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    REDUCTION OF FORMING VOLTAGE IN SEMICONDUCTOR DEVICES
    2.
    发明申请
    REDUCTION OF FORMING VOLTAGE IN SEMICONDUCTOR DEVICES 有权
    减少半导体器件中的成形电压

    公开(公告)号：US20090272962A1

    公开(公告)日：2009-11-05

    申请号：US12391784

    申请日：2009-02-24

    申请人： Pragati Kumar ,  Yun Wang ,  Prashant Phatak ,  Tony P. Chiang

    发明人： Pragati Kumar ,  Yun Wang ,  Prashant Phatak ,  Tony P. Chiang

    IPC分类号： H01L45/00 ,  H01L21/28

    CPC分类号： H01L45/146 ,  G11C13/0002 ,  G11C2013/0083 ,  G11C2213/51 ,  H01L27/2409 ,  H01L27/2463 ,  H01L45/08 ,  H01L45/10 ,  H01L45/1233 ,  H01L45/1253 ,  H01L45/1625 ,  H01L45/1641

    摘要： This disclosure provides a nonvolatile memory device and related methods of manufacture and operation. The device may include one or more resistive random access memory (RRAM) that use techniques to provide a memory device with more predictable operation. In particular, forming voltage required by particular designs may be reduced through the use of a barrier layer, a reverse polarity forming voltage pulse, a forming voltage pulse where electrons are injected from a lower work function electrode, or through the use of an anneal in a reducing environment. One or more of these techniques may be applied, depending on desired application and results.

    摘要翻译： 本公开提供了一种非易失性存储器件及相关的制造和操作方法。 该设备可以包括使用技术来向存储器设备提供更可预测的操作的一个或多个电阻随机存取存储器（RRAM）。 特别地，可以通过使用阻挡层，反极性形成电压脉冲，形成电压脉冲（其中电子从下功能电极注入）或通过使用退火进行退火来降低特定设计所需的形成电压 减少环境。 可以根据期望的应用和结果应用这些技术中的一种或多种。

    Closed loop sputtering controlled to enhance electrical characteristics in deposited layer
    3.
    发明授权
    Closed loop sputtering controlled to enhance electrical characteristics in deposited layer 有权
    控制闭环溅射以增强沉积层中的电特性

    公开(公告)号：US08895951B2

    公开(公告)日：2014-11-25

    申请号：US13249631

    申请日：2011-09-30

    申请人： Wayne R French ,  Tony P. Chiang ,  Pragati Kumar ,  Prashant B Phatak

    发明人： Wayne R French ,  Tony P. Chiang ,  Pragati Kumar ,  Prashant B Phatak

    IPC分类号： H01L47/00 ,  C23C14/08 ,  C23C14/00 ,  C23C14/54 ,  H01L45/00 ,  H01L27/24

    CPC分类号： C23C14/083 ,  C23C14/0042 ,  C23C14/54 ,  H01L27/2409 ,  H01L27/2463 ,  H01L45/08 ,  H01L45/1233 ,  H01L45/146 ,  H01L45/1625 ,  H01L45/1641 ,  H01L45/165

    摘要： This disclosure provides a method of fabricating a semiconductor device layer and an associated memory cell. Empirical data may be used to generate a hysteresis curve associated with deposition for a metal-insulator-metal structure, with curve measurements reflecting variance of an electrical property as a function of cathode voltage used during a sputtering process. By generating at least one voltage level to be used during the sputtering process, where the voltage reflects a suitable value for the electrical property from among the values obtainable in mixed-mode deposition, a semiconductor device layer may be produced with improved characteristics and durability. A multistable memory cell or array of such cells manufactured according to this process can, for a set of given materials, be fabricated to have minimal leakage or “off” current characteristics (Ileak or Ioff, respectively) or a maximum ratio of “on” current to “off” current (Ion/Ioff).

    摘要翻译： 本公开提供了制造半导体器件层和相关联的存储单元的方法。 经验数据可用于产生与金属 - 绝缘体 - 金属结构的沉积相关联的滞后曲线，其中曲线测量反映作为在溅射过程中使用的阴极电压的函数的电特性的变化。 通过在溅射过程中产生要使用的至少一个电压电平，其中电压从混合模式沉积中可获得的值中反映适合的电特性值，可以制造具有改进的特性和耐久性的半导体器件层。 根据该方法制造的这种电池的多电平存储器单元或阵列可以针对一组给定材料制造为具有最小的泄漏或“截止”电流特性（分别为Ileak或Ioff）或最大“on” 电流“off”电流（Ion / Ioff）。

    System and method for increasing productivity of organic light emitting diode material screening
    4.
    发明授权
    System and method for increasing productivity of organic light emitting diode material screening 有权
    提高有机发光二极管材料筛选生产率的系统和方法

    公开(公告)号：US08298837B2

    公开(公告)日：2012-10-30

    申请号：US13072083

    申请日：2011-03-25

    申请人： Yun Wang ,  Tony P. Chiang ,  Chi-I Lang

    发明人： Yun Wang ,  Tony P. Chiang ,  Chi-I Lang

    IPC分类号： H01L21/00

    CPC分类号： H01L51/0031 ,  H01L51/56

    摘要： A system and method of increasing productivity of OLED material screening includes providing a substrate that includes an organic semiconductor, processing regions on the substrate by combinatorially varying parameters associated with the OLED device production on the substrate, performing a first characterization test on the processed regions on the substrate to generate first results, processing regions on the substrate in a combinatorial manner by varying parameters associated with the OLED device production on the substrate based on the first results of the first characterization test, performing a second characterization test on the processed regions on the substrate to generate second results, and determining whether the substrate meets a predetermined quality threshold based on the second results.

    摘要翻译： 提高OLED材料筛选的生产率的系统和方法包括提供包括有机半导体的衬底，通过组合地改变与衬底上的OLED器件生产相关的参数来在衬底上处理区域，对处理的区域进行第一表征测试 所述衬底产生第一结果，基于所述第一表征测试的第一结果，通过改变与所述衬底上的OLED器件生产相关联的参数，以组合方式处理所述衬底上的区域，对所述衬底上的所述处理区域进行第二特性测试 衬底以产生第二结果，以及基于第二结果确定衬底是否满足预定质量阈值。

    Method and System of Improved Reliability Testing
    5.
    发明申请
    Method and System of Improved Reliability Testing 有权
    改进可靠性测试方法与系统

    公开(公告)号：US20120119768A1

    公开(公告)日：2012-05-17

    申请号：US12948257

    申请日：2010-11-17

    申请人： Yun Wang ,  Tony P. Chiang ,  Ryan Clarke ,  Chi-I Lang ,  Yoram Schwarz

    发明人： Yun Wang ,  Tony P. Chiang ,  Ryan Clarke ,  Chi-I Lang ,  Yoram Schwarz

    IPC分类号： G01R31/3187 ,  H01L21/66

    CPC分类号： H01L22/14

    摘要： A method and system of improved reliability testing includes providing a first substrate and a second substrate, each substrate comprising only a first metallization layer; processing regions on a first substrate by combinatorially varying at least one of materials, unit processes, and process sequences; performing a first reliability test on the processed regions on the first substrate to generate first results; processing regions on a second substrate in a combinatorial manner by varying at least one of materials, unit processes, and process sequences based on the first results of the first reliability test; performing a second reliability test on the processed regions on the second substrate to generate second results; and determining whether the first substrate and the second substrate meet a predetermined quality threshold based on the second results.

    摘要翻译： 改进的可靠性测试的方法和系统包括提供第一衬底和第二衬底，每个衬底仅包括第一金属化层; 通过组合地改变材料，单元过程和工艺顺序中的至少一个来处理第一衬底上的处理区域; 对所述第一基板上的所述经处理区域进行第一可靠性测试以产生第一结果; 基于第一可靠性测试的第一结果，通过改变材料，单元过程和过程序列中的至少一个来以组合的方式处理第二基板上的区域; 对所述第二基板上的所述经处理区域进行第二可靠性测试以产生第二结果; 以及基于所述第二结果来确定所述第一基板和所述第二基板是否满足预定质量阈值。

    High Throughput Quantum Efficiency Combinatorial Characterization Tool and Method for Combinatorial Solar Test Substrates
    6.
    发明申请
    High Throughput Quantum Efficiency Combinatorial Characterization Tool and Method for Combinatorial Solar Test Substrates 失效
    组合太阳能测试基板的高通量量子效率组合表征工具和方法

    公开(公告)号：US20110279810A1

    公开(公告)日：2011-11-17

    申请号：US12952855

    申请日：2010-11-23

    申请人： Yun Wang ,  Tony P. Chiang ,  Chi-I Lang

    发明人： Yun Wang ,  Tony P. Chiang ,  Chi-I Lang

    IPC分类号： G01N21/00

    CPC分类号： G01R31/26 ,  G01N21/55 ,  G01R31/2607 ,  H02S50/10

    摘要： Simultaneous measurement of an internal quantum efficiency and an external quantum efficiency of a solar cell using an emitter that emits light; a three-way beam splitter that splits the light into solar cell light and reference light, wherein the solar cell light strikes the solar cell; a reference detector that detects the reference light; a reflectance detector that detects reflectance light, wherein the reflectance light comprises a portion of the solar cell light reflected off the solar cell; a source meter operatively coupled to the solar cell; a multiplexer operatively coupled to the solar cell, the reference detector, and the reflectance detector; and a computing device that simultaneously computes the internal quantum efficiency and the external quantum efficiency of the solar cell.

    摘要翻译： 使用发射光的同时测量太阳能电池的内部量子效率和外部量子效率; 三光束分离器，其将光分解成太阳能电池光和参考光，其中太阳能电池光照射到太阳能电池; 检测参考光的参考检测器; 反射光检测器，其检测反射光，其中所述反射光包括从太阳能电池反射的太阳能电池光的一部分; 可操作地耦合到太阳能电池的源计量器; 可操作地耦合到太阳能电池，参考检测器和反射检测器的多路复用器; 以及同时计算太阳能电池的内部量子效率和外部量子效率的计算装置。

    Method and system of improved reliability testing
    7.
    发明授权
    Method and system of improved reliability testing 有权
    改进可靠性测试方法和系统

    公开(公告)号：US08683420B2

    公开(公告)日：2014-03-25

    申请号：US12948257

    申请日：2010-11-17

    申请人： Yun Wang ,  Tony P. Chiang ,  Ryan Clarke ,  Chi-I Lang ,  Yoram Schwarz

    发明人： Yun Wang ,  Tony P. Chiang ,  Ryan Clarke ,  Chi-I Lang ,  Yoram Schwarz

    IPC分类号： G06F17/50

    CPC分类号： H01L22/14

    摘要： A method and system of improved reliability testing includes providing a first substrate and a second substrate, each substrate comprising only a first metallization layer; processing regions on a first substrate by combinatorially varying at least one of materials, unit processes, and process sequences; performing a first reliability test on the processed regions on the first substrate to generate first results; processing regions on a second substrate in a combinatorial manner by varying at least one of materials, unit processes, and process sequences based on the first results of the first reliability test; performing a second reliability test on the processed regions on the second substrate to generate second results; and determining whether the first substrate and the second substrate meet a predetermined quality threshold based on the second results.

    摘要翻译： 改进的可靠性测试的方法和系统包括提供第一衬底和第二衬底，每个衬底仅包括第一金属化层; 通过组合地改变材料，单元过程和工艺顺序中的至少一个来处理第一衬底上的处理区域; 对所述第一基板上的所述经处理区域进行第一可靠性测试以产生第一结果; 基于第一可靠性测试的第一结果，通过改变材料，单元过程和过程序列中的至少一个来以组合的方式处理第二基板上的区域; 对所述第二基板上的所述经处理区域进行第二可靠性测试以产生第二结果; 以及基于所述第二结果来确定所述第一基板和所述第二基板是否满足预定质量阈值。

    Method and System of Improved Uniformity Testing
    8.
    发明申请
    Method and System of Improved Uniformity Testing 失效
    改进均匀性测试方法与系统

    公开(公告)号：US20120136601A1

    公开(公告)日：2012-05-31

    申请号：US12957354

    申请日：2010-11-30

    申请人： Charlene Chen ,  Tony P. Chiang ,  Chi-I Lang ,  Yun Wang

    发明人： Charlene Chen ,  Tony P. Chiang ,  Chi-I Lang ,  Yun Wang

    IPC分类号： G06F19/00 ,  H01L21/66

    CPC分类号： H01L22/20 ,  G01N21/59 ,  H01L21/02491 ,  H01L21/02527 ,  H01L21/0262 ,  H01L22/12 ,  H01L29/1606

    摘要： A method and system includes a first substrate and a second substrate, each substrate comprising a predetermined baseline transmittance value at a predetermine wavelength of light, processing regions on the first substrate by combinatorially varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production, performing a first characterization test on the processed regions on the first substrate to generate first results, processing regions on a second substrate in a combinatorial manner by varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production based on the first results of the first characterization test, performing a second characterization test on the processed regions on the second substrate to generate second results, and determining whether at least one of the first substrate and the second substrate meet a predetermined quality threshold based on the second results.

    摘要翻译： 一种方法和系统包括第一衬底和第二衬底，每个衬底在光的预定波长处包括预定的基线透射率值，第一衬底上的处理区域通过组合地改变材料，工艺条件，单元工艺中的至少一个和 与所述石墨烯生产相关联的工艺序列，对所述第一衬底上的所述经处理区域执行第一表征测试以产生第一结果，通过改变材料，工艺条件，单位过程中的至少一种以组合方式处理第二衬底上的区域， 以及基于第一表征测试的第一结果与石墨烯生产相关联的处理顺序，对第二衬底上的经处理区域执行第二表征测试以产生第二结果，以及确定第一衬底和第二衬底中的至少一个 基板满足预定的质量阈值 基于第二个结果。