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    On-line memory testing systems and methods
    1.
    发明授权
    On-line memory testing systems and methods 有权
    在线内存测试系统和方法

    公开(公告)号：US09202591B2

    公开(公告)日：2015-12-01

    申请号：US13892019

    申请日：2013-05-10

    Applicant: OmniVision Technologies, Inc.

    Inventor： Johannes Solhusvik ,  Kristoffer Ellersgaard Koch ,  Sohrab Yaghmai ,  Jenny Picalausa

    IPC: G01R31/28 ,  G11C29/08 ,  G11C29/04 ,  G11C29/26

    CPC classification number: G11C29/08 ,  G11C2029/0401 ,  G11C2029/0409 ,  G11C2029/2602

    Abstract: A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.

    Abstract translation: 一种用于在存储器使用期间测试电子存储器的方法包括：（a）在测试地址处检测对电子存储器的访问，（b）在寄存器子系统中保存在位置处写入电子存储器的写入数据 对应于测试地址，（c）将写入数据与在与测试地址相对应的位置处从电子存储器读取的数据进行比较，以确定存储器是否具有故障，以及（d）如果存储器具有 故障。

    System And Method For Scan-Testing Of Idle Functional Units In Operating Systems
    2.
    发明申请
    System And Method For Scan-Testing Of Idle Functional Units In Operating Systems 有权
    用于操作系统中空闲功能单元的扫描测试的系统和方法

    公开(公告)号：US20150212151A1

    公开(公告)日：2015-07-30

    申请号：US14166383

    申请日：2014-01-28

    Applicant: OmniVision Technologies, Inc.

    Inventor： Jenny Picalausa ,  Kristoffer Koch

    IPC: G01R31/3177

    CPC classification number: G01R31/318544 ,  G01R31/31703 ,  G01R31/3177 ,  G01R31/31813 ,  G01R31/318385 ,  G01R31/318547 ,  G01R31/318555 ,  G01R31/3187 ,  G01R31/31932 ,  G01R31/31935 ,  G06F11/2236 ,  G06F11/261 ,  G06F11/277 ,  G06F13/24 ,  H04L43/50

    Abstract: A system has in an integrated circuit a seed memory coupled to seed a vector generator that provides a vector to at least one scan chain of a first functional unit. A signature generator is configured to generate a signature from scan chain data, the signature is compared to an expected signature in a signature memory. A state memorizer is provided for saving a state of the functional unit and to restore the state of the functional unit as testing is completed. The system also has apparatus configured to determine an idle condition of the functional unit despite a non-idle state of the system; and a control unit configured to operate a test sequence when the functional unit is idle, the test sequence saving a state of the unit, generating vectors and signatures and verifying the signatures, and restoring the state of the unit.

    Abstract translation: 一种系统在集成电路中具有耦合到种子矢量发生器的种子存储器，其向第一功能单元的至少一个扫描链提供向量。 签名生成器被配置为从扫描链数据生成签名，将签名与签名存储器中的预期签名进行比较。 提供状态存储器，用于保存功能单元的状态，并在测试完成时恢复功能单元的状态。 该系统还具有被配置为尽管系统的非空闲状态来确定功能单元的空闲状态的装置; 以及控制单元，被配置为当所述功能单元空闲时操作测试序列，所述测试序列保存所述单元的状态，生成向量和签名并验证所述签名，以及恢复所述单元的状态。

    Imaging systems and methods with image data path delay measurement
    3.
    发明授权
    Imaging systems and methods with image data path delay measurement 有权

    公开(公告)号：US10225468B2

    公开(公告)日：2019-03-05

    申请号：US14994731

    申请日：2016-01-13

    Applicant: OmniVision Technologies, Inc.

    Inventor： Jenny Picalausa

    IPC: H04N5/05 ,  H04N5/232 ,  H04N5/247 ,  H04N5/262 ,  H04N5/265 ,  H04N5/04 ,  H04N1/00

    Abstract: An imaging system with image data path delay measurement includes (a) a first image sensor chip that includes a pixel array for generating a first image in response to light incident upon the pixel array, and a time mark generator for, upon receiving a time mark command, encoding a signature in the first image to generate a first marked image with the signature and image data from the first image, and (b) an image signal processing chip for processing the first marked image, wherein the image signal processing chip includes a data path delay measurement module for generating the time mark command and estimating image data path delay from the pixel array to the data path delay measurement module based upon time delay between (i) generating the time mark command and (ii) receipt of the signature as part of the first marked image.

    On-Line Memory Testing Systems And Methods
    6.
    发明申请
    On-Line Memory Testing Systems And Methods 有权
    在线记忆测试系统和方法

    公开(公告)号：US20140337669A1

    公开(公告)日：2014-11-13

    申请号：US13892019

    申请日：2013-05-10

    Applicant: Omnivision Technologies, Inc

    Inventor： Johannes Solhusvik ,  Kristoffer Ellersgaard Koch ,  Sohrab Yaghmai ,  Jenny Picalausa

    IPC: G06F11/263

    CPC classification number: G11C29/08 ,  G11C2029/0401 ,  G11C2029/0409 ,  G11C2029/2602

    Abstract: A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.

    Abstract translation: 一种用于在存储器使用期间测试电子存储器的方法包括：（a）在测试地址处检测对电子存储器的访问，（b）在寄存器子系统中保存在位置处写入电子存储器的写入数据 对应于测试地址，（c）将写入数据与在与测试地址相对应的位置处从电子存储器读取的数据进行比较，以确定存储器是否具有故障，以及（d）如果存储器具有 故障。

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