公开(公告)号：US09323648B2

公开(公告)日：2016-04-26

申请号：US14026042

申请日：2013-09-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Byeong-hu Lee ,  Tai-ryong Kang ,  Sang-deok Kim ,  Yong-hee Park ,  Sang-rae Lee ,  Jae-hoon Lee

IPC: G06F9/44 ,  G06F11/36 ,  H04N17/00 ,  H04N21/442 ,  H04N21/4363 ,  H04N21/443

CPC classification number: G06F11/3672 ,  G06F11/3684 ,  G06F11/3688 ,  H04N17/004 ,  H04N21/43635 ,  H04N21/4424 ,  H04N21/443

Abstract: An automatic test apparatus for embedded software and an automatic testing method thereof, the automatic testing apparatus for embedded software, includes an output detector which collects interface status information in accordance with data transmission/reception from at least one of first and second electronic devices respectively loaded with first and second embedded software and exchanging data therebetween, and extracts a keyword from the collected interface status information, a scenario composer which uses identification information about the first and second embedded software and the extracted keyword, and composes a scenario corresponding to a predetermined event status and a control command generator which generates a control command to reproduce the event status based on the composed scenario. Thus, it is possible to previously detect unpredictable and predictable problems that may occur in interaction between the plurality of embedded software, interface operation to transmit and receive data, etc., and reproduce them.

Abstract translation: 一种用于嵌入式软件的自动测试装置及其自动测试方法，用于嵌入式软件的自动测试装置包括输出检测器，其根据分别加载的第一和第二电子设备中的至少一个的数据发送/接收来收集接口状态信息 利用第一和第二嵌入式软件在其间交换数据，并从所收集的接口状态信息中提取关键词，使用关于第一和第二嵌入式软件的标识信息和所提取的关键字的场景作曲者，并且构成与预定事件相对应的场景 状态和控制命令生成器，其生成基于组合场景再现事件状态的控制命令。 因此，可以预先检测可能在多个嵌入式软件之间的交互中发生的不可预测和可预测的问题，用于发送和接收数据的接口操作等，并再现它们。

公开(公告)号：US10303588B2

公开(公告)日：2019-05-28

申请号：US15162843

申请日：2016-05-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byeong-hu Lee ,  Byeong-kuk Kim ,  Taek-gyun Kim ,  Yong-hee Park

IPC: G06F9/00 ,  G06F15/177 ,  G06F11/36 ,  G06F9/4401 ,  G06F11/22 ,  G06F12/0875

Abstract: A device is provide including: a storage device comprising a memory configured to store configuration data used for test booting for a process of testing the device, before the test booting; and a controller configured to perform the test booting using the stored configuration data when receiving a start signal of the test booting, to control the process of testing the device to be performed after the test booting, and to delete the configuration data stored in the storage device when a completion signal of the process of testing the device is received.

公开(公告)号：US20140344829A1

公开(公告)日：2014-11-20

申请号：US14274820

申请日：2014-05-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byeong-hu LEE ,  Taek-gyun Kim ,  Hyoung-nam Kim ,  Yong-hee Park ,  Jong-jik Lee

IPC: G06F9/50

CPC classification number: G06F9/5011 ,  G06F2209/5021

Abstract: A data processing method is a shared resource which is allocated to a multi-core processor includes receiving a first data stream from a first processor, when a second data stream is received from a second processor before processing of the first data stream is complete, locating the second data stream in front of a data stream which is on standby from among the first data stream, and processing the located second data stream and the first data stream on standby in sequence.

Abstract translation: 数据处理方法是分配给多核处理器的共享资源，包括从第一处理器接收第一数据流，当在第一数据流的处理完成之前从第二处理器接收到第二数据流时，定位 在从第一数据流中待机的数据流前面的第二数据流，并且依次处理所位于的第二数据流和第一数据流。

公开(公告)号：US09818879B2

公开(公告)日：2017-11-14

申请号：US14807912

申请日：2015-07-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yong-hee Park ,  Young-seok Song ,  Ji-soo Chang ,  Young-chul Hwang

IPC: H01L29/78 ,  H01L27/088 ,  H01L27/092 ,  H01L29/66 ,  H01L21/8234

CPC classification number: H01L29/7856 ,  H01L21/823431 ,  H01L21/823437 ,  H01L27/0886 ,  H01L27/0924 ,  H01L29/66545

Abstract: An IC device includes a substrate including a device region having a fin-type active region and a deep trench region; a gate line that extends in a direction intersecting the fin-type active region; and an inter-device isolation layer that fills the deep trench region. The gate line includes a first gate portion that extends on the device region to cover the fin-type active region and has a flat upper surface at a first level and a second gate portion that extends on the deep trench region to cover the inter-device isolation layer while being integrally connected to the first gate portion and has an upper surface at a second level that is closer to the substrate than the first level.

公开(公告)号：US20140123111A1

公开(公告)日：2014-05-01

申请号：US14026042

申请日：2013-09-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Byeong-hu Lee ,  Tai-ryong Kang ,  Sang-deok Kim ,  Yong-hee Park ,  Sang-rae Lee ,  Jae-hoon Lee

IPC: G06F11/36

CPC classification number: G06F11/3672 ,  G06F11/3684 ,  G06F11/3688 ,  H04N17/004 ,  H04N21/43635 ,  H04N21/4424 ,  H04N21/443

Abstract: An automatic test apparatus for embedded software and an automatic testing method thereof, the automatic testing apparatus for embedded software, includes an output detector which collects interface status information in accordance with data transmission/reception from at least one of first and second electronic devices respectively loaded with first and second embedded software and exchanging data therebetween, and extracts a keyword from the collected interface status information, a scenario composer which uses identification information about the first and second embedded software and the extracted keyword, and composes a scenario corresponding to a predetermined event status and a control command generator which generates a control command to reproduce the event status based on the composed scenario. Thus, it is possible to previously detect unpredictable and predictable problems that may occur in interaction between the plurality of embedded software, interface operation to transmit and receive data, etc., and reproduce them.

Abstract translation: 一种用于嵌入式软件的自动测试装置及其自动测试方法，用于嵌入式软件的自动测试装置包括输出检测器，其根据分别加载的第一和第二电子设备中的至少一个的数据发送/接收来收集接口状态信息 利用第一和第二嵌入式软件在其间交换数据，并从所收集的接口状态信息中提取关键词，使用关于第一和第二嵌入式软件的标识信息和所提取的关键字的场景作曲者，并且构成与预定事件相对应的场景 状态和控制命令生成器，其生成基于组合场景再现事件状态的控制命令。 因此，可以预先检测可能在多个嵌入式软件之间的交互中发生的不可预测和可预测的问题，用于发送和接收数据的接口操作等，并再现它们。

公开(公告)号：US10405043B2

公开(公告)日：2019-09-03

申请号：US15641538

申请日：2017-07-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Myoung-ho Kim ,  Byeong-hu Lee ,  Jong-jik Lee ,  Sang-deok Kim ,  Yong-hee Park ,  Dana Jung ,  Taek-gyun Kim ,  Sang-rae Lee

IPC: H04N7/18 ,  H04N21/458 ,  H04N21/43 ,  H04N21/4363 ,  H04N21/442 ,  H04N21/443 ,  H04N19/56

Abstract: Provided herein is an audio processing apparatus including: a controller configured to determine an initialization mode for processing video and audio signals provided from an audio provision apparatus of among a plurality of initialization modes, and to perform an initialization process differently according to the result of determination; and an audio processor configured to process the audio signal and output the processed audio signal, when the initialization process is performed.

公开(公告)号：US10256342B2

公开(公告)日：2019-04-09

申请号：US15728965

申请日：2017-10-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yong-hee Park ,  Young-seok Song ,  Ji-soo Chang ,  Young-chul Hwang

IPC: H01L21/8234 ,  H01L29/78 ,  H01L27/088 ,  H01L29/66 ,  H01L27/092

Abstract: An IC device includes a substrate including a device region having a fin-type active region and a deep trench region; a gate line that extends in a direction intersecting the fin-type active region; and an inter-device isolation layer that fills the deep trench region. The gate line includes a first gate portion that extends on the device region to cover the fin-type active region and has a flat upper surface at a first level and a second gate portion that extends on the deep trench region to cover the inter-device isolation layer while being integrally connected to the first gate portion and has an upper surface at a second level that is closer to the substrate than the first level.

公开(公告)号：US09976856B2

公开(公告)日：2018-05-22

申请号：US14684960

申请日：2015-04-13

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byeong-hu Lee ,  Yong-hee Park

IPC: G01C17/02

CPC classification number: G01C17/02

Abstract: A method for controlling a user terminal includes obtaining reference magnetic field information of the user terminal, detecting a magnetic field emitted from an external mobile terminal, and obtaining location information indicating a location of the external mobile terminal based on the reference magnetic field information and the detected magnetic field.

公开(公告)号：US09906864B2

公开(公告)日：2018-02-27

申请号：US14789154

申请日：2015-07-01

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Byeong-hu Lee ,  Yong-hee Park ,  Hun-sok Oh

IPC: H04R5/04 ,  H04S7/00 ,  G01R33/02 ,  G06F3/16

CPC classification number: H04R5/04 ,  G01R33/02 ,  G06F3/165 ,  H04R2205/024 ,  H04S7/301 ,  H04S7/40

Abstract: Provided is a control method of a user terminal apparatus and device, for speaker location detection and level control using a magnetic field. The method includes receiving reference magnetic field information generated by at least one speaker, in response to a magnetic field being generated based on the reference magnetic field information by the at least one speaker, detecting the magnetic field generated by the at least one speaker, acquiring location information of the at least one speaker using the detected magnetic field information and the reference magnetic field information, and transmitting the location information of each of the at least one speaker to a source apparatus.

公开(公告)号：US20180033890A1

公开(公告)日：2018-02-01

申请号：US15728965

申请日：2017-10-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yong-hee Park ,  Young-Seok Song ,  Ji-Soo Chang ,  Young-Chul Hwang

IPC: H01L29/78 ,  H01L27/088 ,  H01L29/66 ,  H01L27/092 ,  H01L21/8234

CPC classification number: H01L29/7856 ,  H01L21/823431 ,  H01L21/823437 ,  H01L27/0886 ,  H01L27/0924 ,  H01L29/66545

Abstract: An IC device includes a substrate including a device region having a fin-type active region and a deep trench region; a gate line that extends in a direction intersecting the fin-type active region; and an inter-device isolation layer that fills the deep trench region. The gate line includes a first gate portion that extends on the device region to cover the fin-type active region and has a flat upper surface at a first level and a second gate portion that extends on the deep trench region to cover the inter-device isolation layer while being integrally connected to the first gate portion and has an upper surface at a second level that is closer to the substrate than the first level.