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18 条记录 (耗时 0.016 秒)

    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    3.
    发明申请
    CT INSPECTION SYSTEM AND CT IMAGING METHOD 审中-公开

    公开(公告)号：US20190204242A1

    公开(公告)日：2019-07-04

    申请号：US16234621

    申请日：2018-12-28

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Xiulin NI ,  Jianmin LI ,  Haitian TAN ,  Yulan LI ,  Weifeng YU ,  Yuanjing LI ,  Hejun ZHOU ,  Zhiqiang CHEN ,  Chunguang ZONG ,  Li ZHANG

    IPC分类号： G01N23/046 ,  G01V5/00

    CPC分类号： G01N23/046 ,  G01N2223/401 ,  G01V5/005

    摘要： The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.

    SECURITY SCANNING INSPECTION SYSTEM AND METHOD
    5.
    发明申请
    SECURITY SCANNING INSPECTION SYSTEM AND METHOD 有权

    公开(公告)号：US20210270991A1

    公开(公告)日：2021-09-02

    申请号：US17255394

    申请日：2020-01-06

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED

    发明人： Yanwei XU ,  Weifeng YU ,  Yu HU ,  Chunguang ZONG ,  Shangmin SUN

    IPC分类号： G01V5/00 ,  G01S17/894 ,  G06K9/78

    摘要： The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.

    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    6.
    发明申请
    CT INSPECTION SYSTEM AND CT IMAGING METHOD 审中-公开

    公开(公告)号：US20190204243A1

    公开(公告)日：2019-07-04

    申请号：US16234625

    申请日：2018-12-28

    申请人： TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    发明人： Kejun KANG ,  Jianmin LI ,  Xiulin NI ,  Yulan LI ,  Yuanjing LI ,  Zhiqiang CHEN ,  Li ZHANG ,  Liang LI ,  Xiang ZOU ,  Weifeng YU ,  Hejun ZHOU ,  Chunguang ZONG

    IPC分类号： G01N23/046

    CPC分类号： G01N23/046 ,  G01N2223/33 ,  G01V5/005

    摘要： The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device.

    METHODS AND DEVICES FOR ESTIMATING WEIGHT OF AN OBJECT TO BE INSPECTED IN AN INSPECTION SYSTEM
    7.
    发明申请
    METHODS AND DEVICES FOR ESTIMATING WEIGHT OF AN OBJECT TO BE INSPECTED IN AN INSPECTION SYSTEM 审中-公开
    用于估计在检查系统中检查对象的重量的方法和装置

    公开(公告)号：US20170023697A1

    公开(公告)日：2017-01-26

    申请号：US15217787

    申请日：2016-07-22

    申请人： Tsinghua University ,  NUCTECH COMPANY LIMITED

    发明人： Zhiqiang CHEN ,  Yuanjing LI ,  Li ZHANG ,  Ziran ZHAO ,  Yaohong LIU ,  Juan ZHENG ,  Jianping GU ,  Chunguang ZONG

    IPC分类号： G01V5/00

    CPC分类号： G01V5/0041 ,  G01N23/04 ,  G01N23/046 ,  G01N23/06 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01V5/0016 ,  G01V5/005 ,  G01V5/12

    摘要： Disclosed is a method and device for estimating weight of an object to be inspected in an inspection system. An effective atomic number and a high-energy gray value of the dual-energy corresponding to each pixel of the object to be inspected are obtained by a dual-energy radiation scanning. A mass-thickness value for a corresponding pixel is obtained from a pre-created mass-thickness attenuation curve by utilizing the effective atomic numbers and the high-energy gray value of the dual-energy for respective pixels. Weight information for at least a part of the object to be inspected is calculated by multiplying the mass-thickness value by the area of the pixel. Such a method may accurately calculate the weight of the object to be inspected and save the cost for a conventional weighing hardware.

    摘要翻译： 公开了一种用于在检查系统中估计被检查物体的重量的方法和装置。 通过双能量辐射扫描获得与待检测对象的每个像素相对应的双能量的有效原子序数和高能灰度值。 通过利用有效原子序数和相应像素的双能量的高能量灰度值，从预先创建的质量厚度衰减曲线获得相应像素的质量厚度值。 通过将质量厚度值乘以像素的面积来计算待检查对象的至少一部分的重量信息。 这种方法可以精确地计算待检查物体的重量并节省常规称重硬件的成本。

    VEHICLE INSPECTION METHOD, APPARATUS AND SYSTEM, AND COMPUTER-READABLE STORAGE MEDIUM
    10.
    发明申请
    VEHICLE INSPECTION METHOD, APPARATUS AND SYSTEM, AND COMPUTER-READABLE STORAGE MEDIUM 有权

    公开(公告)号：US20220084336A1

    公开(公告)日：2022-03-17

    申请号：US17421709

    申请日：2020-01-23

    申请人： NUCTECH COMPANY LIMITED ,  NUCTECH (BEIJING) COMPANY LIMITED ,  TSINGHUA UNIVERSITY

    发明人： Yongming WANG ,  Junjie TU ,  Chuan GAO ,  Yanwei XU ,  Weifeng YU ,  Chunguang ZONG ,  Yu HU

    IPC分类号： G07C5/08 ,  B60W40/10

    摘要： This disclosure provides a vehicle inspection method, apparatus, system, and computer-readable storage medium and relates to the field of security inspection technologies. The vehicle inspection method of the present disclosure includes: acquiring vehicle profile information of a vehicle through a first sensor that performs measurement in a direction perpendicular to a passage, and determining a feature point of the vehicle according to the vehicle profile information; determining a position of the vehicle in the passage through a second sensor that performs measurement in a direction along the passage, and determining a position of the feature point according to the position of the vehicle in the passage; and switching an operating mode of a ray source based on a preset strategy according to a position relation between the position of the feature point and the ray source.