In-situ device removal for multi-chip modules
    1.
    发明授权
    In-situ device removal for multi-chip modules 失效
    多芯片模块的原位设备拆除

    公开(公告)号:US5553766A

    公开(公告)日:1996-09-10

    申请号:US342563

    申请日:1994-11-21

    摘要: Deformation of a lifting ring of bimetallic structure or memory metal is matched to a solder softening or melting temperature to apply forces to lift a chip from a supporting structure, such as a substrate or multi-chip module, only when the solder connections between the chip and the supporting structure are softened or melted. The temperature of the chip, module and solder connections there between is achieved in a commercially available box oven or belt furnace or the like and results in much reduced internal chip temperatures and thermal gradients within the chip as compared to known hot chip removal processes. Tensile and/or shear forces at solder connections and chip and substrate contacts are much reduced in comparison with known cold chip removal processes. Accordingly, the process is repeatable at will without significant damage to or alteration of electrical characteristics of the chip or substrate.

    摘要翻译: 双金属结构或记忆金属的提升环的变形与焊料软化或熔化温度匹配,以施加力以从支撑结构(例如基板或多芯片模块)提升芯片,只有当芯片之间的焊料连接 支撑结构软化或熔化。 与市售的盒式炉或带式炉等相比,芯片,模块和焊料连接的温度是可以实现的,并且与已知的热切屑去除工艺相比,在芯片内的内部芯片温度和热梯度大大降低。 与已知的冷芯片去除工艺相比,焊料连接和芯片和基板触点处的拉伸和/或剪切力大大降低。 因此,该过程可以随意重复,而不会显着损坏或改变芯片或衬底的电特性。

    Hot vacuum device removal process and apparatus
    2.
    发明授权
    Hot vacuum device removal process and apparatus 失效
    热真空装置拆除工艺及装置

    公开(公告)号:US5605277A

    公开(公告)日:1997-02-25

    申请号:US360100

    申请日:1994-12-20

    IPC分类号: B23K1/018

    CPC分类号: B23K1/018 B23K2201/40

    摘要: A cost efficient, highly reliable method to remove electronic devices and components from substrates eliminates separate tooling for every substrate and device or component size. The apparatus which implements the method allows for multiple device or component removal simultaneously, or in a single sequential operation, in a nondestructive action in a very low cost environment. A box oven and vacuum system and is used with different device or component and substrate sizes providing a simple, low cost, molten device removal procedure, eliminating the need for thermal monitor build and associated profiling for each product. The apparatus works independently of chip type or size, utilizing universal fixturing, and can be set up to pull multiple devices and/or components in a single run.

    摘要翻译: 从基板上去除电子设备和组件的成本效益高,可靠的方法消除了每个基板和设备或部件尺寸的单独的工具。 实现该方法的装置允许在非常低成本的环境中的非破坏性动作中同时进行多个装置或部件移除,或者在单个顺序操作中。 箱式烘箱和真空系统,并且使用不同的装置或部件和基板尺寸,提供简单,低成本的熔融装置移除程序,消除了对每个产品的热监测器构建和相关的分析的需要。 该设备独立于芯片类型或尺寸,利用通用的固定方式工作,并可设置为在单次运行中拉出多个设备和/或组件。

    Rework methods for lead BGA/CGA
    7.
    发明授权
    Rework methods for lead BGA/CGA 有权
    铅BGA / CGA的返工方法

    公开(公告)号:US06719188B2

    公开(公告)日:2004-04-13

    申请号:US09912192

    申请日:2001-07-24

    IPC分类号: B23K1018

    摘要: A method and apparatus are provided for reworking electronic component assemblies where the components are joined by solder interconnections. A cutting device employing a heated wire, blade or other cutting element is forced against and through the solder interconnections to sever the interconnections. A preferred cutting device employs moving the cutting element transverse to the solder interconnections to also provide a sawing action to the solder interconnections. Another cutting device employs a water jet to provide a high pressure stream of water that cuts and severs the solder interconnections.

    摘要翻译: 提供了一种方法和装置,用于重新加工电子部件组件,其中部件通过焊料互连连接。 使用加热的线,刀片或其他切割元件的切割装置被迫抵抗并穿过焊料互连以切断互连。 优选的切割装置采用将切割元件横向于焊接互连件移动以向焊接互连提供锯切动作。 另一切割装置采用水射流来提供高压水流,其切割和切断焊料互连。

    Apparatus and method for removing interconnections
    8.
    发明授权
    Apparatus and method for removing interconnections 失效
    用于去除互连的装置和方法

    公开(公告)号:US06497357B2

    公开(公告)日:2002-12-24

    申请号:US09850350

    申请日:2001-05-07

    IPC分类号: B23K120

    摘要: A method for removing at least one molten or solid structure from a surface including: placing the surface with the at least one molten or solid structure in a fixture; disposing said wiper assembly acted on by a bias proximate the at least one molten or solid structure; retaining the wiper assembly in a first position with a device having a first temperature point level equivalent to or higher than a second melting point level of the at least one molten or solid structure; and raising the temperature of the fixture to the first temperature point level; wherein the at least one molten or solid structure is wiped from the surface when the device reaches the first temperature point level. An apparatus for removing at least one molten or solid structure from a substrate for rework, the apparatus comprising: a fixture for sustaining and biasing the substrate against a wiper assembly; the wiper assembly configured and positioned to slidably engage at least a portion of the substrate; a bias for translating the wiper assembly along a surface of the substrate having the at least one molten or solid structure to be removed; and a guide block assembly capable of guiding and locking the wiper assembly.

    摘要翻译: 一种用于从表面去除至少一种熔融或固体结构的方法,包括:将具有至少一种熔融或固体结构的表面放置在固定装置中; 将所述擦拭器组件布置成靠近所述至少一个熔融或固体结构的偏压; 将所述刮水器组件保持在具有等于或高于所述至少一个熔融或固体结构的第二熔点水平的第一温度点水平的装置的第一位置; 并将夹具的温度提高到第一温度点水平; 其中当所述装置达到所述第一温度点水平时,所述至少一个熔融或固体结构从所述表面擦拭。 一种用于从基板去除至少一个熔融或固体结构以进行返修的装置,所述装置包括:固定装置,用于将所述基板保持并偏置在刮水器组件上; 所述擦拭器组件被构造和定位成可滑动地接合所述衬底的至少一部分; 用于沿着具有要移除的至少一个熔融或固体结构的衬底的表面平移擦拭器组件的偏压; 以及能够引导和锁定刮水器组件的导块组件。