MAGNETRON DESIGN FOR RF/DC PHYSICAL VAPOR DEPOSITION
    2.
    发明申请
    MAGNETRON DESIGN FOR RF/DC PHYSICAL VAPOR DEPOSITION 有权
    用于RF / DC物理蒸气沉积的MAGNETRON设计

    公开(公告)号:US20110311735A1

    公开(公告)日:2011-12-22

    申请号:US13163817

    申请日:2011-06-20

    IPC分类号: C23C14/35

    摘要: Methods and apparatus to improve target life and deposition uniformity in PVD chambers are provided herein. In some embodiments, a magnetron assembly includes a shunt plate having a central axis, the shunt plate rotatable about the central axis, a first open loop magnetic pole arc coupled to the shunt plate at a first radius from the central axis, and a second open loop magnetic pole arc coupled the shunt plate at a first distance from the first open loop magnetic pole arc, wherein at least one of the first radius varies along the first open loop magnetic pole arc or the first distance varies along the second open loop magnetic pole arc. In some embodiments, a first polarity of the first open loop magnetic pole arc opposes a second polarity of the second open loop magnetic pole arc.

    摘要翻译: 本文提供了改善PVD室中的目标寿命和沉积均匀性的方法和装置。 在一些实施例中,磁控管组件包括具有中心轴线的分流板,分流板可围绕中心轴线旋转,第一开环磁极电弧在与中心轴线成第一半径处耦合到分流板,第二开路 环形磁极以与第一开环磁极弧成第一距离的方式将分流板电弧耦合,其中第一半径中的至少一个沿第一开环磁极弧变化,或者第一距离沿第二开环磁极变化 弧。 在一些实施例中,第一开环磁极的第一极性与第二开环磁极的第二极性相反。

    PROCESS KIT SHIELD FOR IMPROVED PARTICLE REDUCTION
    3.
    发明申请
    PROCESS KIT SHIELD FOR IMPROVED PARTICLE REDUCTION 有权
    用于改善颗粒减少的工艺套件

    公开(公告)号:US20110278165A1

    公开(公告)日:2011-11-17

    申请号:US13106392

    申请日:2011-05-12

    IPC分类号: C23C14/04

    摘要: Apparatus for improved particle reduction are provided herein. In some embodiments, an apparatus may include a process kit shield comprising a one-piece metal body having an upper portion and a lower portion and having an opening disposed through the one-piece metal body, wherein the upper portion includes an opening-facing surface configured to be disposed about and spaced apart from a target of a physical vapor deposition chamber and wherein the opening-facing surface is configured to limit particle deposition on an upper surface of the upper portion of the one-piece metal body during sputtering of a target material from the target of the physical vapor deposition chamber.

    摘要翻译: 本文提供了用于改善颗粒减少的装置。 在一些实施例中,一种装置可以包括一个包括具有上部和下部的一体式金属体的处理套件屏蔽件,并且具有穿过一体式金属体设置的开口,其中,上部包括面向开口的表面 被配置为围绕物理气相沉积室的目标设置并隔开,并且其中所述面向开口的表面构造成在目标溅射期间限制所述一体金属体的上部的上表面上的颗粒沉积 材料从物理气相沉积室的目标。

    SUBSTRATE DEVICE HAVING A TUNED WORK FUNCTION AND METHODS OF FORMING THEREOF
    4.
    发明申请
    SUBSTRATE DEVICE HAVING A TUNED WORK FUNCTION AND METHODS OF FORMING THEREOF 有权
    具有调谐功能的基板装置及其形成方法

    公开(公告)号:US20110018073A1

    公开(公告)日:2011-01-27

    申请号:US12508820

    申请日:2009-07-24

    摘要: Substrate devices having tuned work functions and methods of forming thereof are provided. In some embodiments, forming devices on substrates may include depositing a dielectric layer atop a substrate having a conductivity well; depositing a work function layer comprising titanium aluminum or titanium aluminum nitride having a first nitrogen composition atop the dielectric layer; etching the work function layer to selectively remove at least a portion of the work function layer from atop the dielectric layer; depositing a layer comprising titanium aluminum or titanium aluminum nitride having a second nitrogen composition atop the work function layer and the substrate, wherein at least one of the work function layer or the layer comprises nitrogen; etching the layer and the dielectric layer to selectively remove a portion of the layer and the dielectric layer from atop the substrate; and annealing the substrate at a temperature less than about 1500 degrees Celsius.

    摘要翻译: 提供具有调谐功能的衬底器件及其形成方法。 在一些实施例中,在衬底上形成器件可以包括在具有导电性的衬底顶上淀积介电层; 在所述电介质层的顶部沉积包含具有第一氮组成的钛铝或氮化铝钛的功函数层; 蚀刻功函数层以从电介质层顶部选择性地去除功函数层的至少一部分; 在所述功函数层和所述衬底的顶部上沉积包含具有第二氮组成的钛铝或氮化铝钛的层,其中所述功函数层或所述层中的至少一个包含氮; 蚀刻所述层和所述介电层以从所述衬底顶部选择性地去除所述层和所述电介质层的一部分; 并在低于约1500摄氏度的温度下退火衬底。

    SELECTIVE RUTHENIUM DEPOSITION ON COPPER MATERIALS
    5.
    发明申请
    SELECTIVE RUTHENIUM DEPOSITION ON COPPER MATERIALS 有权
    铜选择性沉积铜材料

    公开(公告)号:US20090087982A1

    公开(公告)日:2009-04-02

    申请号:US12240822

    申请日:2008-09-29

    IPC分类号: H01L21/4763

    摘要: Embodiments of the invention provide processes for selectively forming a ruthenium-containing film on a copper surface over exposed dielectric surfaces. Thereafter, a copper bulk layer may be deposited on the ruthenium-containing film. In one embodiment, a method for forming layers on a substrate is provided which includes positioning a substrate within a processing chamber, wherein the substrate contains a copper-containing surface and a dielectric surface, exposing the substrate to a ruthenium precursor to selectively form a ruthenium-containing film over the copper-containing surface while leaving exposed the dielectric surface, and depositing a copper bulk layer over the ruthenium-containing film.

    摘要翻译: 本发明的实施方案提供了在暴露的电介质表面上在铜表面上选择性地形成含钌膜的方法。 此后,可以将铜本体层沉积在含钌膜上。 在一个实施例中,提供了一种用于在衬底上形成层的方法,其包括将衬底定位在处理室内,其中衬底包含含铜表面和电介质表面,将衬底暴露于钌前体以选择性地形成钌 同时留下电介质表面,并在含钌膜上沉积铜体积层。