Method of measuring a total radiated power of a device under test as well as test system

    公开(公告)号:US11381322B2

    公开(公告)日:2022-07-05

    申请号:US17154347

    申请日:2021-01-21

    发明人: Vincent Abadie

    IPC分类号: H04W24/06 H04B17/10 H04W88/02

    摘要: A method of measuring a total radiated power of a device under test by a test system with a base station simulator, a measurement antenna assigned to the base station simulator and a control and/or measurement equipment is described. The method includes: establishing a radio resource control connection between the device under test and the base station simulator via the measurement antenna; activating an uplink-beam lock function at the device under test; and performing a total radiated power measurement by the control and/or measurement equipment while continuously sending a downlink signal from the base station simulator via the measurement antenna to the device under test. A test system is further described.

    METHOD OF MEASURING A TOTAL RADIATED POWER OF A DEVICE UNDER TEST AS WELL AS TEST SYSTEM

    公开(公告)号:US20210258084A1

    公开(公告)日:2021-08-19

    申请号:US17154347

    申请日:2021-01-21

    发明人: Vincent Abadie

    IPC分类号: H04B17/10 H04W24/06

    摘要: A method of measuring a total radiated power of a device under test by a test system with a base station simulator, a measurement antenna assigned to the base station simulator and a control and/or measurement equipment is described. The method includes: establishing a radio resource control connection between the device under test and the base station simulator via the measurement antenna; activating an uplink-beam lock function at the device under test; and performing a total radiated power measurement by the control and/or measurement equipment while continuously sending a downlink signal from the base station simulator via the measurement antenna to the device under test. A test system is further described.

    Measurement system and method for performing test measurements

    公开(公告)号:US10935583B2

    公开(公告)日:2021-03-02

    申请号:US16137210

    申请日:2018-09-20

    摘要: A measurement system for testing a device under test is described that comprises at least one signal unit for processing a signal, at least two measurement antennas, at least two reflectors, a shielded space, and a testing position for the device under test. Each measurement antenna is orientated with respect to the testing position such that the testing position is located in at least one of a side lobe area and a back lobe area of the measurement antennas. The reflectors are located such that each reflector generates and/or collimates a planar wave at different angles with respect to the testing position. Further, a method for performing test measurements is described.

    MEASUREMENT SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST

    公开(公告)号:US20190313266A1

    公开(公告)日:2019-10-10

    申请号:US15945469

    申请日:2018-04-04

    摘要: A measurement system is described, comprising a signal processing equipment, an antenna unit, a device under test, and a resonant cavity surrounding the antenna unit and the device under test. The signal processing equipment is at least one of a signal generation equipment and a signal measurement equipment. The resonant cavity has a resonance for a frequency corresponding to at least one of the frequency used for testing the device under test and its multiples. The device under test is located within the resonant cavity such that a standing wave is established inside the resonant cavity during testing the device under test. The standing wave has an electric field distribution with maxima and minima. The antenna unit is located within the resonant cavity such that the antenna unit is assigned to a maximum of the electric field. Further, a method for testing a device under test is described.

    Test arrangement and test method
    5.
    发明授权

    公开(公告)号:US10333634B1

    公开(公告)日:2019-06-25

    申请号:US15949278

    申请日:2018-04-10

    IPC分类号: H04B17/00 H04B17/29

    摘要: Test arrangement and method for wirelessly testing a device under test. An in-band test signal and a further interference signal are emitted to the device under test by a test arrangement comprising a single antenna. For this purpose, a linear polarized in-band test signal and a linear polarized interference signal are generated. The in-band test signal and the interference signal are combined by a transducer to a circular polarized signal and the circular polarized signal comprising the in-band test signal and interference signal is used for testing the device under test.

    Anechoic test chamber, test system and test method for testing the antennas of a device under test

    公开(公告)号:US10686540B2

    公开(公告)日:2020-06-16

    申请号:US16419859

    申请日:2019-05-22

    IPC分类号: H04B17/29 H04B7/0413

    摘要: This application relates to an anechoic test chamber for testing antennas of a device under test (DUT), the test chamber comprising: a test area having a test surface for receiving the DUT, wherein in a test mode the test surface forms a region of measurement of the DUT and wherein the DUT comprises at least one antenna array having a plurality of multi-input multi-output (MIMO) antennas, at least one reflector compact antenna test range (CATR) comprising a first measurement antenna and one shaped reflector, wherein the reflector is used to generate a first quiet zone, at least one second measurement antenna, wherein the second measurement antenna is arranged inside the test chamber such to generate a second quiet zone at test surface, an input/output terminal for connecting the test chamber to a test equipment, wherein the input/output terminal is connected to the first and second antennas.

    Over the air measurement system and method

    公开(公告)号:US10677832B2

    公开(公告)日:2020-06-09

    申请号:US15927397

    申请日:2018-03-21

    发明人: Vincent Abadie

    摘要: An over-the-air measurement system is provided for analyzing a device under test. The over-the-air measurement system includes a first measurement unit, a first antenna connected to the first measurement unit, a second measurement unit, and a second antenna connected to the second measurement unit. The first measurement unit is configured to establish a communication link, within a communication link frequency range, to the device under test via the first antenna. The second measurement unit is configured to measure radio frequency radiation, within a measurement frequency range, of the device under test via the second antenna. The communication link frequency range and the measurement frequency range do not overlap each other.

    MEASUREMENT ARRANGEMENT AND MEASUREMENT METHOD

    公开(公告)号:US20190335346A1

    公开(公告)日:2019-10-31

    申请号:US16032645

    申请日:2018-07-11

    摘要: Measurement arrangement and measurement method for measuring spurious emissions of a wireless device. The measurement arrangement comprises at least two antennas, wherein a first antenna is arranged at proximity of the wireless device. In a first step, frequencies relating to spurious emissions are determined by measuring wireless signals received by the first antenna. In a second step, the spurious emissions are measured by the second device.