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公开(公告)号:US20070279639A1
公开(公告)日:2007-12-06
申请号:US11445515
申请日:2006-06-02
申请人: Qingying Hu , Magdi Naim Azer , Kevin George Harding , John Broddus Deaton , Sudhir Kumar Tewari
发明人: Qingying Hu , Magdi Naim Azer , Kevin George Harding , John Broddus Deaton , Sudhir Kumar Tewari
IPC分类号: G01B11/02
CPC分类号: G01B11/25 , G01B11/2441
摘要: A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The profilometry apparatus also includes a signal processing unit configured to process the captured image from the optical unit to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object.
摘要翻译: 提供轮廓测量装置。 轮廓测量装置包括边缘投影装置,其被配置为将物体上的条纹图案投影,以及被配置为捕获被物体调制的失真条纹图案的图像的光学单元。 轮廓测量装置还包括信号处理单元,该信号处理单元被配置为处理来自光学单元的捕获图像以过滤来自图像的噪声并且获得与对象的制造或修复相关联的参数的实时估计。