摘要:
An X stage (21) arranged on the front edge of a table (11) is movable in the X-axis direction along a rail (23). The X stage (21) supports a light projecting device (70) for illuminating a printed circuit board (PCB) and an imaging device (80) for imaging an inspection area illuminated by the light projecting device (70). An image obtained by the imaging device (80) is displayed on a display device (13). A Y stage (41) is movably provided along a rail (33) on a base (10). A board supporting member (50) for supporting the board (PCB) is pivotably attached to the Y stage (41) at front portion thereof. An inspector judges whether or not soldering is acceptable while seeing the image displayed on the display device (13). When it is judged that soldering is unacceptable, the inspector can correct an unacceptable soldered portion by drawing out the Y stage (41) forward and obliquely raising the board supporting member (50).
摘要:
Disclosed is a method of and apparatus for inspecting a printed circuit board (PCB) for the nature of its soldered parts comprising three ring-shaped light sources which project light of different hues, the highest light source being any hue other than red, to a part mounted on a PCB at different angles and heights from above, a camera to record the reflected images, and a procedure used to check the recorded patterns to determine if the soldering is acceptable.
摘要:
In a device used to inspect substrates visually, an imaging region and a magnification are specified ahead of time for every component and stored as library data in a memory. The memory also contains CAD data, which include the class of each component on the substrate and its location. During initialization, a control unit links the location data for a component extracted from the CAD data to corresponding library data and specifies a field of view and a magnification for every component on the substrate. Using this data, the control unit creates on the substrate a number of viewing zones to be inspected at various magnifications and stores the data specifying these zones in the memory. When a substrate is to be inspected, the control unit uses the data specifying these zones to control the position and magnification of an imaging unit to collect image data from each zone successively and display them on a monitor.
摘要:
A method and device for supporting the repair of defective portions of a substrate when the defective portions have been discovered during an inspection process. A recorder records defective data associated with the defective portions. A data sorter sorts the defective data by grouping together defective data relating to a same type of defect. A data indicator highlights a defective location on the substrate where the defective portions were found in an order determined by defective data relating to the same type of defect or in an order determined by defective data relating to defects requiring the same type of repair. The data indicator also indicates the type of repair required and the tools to be used in the repair of the defective portions.
摘要:
There is disclosed a method for manufacturing an SOI wafer comprising: a step of implanting at least one of a hydrogen ion and a rare gas ion into a donor wafer to form an ion implanted layer; a step of bonding an ion implanted surface of the donor wafer to a handle wafer; a step of delaminating the donor wafer at the ion implanted layer to reduce a film thickness of the donor wafer, thereby providing an SOI layer; and a step of etching the SOI layer to reduce a thickness of the SOI layer, wherein the etching step includes: a stage of performing rough etching as wet etching; a stage of measuring a film thickness distribution of the SOI layer after the rough etching; and a stage of performing precise etching as dry etching based on the measured film thickness distribution of the SOI layer. There can be provided A method for manufacturing an SOI wafer having high film thickness uniformity of an SOI layer with excellent productivity.
摘要:
Providing an electric vehicle transaxle suppressing occurrence of wear, seizure, etc. of a one-way clutch as compared to a conventional one. When an electric motor MG is driven and a one-way clutch 34 moves in a rotation axis C1 direction, the one-way clutch 34 comes into contact with a flange portion 46b of an inner race 46 or a supporting portion 30b of a transaxle housing 30 via a sliding washer 74 and, therefore, direct contact is prevented between the one-way clutch 34 and the flange portion 46b of the inner race 46 or the supporting portion 30b and wear, seizure, etc. of the one-way clutch 34 are suppressed.
摘要:
An oil passage structure of a chain-driven oil pump includes three lines of oil passages for supplying oil from the center support to the torque converter, a first oil passage for supplying oil to the torque converter through the inside of an input shaft of the torque converter, a second oil passage for supplying oil to the torque converter through a space defined by the outer periphery surface of the input shaft and the inner periphery surface of a stator shaft, and a third oil passage for supplying oil to the torque converter by bypassing the drive sprocket. The third oil passage is provided on the outer periphery side of the drive sprocket and in a position where it does not interfere with the operation of a chain. Accordingly, it is possible to utilize the flex lock-up to a maximum extent, and to reduce the diameter of the sprocket.
摘要:
A park lock of a transmission, including a park gear; a park pawl rotating about a pawl shaft, the park pawl having a pawl portion locking the park gear, the park pawl including a cam contact portion; a park rod responsive to an operation of a controller, the park rod having a cam portion pressing the cam contact portion to have park pawl engage the park gear; a park sleeve receiving the cam portion and defining a first contact point providing a reactive force to the cam contact portion of the park pawl pressing against the cam portion at a second contact point; a pawl torsional spring biasing the park pawl towards disengagement; and a pawl stopper limiting the rotation of the park pawl wherein motions are constrained within a plane of the transmission and components are rotatingly disposed in parallel axis bores in one half of a transmission case.
摘要:
A method of manufacturing a laminated substrate is provided. The method includes: forming an oxide film on at least a surface of a first substrate having a hardness of equal to or more than 150 GPa in Young's modulus, and then smoothing the oxide film; implanting hydrogen ions or rare gas ions, or mixed gas ions thereof from a surface of a second substrate to form an ion-implanted layer inside the substrate, laminating the first substrate and the second substrate through at least the oxide film, and then detaching the second substrate in the ion-implanted layer to form a laminated substrate; heat-treating the laminated substrate and diffusing outwardly the oxide film.
摘要:
A circuit substrate having a mounting surface on which a semiconductor chip is mounted and at least one connection pad formed on the mounting surface is connected to a support plate having at least one mounting portion with a diameter larger than a diameter of the connection pad, through a truncated-cone-shaped solder layer which is formed from at least one solder ball on the basis of a difference between the diameter of the mounting portion and the diameter of the connection pad.