摘要:
In the event of a suspected abnormality in the device, sample or reagent, a laboratory technician had to examine the abnormal reaction process data item by item, and infer the cause of the abnormality, which took effort and time in some cases. Abnormality judgment is assisted using: indicator computation means that computes an indicator indicating a feature parameter of a given waveform by applying a pre-defined evaluation formula to time series data of photometric values; relative indicator computation means that computes a value indicating a relationship of the indicator of target data to the indicator computed in the past; and indicator display means that simultaneously displays a value computed by the indicator computation means and the value computed by the relative indicator computation means. According to the present method, which is a method for assisting judgment of abnormality wherein a feature parameter of a given absorbance change is computed, it can be made easier to find certain abnormalities, and it becomes possible to attain more efficient device maintenance and improved device reliability without the addition of any new parts.
摘要:
In the event of a suspected abnormality in the device, sample or reagent, a laboratory technician had to examine the abnormal reaction process data item by item, and infer the cause of the abnormality, which took effort and time in some cases. Abnormality judgment is assisted using: indicator computation means that computes an indicator indicating a feature parameter of a given waveform by applying a pre-defined evaluation formula to time series data of photometric values; relative indicator computation means that computes a value indicating a relationship of the indicator of target data to the indicator computed in the past; and indicator display means that simultaneously displays a value computed by the indicator computation means and the value computed by the relative indicator computation means. According to the present method, which is a method for assisting judgment of abnormality wherein a feature parameter of a given absorbance change is computed, it can be made easier to find certain abnormalities, and it becomes possible to attain more efficient device maintenance and improved device reliability without the addition of any new parts.
摘要:
The present invention provides an index that makes it possible to use, in an automatic analyzer, an approximate expression based on a theoretical chemical reaction formula derived from reaction process data, and automatically check for apparatus abnormalities, reagent deteriorations, and improper accuracy control during each continuous or individual inspection.Reaction process data, which is measured when the automatic analyzer determines the relationship between reaction absorbance and time, is approximated to ABS=A0+A1 (1−e−kt) by the least-squares method. The resulting reaction start point absorbance A0, final reaction absorbance A1, reaction rate constant k, and residual error, which is the aggregate sum of differences between approximate values and measured values, are then used as the index of reaction status.
摘要:
An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.
摘要:
An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.