koji KAWANISHI
IPC分类号: C23C2/06
CPC分类号: C23C2/06
摘要: A plated steel material having a plating layer having an average chemical composition containing, in mass %, Zn: more than 50.00%, Al: more than 15.0% and less than 30.0%, Mg: more than 5.0% and less than 15.0%, and Si: 0.25% or more and less than 3.50%, and impurities, and wherein a total amount (ΣA) of at least one selected from the group consisting of Sn, Bi and In is less than 1.00%, a total amount (ΣB) of at least one selected from the group consisting of Ca, Y, La, Ce and Sr is 0.02% or more and less than 0.60%, 2.0≤SMg/Si
-
-