ATOM INTERFEROMETER
    1.
    发明申请

    公开(公告)号:US20220018650A1

    公开(公告)日:2022-01-20

    申请号:US17413822

    申请日:2019-12-16

    IPC分类号: G01B9/02

    摘要: The present application relates to an atom interferometry method. The atom interferometry method releases atoms from an atom source into an interferometer region. Pulses of light are then directed at the atoms to place the atoms in different quantum states and to recombine the quantum states such that the recombined quantum states interfere with each other when the quantum states are overlapped spatially. The recombined quantum states creates a spatial fringe pattern with a phase. The spatial fringe pattern and the phase of the spatial fringe pattern are detected when the quantum states are overlapped spatially. The overlapped spatial fringe pattern is then used to measure physical quantities such as local gravity, the gravitational constant, the fine structure constant, the ratio of Planck's constant to the atomic mass, rotation of the atom interferometer, acceleration of the atom interferometer, and the like.